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GB/T 34831-2017

Chinese Standard: 'GB/T 34831-2017'
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GB/T 34831-2017English289 Add to Cart Days<=4 Nanotechnologies -- Electron microscopy imaging of noble metal nanoparticles -- High angle annular dark field imaging method Valid GB/T 34831-2017
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Standard ID GB/T 34831-2017 (GB/T34831-2017)
Description (Translated English) Nanotechnologies--Electron microscopy imaging of noble metal nanoparticles--High angle annular dark field imaging method
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard N33
Classification of International Standard 17.180.01; 37.020
Word Count Estimation 16,160
Date of Issue 2017-11-01
Date of Implementation 2018-05-01
Drafting Organization National Nanoscience and Technology Center, Beijing Powder Technology Association
Administrative Organization National Nano Technology Standardization Technical Committee (SAC/TC 279)
Regulation (derived from) National Standard Announcement 2017 No. 29
Proposing organization Chinese Academy of Sciences
Issuing agency(ies) People's Republic of China General Administration of Quality Supervision, Inspection and Quarantine, China National Standardization Administration

GB/T 34831-2017
Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles-High angle annular dark field imaging method
ICS 17.180.01; 37.020
National Standards of People's Republic of China
Nanotechnology Precious metal nanoparticle electron microscopy imaging
High-angle ring dark field method
Nanotechnologies-Electron microscopy imaging of nonblemetal nanoparticles-
2018-05-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
China National Standardization Administration released
Foreword Ⅲ
Introduction IV
1 range 1
2 Normative references 1
3 Terms and definitions 1
4 high-angle annular dark field imaging principle 1
5 instruments and equipment 3
6 Reagents 3
7 Sample Preparation 3
8 Experimental Procedure 3
9 Experimental Report 3
Appendix A (informative) Precious metal nanoparticles high angle annular dark field imaging method Example 5
Appendix B (informative) Noble metal nanoparticles high angle annular dark field imaging 8
Reference 9
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard proposed by the Chinese Academy of Sciences.
This standard by the National Institute of Technology Standardization Technical Committee (SAC/TC279) centralized.
This standard is mainly drafted by the National Nano Science Center, Beijing Powder Technology Association.
The main drafters of this standard. Qi Xiao Ying, Chang often autumn, Zhu Xiaoyang, He Meng, plateau.
Because of their quantum effect, small size effect and surface effect, noble metal nanoparticles exhibit many unique physical and chemical properties.
Catalytic, energy, optics, electronics and biology and other fields have broad application prospects. Due to the size of the noble metal nanoparticles, agglomeration, particles
Grain uniformity and its properties are closely related, so the characterization of the topography is particularly important. In practical applications, precious metal nanoparticles
The particles typically form a composite with their support, with common scanning electron microscopy, transmission electron diffraction contrast imaging, and high resolution phase contrast
Techniques like technology can not effectively distinguish between precious metal particles and their supports. High-angle toroidal dark-field imaging is a use of the ring in scan-transmission mode
The shape detector collects high-angle scattering electron imaging and the contrast of the resulting image is approximately proportional to the square of the atomic number of the element, thus
Can effectively distinguish the noble metal particles in the composite system, and has atomic resolution, which is very suitable for the noble metal nanoparticles
Imaging. The method also applies to the imaging of micron-sized particles.
At present, the high-angle annular dark field imaging method is a mature method of characterization. In the system equipped with a scanning coil and a high-angle annular dark field detector
Transmission electron microscopy or scanning electron microscopy can be achieved. Because of its image contrast and atomic number are closely related to the noble metal nano
More and more people are beginning to use this technique to analyze nanoparticle samples in the characterization of rice particles.
The validity of the levy has also been gradually recognized and has played an important role in scientific research and production.
Nanotechnology Precious metal nanoparticle electron microscopy imaging
High-angle ring dark field method
1 Scope
This standard specifies the use of electron microscopy high angle annular dark field imaging of precious metal nanoparticles imaging method.
This standard applies to a single precious metal nanoparticles and composite materials in the imaging of noble metal nanoparticles.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version applies to this article
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
GB/T 19619 nanomaterials terminology
3 Terms and definitions
GB/T 19619 defined and the following terms and definitions apply to this document.
The external dimensions of the three dimensions are all on the nanoscale.
Note If the difference between the longest axis and the shortest axis of the nanostructures is significant (greater than 3), the nanorods and nanosheets are used to represent the nanoparticles.
[GB/T 32269-2015, Definition 4.1]
Gold, silver and platinum group metals collectively.
[GB/T 17684-2008, Definition 2.1]
Scanning transmission electron microscopy scanningtransmissionelectronmicroscopy; STEM
An analytic technique by which detectors simultaneously receive transmitted or scattered electrons from a converging electron beam to produce an image.
Note. Generally used in field emission transmission electron microscopy, and some field emission scanning electron microscope is also equipped with scanning transmission mode, there are special scanning transmission
High angle annular dark field imaging highangleannulardarkfieldimaging; HAADF
Scanning transmission electron microscopy using high angle scattering electron imaging.
4 high-angle annular dark field imaging principle
4.1 In a transmission electron microscope or a scanning electron microscope, a convergent electron beam is used to scan the sample and the coil is controlled by a dot-by-dot sweep
While scanning each point, a circular detector with a certain inner ring aperture placed below the sample synchronously receives power scattered by high angles
Sub, as shown in Figure 1, and the signal is converted to current intensity displayed on the screen or computer screen. This method does not use the center
The transmission of electrons, so the dark field image is observed.
Related standard:   GB/T 32525-2016  GB/T 32526-2016
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