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Metallic materials - Residual stresses determination - Short-wavelength X-ray diffraction method
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GB/T 45597-2025
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Basic data Standard ID | GB/T 45597-2025 (GB/T45597-2025) | Description (Translated English) | Metallic materials - Residual stresses determination - Short-wavelength X-ray diffraction method | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | H22 | Classification of International Standard | 77.040.10 | Word Count Estimation | 30,359 | Date of Issue | 2025-04-25 | Date of Implementation | 2025-11-01 | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration |
GB/T 45597-2025: Metallic materials - Residual stresses determination - Short-wavelength X-ray diffraction method ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 77.040.10
CCSH22
National Standard of the People's Republic of China
Determination of residual stress in metal materials
Short wavelength X-ray diffraction
2025-11-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of contents
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Symbols and descriptions 2
5 Principle 3
6 General requirements 3
7 Sample 4
8 Test equipment 5
9 Measurement Procedure 6
10 Measurement uncertainty assessment11
11 Test Report11
Appendix A (Normative) Test and calculation method for internal (residual) stress 12
Appendix B (Informative) Selection of Short Wavelength X-ray Wavelength and Maximum Measurable Thickness 18
Appendix C (Informative) Diffraction Peak Determination 19
Appendix D (Informative) Selection of diffraction crystal planes 20
Appendix E (Informative) Evaluation of stress measurement uncertainty 21
Reference 25
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed by the China Iron and Steel Association.
This document is under the jurisdiction of the National Technical Committee on Steel Standardization (SAC/TC183).
This document was drafted by. Southwest Institute of Technology and Engineering of China North Industries Group Corporation, University of Science and Technology Beijing, Dongfang Steam Turbine Group of Dongfang Electric Corporation
Machinery Co., Ltd., Metallurgical Industry Information Standards Research Institute, National Standard (Beijing) Inspection and Certification Co., Ltd., Shenzhen Wance Testing Equipment Co., Ltd.,
Beijing Institute of Technology, China University of Mining and Technology, Central South University, and China Steel Research Institute Nake Testing Technology Co., Ltd.
The main drafters of this document are. Zheng Lin, Zhang Jin, Dou Shitao, Gong Xiufang, Dong Li, Chen Xin, Wang Shuming, Ji Pengfei, Huang Xing, Gao Zhenhuan, Che Luchang,
Xu Chunguang, Hou Huining, Wu Xiaoping, He Changguang, Feng Xianhe, Yang Ming, Pei Ning, Liu Haishun, Li Zhongsheng, Zhu Changjun, Zhou Kun, Zhang Jianwei, Zhao Fangchao,
Guo Bicheng.
Introduction
Short-wavelength X-ray diffraction is a nondestructive method for determining residual stress in crystalline materials.
Non-destructive determination of stress in a sample. The sample or workpiece is mounted on the sample stage of a short-wavelength X-ray diffraction instrument and the elastic stress is measured.
When the radiation source system is a heavy metal target X-ray tube, the X-ray beam is used to calculate the residual stress.
The energy analysis method of the electron can be used to monochromatize the short-wavelength characteristic X-ray. The extreme density maximum method in this document can be used to determine the existence of texture.
The purpose of this document is to determine the internal (residual) stress of polycrystalline materials and the internal (residual) stress of single crystal materials.
Provides a basis for measuring (residual) stresses in engineering applications.
Determination of residual stress in metal materials
Short wavelength X-ray diffraction
Warning. Personnel using this document should have practical experience in regular laboratory work. This document does not reflect all possible safety issues.
The user is responsible for taking appropriate safety and health measures and ensuring that the conditions stipulated by relevant national laws and regulations are met.
1 Scope
This document specifies the principle, general requirements and methods for determining residual stress in metallic materials using short wavelength X-ray diffraction (hereinafter referred to as SWXRD).
Requirements, specimens, test equipment, measurement procedures, measurement uncertainty evaluation and test reports, etc.
This document is applicable to the determination of internal (residual) stress of polycrystalline materials by short-wavelength X-ray diffraction method, and can also be used as a reference for single crystal materials.
2 Normative references
The contents of the following documents constitute essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB /Z 117 Requirements for radiation protection in industrial X-ray flaw detection
GB/T 8170 Rules for rounding off values and expression and determination of limit values
GB/T 26140-2023 Neutron diffraction method for residual stress measurement in non-destructive testing
JJF0026 Short wavelength characteristic X-ray diffractometer calibration specification
JJF1059.1 Evaluation and Expression of Measurement Uncertainty
3 Terms and definitions
The following terms and definitions apply to this document.
3.1
short-wavelength X-ray
X-rays with a wavelength less than 0.03nm.
Note. When the radiation source is a heavy metal target X-ray tube, it radiates characteristic X-rays with a wavelength less than 0.03 nm; when the radiation source is high-energy synchrotron radiation, it radiates wavelengths less than 0.03 nm.
X-rays with a length less than 0.03nm.
3.2
A special device placed to determine the propagation path of short-wavelength X-rays, usually consisting of a collimator and/or a slit.
3.3
Count intensity intensity counts
The number of photons measured within a specified time.
3.4
Peak shape function peakshapefunction
Function expression describing the diffraction peak shape.
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