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Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy
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GB/T 33714-2017
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Basic data Standard ID | GB/T 33714-2017 (GB/T33714-2017) | Description (Translated English) | Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | N04 | Classification of International Standard | 19.020 | Word Count Estimation | 21,214 | Date of Issue | 2017-05-12 | Date of Implementation | 2017-12-01 | Quoted Standard | GB/T 27760; GB/T 30544.1-2014; ISO 18115-2 | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | Summary | This standard specifies the method of characterizing the size of nanoparticles by measuring the height of nanoparticles by atomic force microscopy (AFM). This standard applies to the measurement of nanoparticles dispersed on the surface of the flat substrate. |
GB/T 33714-2017: Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Nanotechnology.Test method for size of nanoparticles.Atomic force microscopy
ICS 19.020
N04
National Standards of People's Republic of China
Nanotechnology Nanoparticle Size Measurement
Atomic force microscopy
2017-05-12 released
2017-12-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Directory
Preface III
1 Scope 1
2 normative reference document 1
3 Terms and definitions 1
Basic principles and patterns
5 instrument 2
6 Pretreatment of measuring sample 2
7 Measurement method 3
8 Measurements 5
9 Uncertainty Assessment 5
10 Measurement Report 5
Appendix A (informative) Method for the deposition of nanoparticles 7
Appendix B (informative) Particle height measurement Example 10
Appendix C (Informative Annex) Uncertainty Assessment 13
Appendix D (informative) Recommended measurement report format 15
References 16
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents.
This standard is proposed by the Chinese Academy of Sciences.
This standard is under the national standard of nanotechnology standardization technical committee (SAC/TC279).
The drafting of this standard. National Center for Nanoscience, Nanotechnology and Application of National Engineering Research Center, Beijing Powder Technology Association.
The main drafters of this standard. Zhu Xiaoyang, Yang Yanlian, Gao Jie, He Danon, Zhu Jun, Zhou Suhong, Zhang Ying
Nanotechnology Nanoparticle Size Measurement
Atomic force microscopy
WARNING. This standard does not address all possible safety issues. Before applying this standard, it is the user's responsibility to take appropriate safety and
Health measures, and to ensure compliance with the provisions of the relevant national laws and regulations.
1 Scope
This standard specifies the use of atomic force microscopy (Atomicforcemicroscopy, referred to as AFM) to measure the height of nanoparticles to characterize the
Rice particle size method.
This standard applies to the measurement of nanoparticles dispersed on the surface of the flat substrate.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 27760 Method for calibrating sub-nanometer height measurements by atomic force microscopy using Si (111) plane atomic steps
Nanotechnology terminology - Part 1. Core terminology GB/T 30544.1-2014
ISO 18115-2 Surface Chemical Analysis Terminology Part 2 Scanning Probe Microscopy Terminology (SurfaceChemical
analysis-Vocabulary-Part 2. Termsusedinscanning-probemicroscopy
3 terms and definitions
The following terms and definitions, as defined in GB/T 27760, GB/T 30544.1 and ISO 18115-2, apply to this document.
3.1
Agglomerate agglomerate
The buildup of the weakly bound particles, aggregates, or a mixture of both, has an outer surface area that is close to the sum of the surface areas of its individual particles.
Note 1. The forces that support the aggregates are weak, such as van der Waals forces or simple physical entanglement.
Note 2. Agglomerates are also referred to as secondary particles, while source particles are referred to as primary particles.
Note 3. Using imaging techniques, such as AFM, it is generally difficult to distinguish agglomeration (ie, artifacts) or pre-existing aggregates formed during the deposition of the sample.
3.2
Aggregates
Strongly bound or fused particles of new particles, the outer surface area may be less than the sum of the individual particle surface area.
Note 1. The forces that support the aggregates are strong forces, such as covalent bonds or from sintering or complex physical entanglement.
Note 2. Aggregates are also referred to as secondary particles, while source particles are referred to as primary particles.
Note 3. Using imaging techniques, such as AFM, it is generally difficult to distinguish between reunification and aggregation.
Basic principles and patterns
4.1 AFM works
As shown in Figure 1, the AFM uses a micro-cantilever with a tip to scan the surface of the sample. One end of the micro-cantilever is connected by an AFM controller
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