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GB/T 35002-2018 English PDF

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GB/T 35002-2018: Microwave circuits -- Measuring methods for frequency source
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Basic data

Standard ID GB/T 35002-2018 (GB/T35002-2018)
Description (Translated English) Microwave circuits -- Measuring methods for frequency source
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L58
Classification of International Standard 31.200
Word Count Estimation 18,153
Date of Issue 2018-03-15
Date of Implementation 2018-08-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 35002-2018: Microwave circuits -- Measuring methods for frequency source

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microwave circuits--Measuring methods for frequency source ICS 31.200 L58 National Standards of People's Republic of China Microwave circuit frequency source test method Published by.2018-03-15 2018-08-01 Implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Administration released Directory Preface I 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 General requirements 2 4.1 Test Environment Requirements 2 4.2 Test Instrument 2 4.3 Other requirements 3 4.4 Precautions 3 5 Detailed Request 3 5.1 Output Frequency 3 5.2 Frequency stepping 4 5.3 Frequency Time Stability 4 5.4 Frequency Temperature Stability 5 5.5 Frequency Accuracy 6 5.6 Output Power 7 5.7 Output Power Flatness 8 5.8 Power Temperature Stability 8 5.9 Harmonic Suppression Level 10 5.10 Clutter Suppression Level 10 5.11 Single Sideband Phase Noise 11 5.12 Frequency Hopping Time 13 5.13 Power Dissipation 14

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the content in this document may involve patents. The issuing agency of this document does not assume responsibility for identifying these patents. This standard was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This standard is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This standard was drafted by the 13th Institute of China Electronics Technology Group Corporation, the Fifth Institute of Electronics and Technology, and the Chengdu Institute of Electronics and Information Technology. Core Technology Co., Ltd. The main drafters of this standard. Guo Wensheng, Wu Aihua, Peng Hao, Zhang Jiacheng, Zhang Xueren, Han Dong, Liao Xueyang, Luo Bin. Microwave circuit frequency source test method

1 Scope

This standard specifies the electrical parameter test method for microwave circuit frequency sources. This standard applies to microwave circuit frequency sources, including direct analog synthesis sources, direct digital synthesis sources, indirect analog synthesis sources, and indirect numbers Word synthesis source, other products can refer to use.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article Pieces. For undated references, the latest version (including all amendments) applies to this document. GB/T 17573-1998 Semiconductor devices, discrete devices and integrated circuits. Part 1. General rules

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 Output frequency outputfrequency F0 The frequency source output signal frequency value. 3.2 Frequency stepping frequencystepsize Fstep The absolute value of the difference between the two adjacent output frequencies of the frequency source, ie the minimum resolvable frequency interval. 3.3 Frequency time stability frequencytimestability St The frequency source changes the output frequency within a specified period of time under specified conditions. 3.4 Frequency temperature stability frequencytemperaturestability ST The frequency of the output frequency changes with temperature under the specified conditions. 3.5 Frequency accuracy frequencyaccuracy The degree of agreement between the measured output frequency of the frequency source and the nominal output frequency. 3.6 Output power outputpower P0

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