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HST63-2019: Orientation distinguishing of flat-rolled products of silicon-electrical steel
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| HS/T 63-2019 | English | 149 |
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Orientation distinguishing of flat-rolled products of silicon-electrical steel
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HS/T 63-2019
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PDF similar to HST63-2019
Standard similar to HST63-2019 GB/T 3049 GB/T 3051 GB/T 3050 Basic data | Standard ID | HS/T 63-2019 (HS/T63-2019) | | Description (Translated English) | Orientation distinguishing of flat-rolled products of silicon-electrical steel | | Sector / Industry | Customs Industry Standard (Recommended) | | Classification of Chinese Standard | G10 | | Word Count Estimation | 6,682 | | Date of Issue | 2019-12-19 | | Date of Implementation | 2020-06-01 | | Regulation (derived from) | General Administration of Customs Announcement No. 201 of 2019 | | Issuing agency(ies) | General Administration of Customs | HST63-2019: Orientation distinguishing of flat-rolled products of silicon-electrical steel---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Qualitative Analysis Method for Orientation of Flat Rolled Materials of Silicon Electric Steel)
ICS 71.040.40
G 10/14
Customs Industry Standards of the People's Republic of China
HS
Qualitative analysis method for orientation of silicon electric steel flat rolled material
Orientation distinguishing of flat-rolled products of
silicon-electrical steel
2019-12-19 released
2020-06-01 implementation
Published by the General Administration of Customs of the People's Republic of China
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009, HS/T 1-2011 and HS/T 39-2013.
Appendix A and Appendix B of this standard are informative appendices.
This standard was proposed by the Customs Administration Department of the General Administration of Customs of the People's Republic of China.
This standard is under the jurisdiction of the Department of Policies and Regulations of the General Administration of Customs of the People's Republic of China.
This standard was drafted. Guangzhou Customs, People's Republic of China.
The main drafters of this standard. Xu Ke, Tan Chaoqin, and Jijie Wei.
Qualitative analysis method for orientation of silicon electric steel flat rolled material
1 Scope
This standard specifies the inspection procedures and result judgments for the identification of the orientation of flat rolled products of silicon electric steel.
This standard is applicable to the qualitative analysis of the orientation of flat rolled products of silicon electric steel.
2 Normative references
The following documents are essential for the application of this document. For dated references, only the dated version applies to this article
Pieces. For undated references, the latest version (including all amendments) applies to this document.
GB/T 6682 Analytical laboratory water specifications and test methods
JY/T 009 General rule of X-ray diffraction method
3 terms and definitions
The following terms and definitions apply to this standard.
3.1
Silicon-electrical steel
It refers to alloy steels with a silicon content of at least 0.6% but not more than 6% and a carbon content of not more than 0.08% by weight.
3.2
Non-oriented silicon-electrical steel
It refers to silicon electric steel with certain electromagnetic properties, and the crystal structure does not have the magnetization characteristics of a specific direction. Micro of non-oriented silicon electric steel
Obviously, the grain arrangement is non-directional, and it shows that the electromagnetic performance in all directions is more uniform.
3.3
Grain-oriented silicon-electrical steel
It refers to silicon electric steel with a certain regularity and direction in the crystal structure of the steel plate. Generally refers to the non-oriented silicon electric steel,
The hot-rolled, cold-rolled, and hot-worked processes obtain a single-oriented silicon electric steel with a Gaussian texture with grain orientation concentrated in the direction of easy magnetization.
4 Principle
X-ray diffractometer was used to analyze the crystal structure of the silicon electric steel sample. According to the diffraction peak intensity of the sample on the (110), (200), (211) crystal plane
Distribution to determine whether the silicon electric steel sample has orientation.
5 Reagents and materials
Unless otherwise specified, the water used in this standard is Grade III water specified in GB/T 6682.
5.1 Hydrochloric acid. HCl content 36% to 38%, analytically pure.
6 Equipment
6.1 X-ray diffractometer. Cu target light tube, Ni filter.
6.2 Beaker. 150 mL.
7 Analysis steps
7.1 Sample preparation
Take a silicon electric steel sample and process it into a 35 mm × 25 mm sheet (with the long side as the rolling direction), put it into a 150 mL beaker, and use about 25 mL
Hydrochloric acid was immersed until the surface coating was removed, washed with water several times, and wiped dry.
7.2 Analysis conditions
Refer to Appendix A for recommended test conditions, or refer to JY/T 009 to select appropriate analysis conditions.
7.3 Sample measurement
The prepared sample is placed on the sample stand of the X-ray diffractometer, and the sample is scanned and tested according to the set conditions along the rolling direction.
8 result judgment
Compared with Appendix B, according to the sample X-ray diffractometer test results, (110) (corresponding to 2θ angle is about 45 °), (200) (corresponding to 2θ
The diffraction peak intensity distribution of the crystal plane at an angle of approximately 65 °) and (211) (corresponding to an angle of 2θ of approximately 82 °).
For orientation, samples with similar characteristics to Figure B.2 were judged as non-oriented.
Appendix A
(Informative appendix)
X-ray diffractometer test parameter settings
Table A.1 X-ray diffractometer test parameter settings
Set item detection conditions
Tube voltage/kV 40
Tube current/mA 30
Detector ordinary detector or array detector
Goniometer parameter setting
(When using an array detector)
Initial angle [o2θ] 30
Ending angle [o2θ] 95
Step size [o2θ] 0.026
Scan time per step [s] 20
Appendix B
(Informative appendix)
Typical X-ray diffraction patterns of oriented and non-oriented silicon electrical steel
Figure B.1 Typical X-ray diffraction pattern of oriented silicon electrical steel
Figure B.2 Typical X-ray diffraction pattern of non-oriented silicon electrical steel
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