| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 4057-1983 | English | RFQ |
ASK
|
3 days [Need to translate]
|
Single crystal silicon--Detection of microdefects--Chemical etching technique
| Obsolete |
GB/T 4057-1983
|