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JJF 1029-2024 English PDF

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JJF 1029-2024: Technical Requirements for Production of Electron Probe Quantitative Analysis Reference Materials
Status: Valid

JJF 1029: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
JJF 1029-2024English379 Add to Cart 4 days [Need to translate] Technical Requirements for Production of Electron Probe Quantitative Analysis Reference Materials Valid JJF 1029-2024
JJF 1029-1991English359 Add to Cart 3 days [Need to translate] The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe Obsolete JJF 1029-1991

Basic data

Standard ID JJF 1029-2024 (JJF1029-2024)
Description (Translated English) Technical Requirements for Production of Electron Probe Quantitative Analysis Reference Materials
Sector / Industry Metrology & Measurement Industry Standard
Word Count Estimation 18,172
Date of Issue 2024-02-07
Date of Implementation 2024-08-07
Issuing agency(ies) State Administration for Market Regulation

JJF 1029-2024: Technical Requirements for Production of Electron Probe Quantitative Analysis Reference Materials


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
National Metrology Technical Specifications of the People's Republic of China Electron probe quantitative analysis standard substances Development (production) technical requirements Released on 2024-02-07 2024-08-07 Implementation The State Administration for Market Regulation issued Electron probe quantitative analysis standard substances Development (production) technical requirements Replace JJF 1029-1991 Responsible unit. National Technical Committee for Metrology of Standard Materials Main drafting unit. National Geological Experiment and Testing Center Institute of Mineral Resources, Chinese Academy of Geological Sciences Participating drafting unit. Institute of Geology and Geophysics, Chinese Academy of Sciences Chengdu Institute of Comprehensive Utilization of Mineral Resources, Chinese Academy of Geological Sciences China National Institute of Metrology This specification is entrusted to the National Technical Committee for Standard Material Metrology for interpretation The main drafters of this specification are. An Ziyi (National Geological Experiment and Testing Center) Chen Zhenyu (Institute of Mineral Resources, Chinese Academy of Geological Sciences) Participating drafters. Li Xianhua (Institute of Geology and Geophysics, Chinese Academy of Sciences) Wang Yaping (National Geological Experiment and Testing Center) Wang Yue (Chengdu Institute of Comprehensive Utilization of Mineral Resources, Chinese Academy of Geological Sciences) Ren Tongxiang (China National Institute of Metrology) Zhou Jianxiong (Institute of Mineral Resources, Chinese Academy of Geological Sciences)

Table of contents

Introduction (II) 1 Scope(1) 2 References(1) 3 Terms and definitions (1) 4 Overview(1) 5 Selection, preparation and preliminary examination of candidate reference materials (2) 5.1 Selection of Candidates (2) 5.2 Processing and preparation of candidate products (2) 5.3 Preliminary examination of candidates (2) 6 Measurement methods (2) 7 Uniformity Assessment (2) 7.1 Sampling principles (3) 7.2 Acceptance criteria (4) 8 Stability assessment (4) 8.1 Sampling and testing(4) 8.2 Stability calculation (4) 8.3 Acceptance criteria (5) 9 Constant value (5) 9.1 General requirements (5) 9.2 Establishment and demonstration of metrological traceability (5) 9.3 Setting method (6) 10 Uncertainty assessment (6) 10.1 Components of uncertainty (6) 10.2 Evaluation of uncertainty introduced by the determination process (uchar) (6) 10.3 Evaluation of uncertainty introduced by homogeneity of reference materials (uhom) (7) 10.4 Evaluation of uncertainty introduced by the stability of reference materials (us) (10) 10.5 Expanded uncertainty (UCRM) (10) 11 Research reports and certificates (10) Appendix A Electron Probe Microanalysis Experimental Conditions Requirements (11) References (12)

Introduction

Solid sample interaction, exciting characteristic X-rays, secondary electrons, backscattered electrons, Cathodoluminescence and other signals are used to perform microscopic analysis of composition, morphology, structure, etc. Electron probe microscopy analysis includes microscopy of composition, morphology, structure, etc., among which composition analysis includes qualitative analysis The basic principle of quantitative analysis is to measure and compare the content of unknown samples with known elements. The characteristic X-ray intensity of the elements on the micrometer scale in the standard material is calculated and calibrated to obtain the micrometer intensity of the unknown sample. The standard material is used as the physical standard in the electron probe quantitative analysis. Accuracy plays a vital role. This specification provides for the homogeneity and stability evaluation of reference materials used in electron probe quantitative analysis, the determination of chemical composition, etc. Specific guidance is given. The relevant technical requirements refer to ISO 14595 Microbeam Analysis - Electron Probe Microanalysis - This specification replaces JJF 1029-1991 "Specification for the preparation of reference materials for electron probe quantitative analysis". Compared with JJF 1029-1991, the main revisions include sampling principles, evaluation methods, data processing in uniformity evaluation. The stability assessment has been expanded to include requirements for long-term stability assessment and acceptance criteria. chapter. Previous versions of this specification are. ---JJF 1029-1991. Electron probe quantitative analysis standard substances Development (production) technical requirements

1 Scope

This specification is applicable to the development (production) of single-phase solid reference materials for quantitative analysis by electron probe. The development (production) of other standard substances for electron probe analysis can be used as a reference.

2 References

This specification references the following documents. JJF 1005 General terms and definitions of reference materials JJF 1059.1 Evaluation and Expression of Measurement Uncertainty JJF 1186 Standard Material Certificate and Label Requirements JJF 1342 General requirements for reference material research and development (production) institutions JJF 1343 Determination of the value, uniformity and stability of reference materials JJF 1646 Technical Specification for Preparation of Geological Analysis Reference Materials JJF 1854 Technical Specification for the Establishment, Evaluation and Expression of Metrological Traceability of Reference Materials GB/T 20725 Guidelines for electron probe microanalysis using spectroscopy and qualitative point analysis GB/T 21636 Microbeam analysis Electron probe microanalysis (EPMA) Terminology GB/T 28634 Microbeam analysis Electron probe microanalysis of bulk samples Spectroscopy quantitative point analysis For any referenced document with a date, only the version corresponding to the date is applicable to this specification; for any referenced document without a date, The latest version (including all amendments) shall apply to this specification.

3 Terms and definitions

The terms and definitions in JJF 1005 and GB/T 21636 apply to this specification. 3.1 Electron probe microanalysis stability The ability of a sample to resist changes in its chemical and physical properties when bombarded by an electron beam, i.e., the amount of change observed during the sample's exposure to the electron beam. The ability of the relevant characteristic X-ray intensity to withstand changes.

4 Overview

4.1 Before developing reference materials for quantitative analysis by electron probe, planning work should be carried out to determine the expected goals. Including the characteristics of the reference material, matrix, quantity and target measurement uncertainty. 4.2 The homogeneity, stability and value range of the properties to be measured of the standard materials used for quantitative analysis by electron probe should be suitable for The purpose of the standard material. 4.3 The stability of reference materials for electron probe quantitative analysis includes general stability and electron probe microanalysis stability Stability assessment is usually carried out after uniformity assessment. 4.4 Based on the characteristics of electron probe quantitative analysis, the homogeneity and stability of standard materials need to be evaluated on a micrometer scale. Qualitative.

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