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GB/T 29309-2012 English PDF

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GB/T 29309-2012: Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated life test
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PDF similar to GB/T 29309-2012


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Basic data

Standard ID GB/T 29309-2012 (GB/T29309-2012)
Description (Translated English) Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated life test
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard K04
Classification of International Standard 19.040
Word Count Estimation 23,229
Quoted Standard GB/T 2421.1-2008; GB/T 2422-1995; GB/T 2423.1-2008; GB/T 2423.2-2008; GB/T 2423.22-2002; GB/T 2423.43-2008; GB/T 2423.56-2006; GB/T 2424.5-2006; GB/T 2424.13-2002; GB/T 11804-2005; JJF 1101-2003
Regulation (derived from) National Standards Bulletin No. 41 of 2012
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the Highly Accelerated Life Test (Highly Accelerated Life Test, HALT) General requirements, test preparation and test methods. This standard specifies the highly accelerated life test, the applied stress tests including high temper

GB/T 29309-2012: Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated life test


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Accelerated stress testing procedures for electric and electronic products. Guidance for highly accelerated life test ICS 19.040 K04 National Standards of People's Republic of China Electric and electronic products accelerated stress testing procedures Highly Accelerated Life Test Guidelines Issued on. 2012-12-31 2013-06-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Table of Contents

Preface Ⅰ 1 Scope 1 2 Normative references 1 3 Terms and definitions 4 3 General requirements 5 Test preparation 4 Test Method 5 6 7 relevant norms should be given 10 Information 8 test report shall be given 10 Appendix A (informative) highly accelerated life test device 12 Annex B (informative) Test flowchart 15 Annex C (informative) stress isolation 16 Annex D (normative) stress limits confirmed 17

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard by the National Quality Supervision key product testing method Standardization Technical Committee (SAC/TC374) and focal points. This standard is drafted by. Shenzhen Academy of Metrology and Quality Inspection, inspection Warner (Beijing) Co., Ltd. Quality and Technology Center. The main drafters of this standard. Yangyan Zhang, Zhu Jianhua, Zhang, Li Yan, Zhang Canwen, Chen was Gu. Electric and electronic products accelerated stress testing procedures Highly Accelerated Life Test Guidelines

1 Scope

This standard specifies the Highly Accelerated Life Test (HighlyAcceleratedLifeTest, HALT) general requirements, testing and test preparation Test methods. Highly Accelerated Life Test specified in this standard, the test applied stress include high temperature step, low temperature stepping, rapid temperature change cycle, six from Broadband by the degree of non-Gaussian random vibration stress. This standard applies to electrical and electronic products and electronic components, printed circuit boards and other components. For large machine, it should be a priority in the front Test assembly level (such as a printed circuit board assembly, sub-module). This standard also applies to electrical and electronic product development, design and (or) the pilot production phase, it can also be used for mass production stage.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 2421.1-2008 Environmental testing for electric and electronic products overview and guidance (IEC 60068-1. 1988, IDT) GB/T 2422-1995 term environmental testing for electric and electronic products (eqv IEC 60068-5-2.1990) GB/T 2423.1-2008 Environmental testing for electric and electronic products Part 2. Test methods Test A. Cold (IEC 60068-2- 1.2007, IDT) GB/T 2423.2-2008 Environmental testing for electric and electronic products Part 2. Test methods Test B. Dry heat (IEC 60068-2- 1.2007, IDT) GB/T 2423.22-2002 Environmental testing for electric and electronic products Part 2. Test methods - Test N. Temperature change (IEC 60068-2-14. 1984, IDT) GB T 2423.43-2008 Electrical Part 2/Environmental testing. vibration, impact and similar dynamic tests methods Installation of the test sample (IEC 60068-2-47.2005, IDT) GB/T 2423.56-2006 Environmental testing for electric and electronic products Part 2. Test methods - Test Fh. Broadband random vibration (Digital control) and guidance (IEC 60068-2-64.1993, IDT) GB/T 2424.5-2006 Environmental testing for electric and electronic products to confirm performance of temperature chambers (IEC 60068-3-5.2001, IDT) GB/T 2424.13-2002 Environmental testing for electric and electronic products Part 2. Test methods for temperature change Test Guidelines (IEC 60068-2-33.2001, IDT) GB/T 11804-2005 electric and electronic products environmental conditions term JJF1101-2003 environmental testing equipment temperature, humidity calibration specification

3 Terms and Definitions

The following terms and definitions apply to this document. 3.1 Highly Accelerated Life Test highlyacceleratedlifetest, HALT It refers to gradually increase applied to the test sample test stress (such as temperature, vibration, rapid temperature change and vibration comprehensive stress) by determining

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