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GB/T 22586-2018: Electronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies
Status: Valid GB/T 22586: Evolution and historical versions
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Electronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies
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GB/T 22586-2018
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| GB/T 22586-2008 | English | 954 |
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Measurements of surface resistance of high temperature superconductor thin film at microwave frequencies
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GB/T 22586-2008
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PDF similar to GB/T 22586-2018
Basic data | Standard ID | GB/T 22586-2018 (GB/T22586-2018) | | Description (Translated English) | Electronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | H21 | | Classification of International Standard | 77.040.99 | | Word Count Estimation | 34,385 | | Date of Issue | 2018-03-15 | | Date of Implementation | 2018-10-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 22586-2018: Electronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies
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Electronic characteristic measurements--Surface resistance of superconductors at microwave frequencies
ICS 77.040.99
H21
National Standards of People's Republic of China
Replacing GB/T 22586-2008
Electronic characteristics measurement
Superconductor Surface Resistance at Microwave Frequency
(IEC 61788-7.2006, Superconductivity-Part 7. Electroniccharacteristic
Frequencies,MOD)
2018-03-15 Release.2018-10-01 Implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Administration released
Directory
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Request 1
5 Device 2
5.1 Test System 2
5.2 RS Test Chamber 2
5.3 medium column 3
6 Test Step 4
6.1 Sample Preparation 4
6.2 System Construction 4
6.3 Reference Level Test 5
6.4 Resonance Frequency Response Test 5
6.5 Determination of the Surface Resistance RS of Superconducting Thin Films, ε′ and tanδ of Standard Sapphire Columns 6
7 Precision and Accuracy of Test Methods 7
7.1 Surface Resistance 7
7.2 Temperature 8
7.3 Samples and Support Structures 8
7.4 Protection of samples 9
8 Test Report 9
8.1 Identification of the tested sample 9
8.2 RS Value Report 9
8.3 Test Condition Report 9
Appendix A (Informative) Additional Information Related to Chapters 1 to 8
Appendix B (Normative) Improved Image Media Resonator Method 19
Appendix C (Informative) Additional Information Related to Appendix B 25
Reference 28
Fig.1 Apparatus for testing the temperature dependence of RS with a chillerFig.2
Figure 2 Typical RS Test Chamber Diagram 3
Figure 3 Insertion loss IA at T(K) temperature, resonant frequency f0 and half power point bandwidth Δf 5
Fig. 4 Reflection coefficients (S11 and S22) 6
Figure 5 Definition of Terms in Table 4
Figure A.1 Structure diagram of various methods for measuring microwave surface resistance RS
Figure A.2 Short-circuit cylindrical dielectric resonator geometry with two superconducting thin films deposited on a dielectric substrate at both ends 12
Fig. A.3 Calculation result of the relationship between u-ν and W-ν in TE01p mode 13
Figure A.4 Electromagnetic field structure of a standard dielectric column for measuring RS and tan δ 13
Figure A.5 Structure diagram of three types of resonators 14
Fig. A.6 The schematic of the design of a TE011 resonator with parallel short circuits at both ends of the superconducting thin film [20] 15
Figure A.7 Model diagram for designing a TE013 resonator with parallel superconducting thin film short-circuited at both ends [20] 16
Figure A.8 Mode of Closed TE011 Resonator Figure 17
Figure A.9 Mode of Closed TE013 Resonator Figure 18
Figure B.1 Test System Diagram 19
Figure B.2 Typical installation of a modified mirror dielectric resonator resonant device 20
Figure B.3 test probe loading test sample diagram 20
Figure B.4 Coupling structure diagram 21
Figure B.5 Schematic view of gold cavity structure 22
Figure B.6 Newton ring schematic with well-proportioned calibration probe and test probe 24
Figure C.1 Test Probe Loading Calibration Probe Diagram 26
Figure C.2 Test probe loading metal plate diagram 27
Figure C.3 Test probe loading superconductor sample diagram 27
Table 1 Typical dimensions of standard sapphire dielectric columns at 12 GHz, 18 GHz, and 22 GHz
Table 2 Sizes of Superconducting Thin Films at 12GHz, 18GHz, and 22GHz
Table 3 Parameters of Vector Network Analyzer 7
Table 4 Sapphire dielectric column parameters 8
Table B.1 Coupling hole size 21
Table B.2 Sapphire Dielectric Column Dimensions and Machining Requirements 21
Table B.3 Dimensions of each part of the shield cavity 22
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard replaces GB/T 22586-2008 "High-temperature superconducting thin film microwave surface resistance test." Compared with GB/T 22586-2008,
The main technical changes are as follows.
--- Added Appendix B (normative appendix), given "improved mirror dielectric resonator method" application "calibration technology" measurement of single-chip high
Temperature superconducting film microwave surface resistance (RS) program. This scheme uses the modified TE01 δ mode mirrored sapphire medium
In the resonator method, the RS value of a single piece of superconducting thin film can be obtained by one measurement. This solution satisfies measurement variation
With a coefficient of less than 20%, the test efficiency can be greatly improved, and it is suitable for large-scale industrial testing.
--- Added Appendix C (informative annex), given some additional information related to Appendix B, such as "improved image media resonance
"Methods" theory deduction and so on.
This standard uses the redrafted method to modify the use of IEC 61788-7.2006 "Superconductivity Part 7. Measurement of superconductivity of electronic characteristics
The surface resistance of the body at microwave frequencies, compared with IEC 61788-7.2006, the main technical differences are as follows.
--- Increased normative Appendix B and informative Appendix C. Appendix B is another alternative.
This standard also made the following editorial changes.
--- The name "Superconductivity Part 7." was removed from the name of this standard so as to be consistent with the existing standard series.
This standard was proposed by the Chinese Academy of Sciences.
This standard is under the jurisdiction of the National Standardization Technical Committee for Superconductivity (SAC/TC265).
This standard was drafted by. University of Electronic Science and Technology, Tsinghua University, Nanjing University, Institute of Physics, Chinese Academy of Sciences.
The main drafters of this standard are. Zeng Cheng, Luo Zhengxiang, Bu Shirong, Wei Bin, Ji Zhengming, and Sun Liang.
The previous versions of the standard replaced by this standard are.
--- GB/T 22586-2008.
Introduction
Since the discovery of some perovskite-structured copper-oxygen compounds, international research and development on oxide high-temperature superconductors has been conducted extensively.
Work is making great strides in the application of high magnetic field equipment, low-loss energy transmission, electronics, and many other technical fields.
In many fields of electronics, especially in the field of communications, microwave passive components, such as superconducting filters, are under development and
After entering the field test stage [1,2].
Superconducting materials for microwave resonators, filters, antennas, and delay lines have the advantage of very low losses. Superconducting material loss characteristics
The development of new materials and the design of superconducting microwave devices are all very important. Superconducting material microwave surface resistance RS and surface resistance with temperature
The changing characteristics are important parameters needed to design low-loss microwave devices.
The latest advancement of HTS thin films, that is, its RS value is several orders of magnitude lower than that of common metals, increasing the
Rely on measurement technology requirements [3,4]. The traditional method for measuring rhenium and other low temperature superconducting materials RS is to make a three-dimensional resonance with the measured material.
The cavity is tested for its Q value. The RS value can be calculated by calculating the distribution of the electromagnetic field in the cavity. Another technique is in a larger cavity
Put in a small sample. There are many forms of this technique, but when the loss of the HTS film is calculated from the experimentally measured total cavity loss, the
Often contains the uncertainty introduced.
The best high-temperature superconducting thin film is an epitaxial thin film grown on a flat single crystal substrate. Up to now, it has not grown on curved surfaces.
High quality film. The requirement for high-temperature superconducting thin-film RS measurement technology is that small flat samples can be used; samples do not need to be
How to process; Will not damage or change the sample; High reproducibility; High sensitivity (as low as one thousandth of copper surface resistance); Dynamic range (up to copper
The surface resistance); can drive high internal power at medium power input; wide temperature variation range (4.2K~150K).
In several methods for determining the microwave surface resistance [5, 6, 7], we have chosen the dielectric resonator method because so far this method is
The most popular and practical. In particular, the sapphire resonator is an excellent tool for testing the surface resistance RS of high-temperature superconducting materials.
With [8,9]. Since the improved mirror dielectric resonator method has the ability to directly test the microwave surface resistance of a monolithic superconducting film, and its measurement becomes
The different coefficients are comparable to those of the dual-dielectric resonator method. This method is also recommended by us, so this standard is used as an alternative method in Appendix B.
Given.
The test method given in this standard can also be applied to other flat superconducting blocks including low critical temperature materials.
The purpose of this standard is to provide an appropriate and recognized standard for engineers currently working in the fields of electronics and superconductor technology.
technology.
The test method covered by this standard is based on VAMAS (Versailles Advanced Materials and Standards Project) to determine the pre-standard characteristics of superconducting thin films.
On the basis of the work.
Electronic characteristics measurement
Superconductor Surface Resistance at Microwave Frequency
1 Scope
This standard specifies the method of testing the surface resistance of a superconductor using the double resonator method at microwave frequencies. The test target is at the resonant frequency.
The following RS changes with temperature. The improved mirror dielectric resonator method, as an alternative method, is given in Appendix B.
This standard applies to surface resistance testing as follows.
--- Frequency. 8GHz \u003cf\u003c30GHz;
--- Test resolution. 0.01mΩ (f = 10GHz).
The test report gives the surface resistance value at the test frequency and gives a value that is converted to 10 GHz using the relationship of RS∝f 2 .
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article
Pieces. For undated references, the latest version (including all amendments) applies to this document.
IEC 60050-815 International Electrotechnical terminology superconductivity [International electrotechnicalvocabulary(IEV)-Part
815. Superconductivity]
3 Terms and definitions
The following terms and definitions as defined by IEC 60050-815 apply to this document.
3.1
Surface Impedance surfaceimpedance
Zs
The ratio of the electric field tangential component Et to the magnetic field tangential component Ht of the conductor (including the superconductor).
ZS=Et/Ht=RS jXS
In the formula.
RS---surface resistance;
XS --- surface reactance.
4 Requirements
Microwave signals input to dielectric resonators loaded with superconducting thin-film samples can be obtained by measuring dielectric resonator attenuation at different frequencies
The superconducting thin film surface resistance RS. The test frequency is scanned near the center of the resonance frequency, and the attenuation of the frequency response characteristics can be related to the loss.
The Q value.
When the test temperature is between 30K and 80K, the target precision of this method, namely the coefficient of variation (defined as the standard deviation divided by the table
The average surface resistance is less than 20%.
In order to ensure the safety and health of the testers, appropriate safety measures should be established before use and some restrictions should be imposed.
This type of test presents some risks. The test requires the use of refrigeration equipment to cool the superconductor in a superconducting state.
The direct contact between the skin and the cold chamber, like liquid nitrogen splashing on the skin surface, can quickly cause frostbite. RF signal generator is a test
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