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GB/T 30904-2014: Inorganic chemicals for industrial use -- Crystal form analysis -- X-ray diffraction method
Status: Valid
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 30904-2014 | English | 349 |
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Inorganic chemicals for industrial use -- Crystal form analysis -- X-ray diffraction method
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GB/T 30904-2014
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Basic data | Standard ID | GB/T 30904-2014 (GB/T30904-2014) | | Description (Translated English) | Inorganic chemicals for industrial use -- Crystal form analysis -- X-ray diffraction method | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G10 | | Classification of International Standard | 71.060.01 | | Word Count Estimation | 15,135 | | Date of Issue | 7/8/2014 | | Date of Implementation | 12/1/2014 | | Quoted Standard | GBZ 115; JY/T 009 | | Regulation (derived from) | 2014 National Standards Bulletin No. 18 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the method of X-ray diffraction crystal structure of inorganic chemical products analysis of terms and definitions, principle of the method, reagents and materials, instruments, sample preparation, measurement equipment laboratory | GB/T 30904-2014: Inorganic chemicals for industrial use -- Crystal form analysis -- X-ray diffraction method
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Inorganic chemicals for industrial use. Crystal form analysis. X-ray diffraction method
ICS 71.060.01
G10
National Standards of People's Republic of China
Inorganic chemical products crystal structure analysis
X-ray diffraction method
Issued on. 2014-07-08
2014-12-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
The standard proposed by China Petroleum and Chemical Industry Association.
This standard by the National Standardization Technical Committee chemical inorganic chemicals Club (SAC/TC63/SC1) centralized.
This standard was drafted. CNOOC Tianjin Chemical Research & Design Institute, commodities quality supervision, inspection Hunan, Henan Billions Chemicals Unit
Parts Limited, Dandong Tongda Technology Co., Ltd., the national mineral product quality supervision and inspection center.
The main drafters of this standard. Guo Yongxin, Shi Peng way, Chen Jianli, Zhangsuo Feng, Chen Hongjun, inexpensive Xiaoyan, FAN Guo-qiang, Hu Yu.
Inorganic chemical products crystal structure analysis
X-ray diffraction method
1 Scope
This standard specifies the method of X-ray diffraction crystal structure of inorganic chemical products analysis of terms and definitions, principle of the method, reagents and materials
Materials, instruments, sample preparation, measurement equipment laboratory conditions and safety.
This standard applies to the crystal structure of various inorganic chemical products were analyzed using the diffractometer.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB Z115 X-ray diffraction and fluorescence analyzer health protection standards
JY/T 009 rotating anode X-ray diffraction of polycrystalline General
3 Terms and Definitions
JY/T 009 defined in the following terms and definitions apply to this document.
3.1
X-ray diffraction X-raydiffractionmethod
Crystal diffraction effects make use of X-rays, according to the characteristic X-ray diffraction when passing through the crystal lattice of the material generated, identification of the crystal
The method of the structure portion.
3.2
Powder X-ray diffraction X-raypowderdiffractometer
With characteristic diffraction pattern or instrument to obtain data on the powder (or block) X-rays incident on a polycrystalline sample.
3.3
X-ray generator X-raygenerator
Equipment X-ray source for generating a stable, generally by the X-ray tube, high voltage generator and control circuit components.
3.4
Goniometer goniometer
X-ray diffraction of the core means for measuring the diffraction angle from the source arm, the detector arm, the sample table and slot system components.
3.5
Monochromator monochrometor
An X-ray monochromator of the apparatus consists essentially of a single crystal.
3.6
X-ray detector X-raydetector
The diffraction X-ray detector for the counter, which is based on X-ray photon counting to detect the presence or absence of a diffraction line thereof, and
strength.
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