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GB/T 33714-2017 English PDF

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GB/T 33714-2017: Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy
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Basic data

Standard ID GB/T 33714-2017 (GB/T33714-2017)
Description (Translated English) Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard N04
Classification of International Standard 19.020
Word Count Estimation 21,214
Date of Issue 2017-05-12
Date of Implementation 2017-12-01
Quoted Standard GB/T 27760; GB/T 30544.1-2014; ISO 18115-2
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the method of characterizing the size of nanoparticles by measuring the height of nanoparticles by atomic force microscopy (AFM). This standard applies to the measurement of nanoparticles dispersed on the surface of the flat substrate.

GB/T 33714-2017: Nanotechnology -- Test method for size of nanoparticles -- Atomic force microscopy


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Nanotechnology.Test method for size of nanoparticles.Atomic force microscopy ICS 19.020 N04 National Standards of People's Republic of China Nanotechnology Nanoparticle Size Measurement Atomic force microscopy 2017-05-12 released 2017-12-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface III 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 Basic principles and patterns 5 instrument 2 6 Pretreatment of measuring sample 2 7 Measurement method 3 8 Measurements 5 9 Uncertainty Assessment 5 10 Measurement Report 5 Appendix A (informative) Method for the deposition of nanoparticles 7 Appendix B (informative) Particle height measurement Example 10 Appendix C (Informative Annex) Uncertainty Assessment 13 Appendix D (informative) Recommended measurement report format 15 References 16

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents. This standard is proposed by the Chinese Academy of Sciences. This standard is under the national standard of nanotechnology standardization technical committee (SAC/TC279). The drafting of this standard. National Center for Nanoscience, Nanotechnology and Application of National Engineering Research Center, Beijing Powder Technology Association. The main drafters of this standard. Zhu Xiaoyang, Yang Yanlian, Gao Jie, He Danon, Zhu Jun, Zhou Suhong, Zhang Ying Nanotechnology Nanoparticle Size Measurement Atomic force microscopy WARNING. This standard does not address all possible safety issues. Before applying this standard, it is the user's responsibility to take appropriate safety and Health measures, and to ensure compliance with the provisions of the relevant national laws and regulations.

1 Scope

This standard specifies the use of atomic force microscopy (Atomicforcemicroscopy, referred to as AFM) to measure the height of nanoparticles to characterize the Rice particle size method. This standard applies to the measurement of nanoparticles dispersed on the surface of the flat substrate.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. GB/T 27760 Method for calibrating sub-nanometer height measurements by atomic force microscopy using Si (111) plane atomic steps Nanotechnology terminology - Part 1. Core terminology GB/T 30544.1-2014 ISO 18115-2 Surface Chemical Analysis Terminology Part 2 Scanning Probe Microscopy Terminology (SurfaceChemical analysis-Vocabulary-Part 2. Termsusedinscanning-probemicroscopy

3 terms and definitions

The following terms and definitions, as defined in GB/T 27760, GB/T 30544.1 and ISO 18115-2, apply to this document. 3.1 Agglomerate agglomerate The buildup of the weakly bound particles, aggregates, or a mixture of both, has an outer surface area that is close to the sum of the surface areas of its individual particles. Note 1. The forces that support the aggregates are weak, such as van der Waals forces or simple physical entanglement. Note 2. Agglomerates are also referred to as secondary particles, while source particles are referred to as primary particles. Note 3. Using imaging techniques, such as AFM, it is generally difficult to distinguish agglomeration (ie, artifacts) or pre-existing aggregates formed during the deposition of the sample. 3.2 Aggregates Strongly bound or fused particles of new particles, the outer surface area may be less than the sum of the individual particle surface area. Note 1. The forces that support the aggregates are strong forces, such as covalent bonds or from sintering or complex physical entanglement. Note 2. Aggregates are also referred to as secondary particles, while source particles are referred to as primary particles. Note 3. Using imaging techniques, such as AFM, it is generally difficult to distinguish between reunification and aggregation. Basic principles and patterns 4.1 AFM works As shown in Figure 1, the AFM uses a micro-cantilever with a tip to scan the surface of the sample. One end of the micro-cantilever is connected by an AFM controller

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