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GB/T 18910.1-2012 English PDF

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GB/T 18910.1-2012: Liquid crystal display devices -- Part 1: Generic specification
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GB/T 18910.1-2012English959 Add to Cart 5 days [Need to translate] Liquid crystal display devices -- Part 1: Generic specification Obsolete GB/T 18910.1-2012
GB/T 18910.1-2002English999 Add to Cart 4 days [Need to translate] Liquid crystal and solid-state display devices -- Part 1: Generic specification Obsolete GB/T 18910.1-2002

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Basic data

Standard ID GB/T 18910.1-2012 (GB/T18910.1-2012)
Description (Translated English) Liquid crystal display devices -- Part 1: Generic specification
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L47
Classification of International Standard 31.120
Word Count Estimation 24,295
Older Standard (superseded by this standard) GB/T 18910.1-2002
Quoted Standard IEC 60068-2-41; IEC 60068-2-4; IEC 60068-2-42; IEC 60068-2-43; IEC 60068-2-44; IEC 60068-2-45; IEC 60068-2-46; IEC 60068-2-47; IEC 60068-2-48; IEC 60068-2-49; IEC 60068-2-5; IEC 60068-2-50; IEC 60068-2-52; IEC 60068-2-53; IEC 60068-2-54; IEC 60068-2-55; I
Regulation (derived from) National Standards Bulletin No. 41 of 2012
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the IECQ system of quality assessment of the general program, and gives the electro-optical properties of the general requirements for test methods are given climatic, mechanical and durability test methods. This section applies to

GB/T 18910.1-2012: Liquid crystal display devices -- Part 1: Generic specification

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Liquid crystal display devices. Part 1. Generic specification ICS 31.120 L47 National Standards of People's Republic of China Replace GB/T 18910.1-2002 Liquid crystal display device Part 1. General specification Released on.2012-12-31 2013-06-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Administration issued

Content

Foreword III 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 General 1 4.1 Priority 1 4.2 Temperature, humidity and pressure preference 2 4.3 Mark 2 4.4 Quality Assessment Category 2 4.5 Screening 3 4.6 Operation 3 5 Quality assessment procedures 3 5.1 General 3 5.2 Qualification for Approved Approval 3 5.3 Business Confidential Information 3 5.4 Composition of the inspection lot 3 5.5 Structurally similar device 3 5.6 Approved grant 3 5.7 Quality consistency test 4 5.8 Statistical sampling procedure 6 5.9 Durability test 7 5.10 Durability test for failure rate determination 7 6 Test and test procedures 8 6.1 Standard atmospheric conditions for electro-optic testing 8 6.2 Physical examination 8 6.3 Electro-optic test 8 6.4 Environmental Test 9 Appendix A (informative) The main difference between this part and GB/T 18910.1-2002 10 Appendix B (Normative Appendix) Batch Allowable Nonconforming Product Rate (LTPD) Sampling Plan 12 Appendix C (informative) Example 18 of the LCD outline drawing Appendix D (Normative Appendix) Orientation of Liquid Crystal Display Module 20

Foreword

GB/T 18910 "Liquid Crystal Display Device" is divided into the following parts. --- Part 1. General specification; ---Part 1-1. Terms and symbols; --- Part 2. Liquid crystal display module sub-specification (GB/T 18910.2-2003, IEC 61747-2.1998, IDT); --- Part 2-1. Blank detail specification for passive matrix monochrome liquid crystal display module (GB/T 18910.21-2007, IEC 61747- 2-1.1998, IDT); --- Part 2-2. Blank detail specification for color matrix liquid crystal display modules (GB/T 18910.22-2008, IEC 61747-2-2. 2004, IDT); --- Part 3. Liquid crystal display sub-specification (GB/T 18910.3-2008, IEC 61747-3.1998, IDT); --- Part 3-1. LCD blank detail specification; --- Part 4. Basic ratings and characteristics of liquid crystal display modules and screens (GB/T 18910.4-2007, IEC 61747-4. 1998, IDT); --- Part 4-1. Basic rating and characteristics of color matrix liquid crystal display modules (GB/T 18910.41-2008, IEC 61747- 4-1.2004, IDT); ---Part 5. Environmental, durability and mechanical test methods (GB/T 18910.5-2008, IEC 61747-2.1998, IDT); --- Part 6. Standard series of test methods for liquid crystal display devices. This part is the first part of GB/T 18910. This part is drafted in accordance with the rules given in GB/T 1.1-2009. This part replaces GB/T 18910.1-2002 "Liquid crystal and solid state display devices - Part 1. General specification". The main changes and their causes in this section compared with GB/T 18910.1-2002 are given in Appendix A for reference. This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of China Electronics Technology Standardization Institute (CESI). This section drafted by. China Electronics Technology Standardization Institute. The main drafters of this section. Zhao Ying. The previous versions of the standards replaced by this section are. ---GB/T 18910.2-2002. Liquid crystal display device Part 1. General specification

1 Scope

This part of GB/T 18910 is the general specification for liquid crystal display devices. It specifies the general procedure for the quality assessment of the IEC Q system and gives The general requirements for electro-optic characteristics test methods are given, and the test methods for climatic, mechanical and durability are given. This section applies to liquid crystal display devices, including liquid crystal displays and liquid crystal display modules.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 4589.1-2006 Part 10. General specification for discrete devices and integrated circuits (IEC 60747-10. 1991, IDT) Semiconductor devices - Discrete devices and integrated circuits - Part 1. General (idtIEC 60747-1.1983) Liquid crystal and solid-state display devices - Part 5. Environment, durability and mechanical test methods (IEC 61747-5.1998, IDT) GB/T 18910.11-2012 Liquid crystal display devices - Part 1-1. Terms and symbols GB/T 18910.61-2012 Liquid crystal display devices - Part 6-1. Liquid crystal display devices IEC 60068 (all parts) Environmental Test (Environmentaltesting) IEC 60410.1973 Counting Inspection Sampling Plans and Procedures (Samplingplansandproceduresforinspectionby Attributes) IEC 60747 (all parts) Semiconductor device discrete devices (Semiconductor devices-Discretedevices) IEC 60748 (all parts) Semiconductor device integrated circuits (Semiconductor devices-Integrated circuits) IEC 60749.1996 Semiconductor device mechanical and climatic test methods (Semiconductor devices-Mechanicaland Climatictestmethods) QC001002.1986 Rules of Procedure for IEC Q Electronic Component Quality Assessment System (RulesofProcedureoftheIEC QualityAssessmentSystemforElectronicComponents(IEC Q)) ISO 1101.1983 Technical Drawing Geometric Tolerance Shape, Position and Deviation Tolerance General, Definition, Symbol and Pattern Representation (Technicaldrawings-Geometricaltolerancing-Tolerancingofform, orientation, locationandrun- out-Generalities,definitions,symbols,indicationsondrawings) ISO 2859 (all parts) Counting check sampling program (Samplingproceduresforinspectionbyattributes)

3 Terms and definitions

The terms and definitions defined in GB/T 18910.11-2012 apply to this document.

4 General

4.1 Prioritization In case of dispute, the various documents shall be executed in the following order of authority. a) detailed specifications; b) blank detail specification; c) family norms (if at times); d) sub-specification; e) general specifications; f) basic specifications; g) IEC Q rules of procedure; h) any other international documents (eg IEC ) that need to be referenced; i) National documents. The same priority order applies to equivalent country documents. 4.2 Temperature, humidity and pressure preferences The preferred values for temperature, humidity and pressure for characteristic testing, testing and working conditions are as specified in GB/T 18910.5-2008. 4.3 mark 4.3.1 Device Identification The markings on the device should be legible. 4.3.2 Device traceability The device should have a traceability code that can be traced back to the exact production lot and inspection lot of the device. 4.3.3 Packaging The following signs should be on the package. a) the identification code of the device; b) the traceability code of the device in the package; c) the number of devices in the package; d) Other matters needing attention if needed. The above signs can be adjusted according to the usual rules. Note. Other additional requirements may be specified in the relevant detailed specifications. 4.4 Quality Assessment Category This specification specifies three categories of quality assessment. Devices in the same inspection lot with identification code and date code, according to the specified quality The category is tested. The acceptable quality level (AQL) or batch allowable non-conforming product rate (LTPD) corresponding to the same inspection group may be different. The quality category varies and should be in accordance with the detailed specifications. The minimum requirements for each category are as follows. Class I---This type of device meets Class II or Class III accreditation requirements. Each batch is in compliance with Group A inspections including functional tests. begging. Each batch of tests on the ability to interconnect each other every three months shall meet the requirements. Each year, Group B and Group C tests should be performed. Requirements (see 5.7.2). Class II---This batch meets the batch-by-batch requirements of Groups A and B and the periodic inspection requirements of Group C. Class III---This batch is subject to 100% screening and meets the batch-by-batch requirements of Groups A and B and the periodic inspection requirements of Group C. The sub-specification and blank detailed specifications shall specify the minimum requirements for the above categories. Detailed specifications can be included in the general specification, sub-specification or empty Additional requirements not included in the white detailed specification, including screening. 4.5 Screening Screening is the testing and testing of all devices in a batch. When required by the detailed specification, it shall be submitted to the batch in one of the sequences given in the relevant tables of the sub-specification or the blank detailed specification. All devices are screened and all defective devices are eliminated. Only when the above selected sequences are not related to the accepted failure mechanism or have spears When screening, other screening sequences that are not specified are used. Part of the screening procedure given in the relevant table of the sub-specification or blank detail specification When a part of the manufacturing process is formed, it is not necessary to repeat these processes. For the purposes of this specification, veteran is defined as being in the batch within the specified time. All devices apply thermal and electrical stresses to verify and eliminate potential early failure products. 4.6 Operation According to the requirements of Part IX of GB/T 17573-1998. In the case of toxic and hazardous substances, there should be a warning sign (for example. BeO).

5 Quality assessment procedures

5.1 General The quality assessment includes the procedures specified in 4.4 for approval of the appraisal and subsequent batch-by-batch as specified in the detailed specifications (if required) Includes screening) and periodic quality consistency checks. The quality assessment test is divided into Group A, Group B and Group C tests in batches or cycles as specified in 4.4. In some cases it can also Group D trials are specified, for example for identification approval. 5.2 Qualification for accreditation Only when a certain type of device meets the requirements of Chapter 11 of QC001002.1986 is it eligible for approval. 5.2.1 Initial manufacturing stage The initial manufacturing phase is specified in the sub-specification or blank detail specification. 5.3 Business Confidential Information If a part of the manufacturing process involves trade secrets, it should be properly labeled and the inspector should prove that it has been followed. QC001002. The requirements of 10.2.2 in 1986 are satisfactory to the National Supervision and Inspection Agency (NSI). 5.4 Composition of the inspection lot See the provisions of 12.2 of QC001002.1986. 5.5 Structurally similar devices See the provisions of 8.5.3 of QC001002.1986. The details of the grouping are specified in the relevant sub-specification or blank detail specification. 5.6 Grant of Approved Approval See 11.3.1 of QC001002.1986. The manufacturer may select the method of 11.3.1 of QC001002.1986 according to the inspection requirements given in the sub-specification or the blank detailed specification. a) or method b). The sample can be composed of suitable structurally similar devices. In some cases, the approval approval requires a group D test. As All change tests for the end point test performed after the end of the test in the detailed specification shall record the change data. The accreditation report should include a summary of all test results performed by each group and each subgroup, including the number of devices tested and the number of failed devices. The summary is given by the delta and/or count data. The manufacturer shall retain all data for the time required by NSI. 5.7 Quality consistency test 5.7.1 General The quality consistency test shall consist of Group A, Group B, Group C and Group D tests and tests when specified. For Group B and Group C tests, the samples may consist of structurally similar devices. Samples for periodic testing shall be taken from one or several batches tested by Groups A and B. Each device should pass the detailed specification Required group A test. 5.7.2 Division of groups and groups The following guidelines should be followed when developing detailed specifications. 5.7.2.1 Group A inspection (batch by batch) This group specifies the visual inspection and testing to assess the main characteristics of the device in batches. Structurally similar is not allowed unless otherwise specified Grouping. Group A tests are divided into the following groups. A1 grouping. This group consists of external visual inspection as specified in 6.2.1. A2 grouping. This grouping consists of tests for the main characteristics of the device. A3 and A4 grouping. These groups may not be required, they consist of tests for the secondary characteristics of the device. Appropriate for each device category Requirements should be specified in the relevant sub-specification or blank detail specification. Whether the test item is listed in the A3 group or the A4 group depends on where it is needed. These tests are performed at a quality level. 5.7.2.2 Group B inspection (batch by batch, except for category I, see 4.4) This group specifies the procedures to be used to assess certain other characteristics of the device, including those that can normally be completed within a week or Mechanical, climatic, electrical, and optical durability tests specified in the relevant sub-specifications or blank detail specifications. 5.7.2.3 Group C test (cycle) This group specifies the procedures to be used to evaluate certain other characteristics of the device, including three months apart. (Class II and III) or electrical and optical tests at intervals of one year (Class I) or in accordance with relevant sub-specifications or blank detail specifications, mechanical, climatic and resistant Long-term test. 5.7.2.4 Division of Group B and Group C In order to be able to easily compare changes from group B to group C or, if necessary (see 5.7.4), the corresponding data in groups B and C The trial included groups with the same number. The division is as follows. B1/C1 grouping. Includes measurements that measure the interchangeability of the device. B2a/C2a grouping. Includes electrical and optical performance testing to characterize device design. B2b/C2b grouping. Includes certain electrical and optical components that have been tested in Group A under different voltage, current, temperature, and optical conditions. Test for further evaluation of characteristics. B2c/C2c grouping. When applicable, includes verification of device ratings. B3/C3 grouping. Includes tests to evaluate the mechanical strength of the device. B4/C4 grouping. Includes tests to evaluate the solderability of the device. B5/C5 grouping. Includes tests to assess the ability of the device to withstand climatic stress. For example. temperature changes, sealing and other tests. B6/C6 grouping. Includes tests to assess the ability of the device to withstand mechanical stress. For example. vibration, shock. B7/C7 grouping. Includes tests to assess the ability of the device to withstand long periods of humidity. B8/C8 grouping. Includes tests to evaluate the failure characteristics of the device under endurance test conditions. Group B9/C9. Includes tests to evaluate the electrical and optical properties of the device at extreme storage temperatures. B10/C10 grouping. Includes tests to evaluate the performance of the device as it changes pressure. Group B11/C11. Includes flag durability test. CRRL grouping. select and list some of the tests and/or tests that have been done in each of the above groups, and put the results in the release batch certification record. (CRRL) is given. These groupings may not all be required. 5.7.2.5 Group D test This group specifies the procedures to be performed every 12 months or for identification purposes only. 5.7.3 Inspection requirements The statistical sampling procedure in 5.8 should be used. 5.7.3.1 Batch rejection criteria Batches that do not meet the quality consistency test of Group A or Group B shall not be accepted. If the device fails to pass the quality consistency check process A test that passes a group will result in the batch being rejected, the quality consistency check should be terminated immediately, and the batch will be treated as Group A and Group B. Reject the batch. If an inspection lot does not meet the quality consistency requirements and has not been resubmitted, it should be considered a rejection lot. 5.7.3.2 Resubmitted batch Under technically possible conditions, the failed batch that has been reworked and resubmitted for quality conformance testing shall contain only the original batch. And each inspection group (Group A and Group B) can only be resubmitted once. The resubmitted batch should be separated from the new batch and should be clearly The batch identified as resubmitted. Resubmitted batches should be re-sampled randomly and all tests in Group A should be tested. 5.7.3.3 Procedures in the event of test equipment failure or operator error If it is confirmed that the device failure is caused by a failure of the test equipment or an operator error, the failure shall be recorded in the test record. (If NSI agrees not to be credited to the CRRL) and submit to NSI with a complete description of why the confirmation is not counted as invalid. The general inspector should decide whether to replace the replacement device in the same inspection lot with the sample. Substitute devices should be subjected to failure of the failed device The same tests that have been previously performed should also be subjected to tests that the failed device is intended to perform. 5.7.3.4 Procedure for failure of periodic inspection When group B fails, the corresponding group C test (see 5.7.2.4) is also invalid. If the cycle check fails, it is not due to equipment failure. If it is caused by an operator error, execute 12.6 of QC001002.1986 and make the following modifications. ---12.6.1 Item a. "Pause all devices within the similar group of the structure to be released within the system". ---12.6.4 Item a. "After correcting the manufacturing error, the corrected batches of products are immediately restored to the system. program". ---12.6.8. "If the appraisal approval is revoked in accordance with 12.6.7, a simplified procedure may be adopted in accordance with the advice of the NSI (mainly for Tests for those characteristics that cause failure)) 5.7.4 Additional procedures for relaxing inspection 5.7.4.1 Group B A special relaxation check procedure can be used to allow the manufacturer to group all of the Group B inspections at intervals of up to three months. A batch of inspections was performed every three batches instead of the normal inspection of Group B in batches. When a group meets the requirements, this special procedure is Applicable to this grouping. The conditions for this procedure are that the ten batches pass the Group B test. Under the relaxation test procedure, when a group of samples does not meet a group inspection At the time of the test, the group should be restored to the normal test of group B. 5.7.4.2 Group C When the interval between the periodic inspections is specified as three months, if the periodic inspection is passed three times in three-month intervals, then The inspection cycle can be extended to six months. Under the extended interval procedure, when a sample does not meet a group test, it should be restored to normal. Three-month interval (see also 5.7.3.4). 5.7.5 Small batch sampling requirements When the batch is very small, it can be carried out in accordance with 3.6.4 of GB/T 4589.1-2006 or 3.5 of IEC 60410.1973. 5.7.6 Release Batch Certification Record (CRRL) See Chapter 14 of QC001002.1986. 5.7.7 Delivery of devices subjected to destructive or non-destructive testing Tests marked (D) in a sub-specification or blank detail specification are considered to be destructive. Devices that have undergone destructive testing shall not Included in the delivery batch. Devices that have undergone non-destructive environmental testing can be delivered as long as they are re-inspected and qualified as required by Group A. 5.7.8 Delayed delivery Devices that exceed the specified period before delivery shall be subject to the relevant sub-specification or blank detail specification when delivered in whole or in part. Set of Group A tests and Group B interconnect capability tests. After the entire batch has completed such inspections and tests, within the same period afterwards Re-inspection can no longer be required. 5.7.9 Additional procedures for delivery Manufacturers can provide devices with higher levels of quality assessment than those with lower quality ratings. 5.8 Statistical sampling procedures For Group A, B and C inspections, AQL or LTPD sampling procedures should be used, and the detailed specification should specify which procedure to use. 5.8.1 AQL sampling plan See 4.5 of IEC 60410.1973. There are three types of sampling schemes, one, two, and multiple. When several types of sampling schemes are applied to a given AQL and generation When the code letter is used, any one of them can be used. 5.8.2 LTPD sampling plan See Appendix B. 5.9 Durability test Durability tests shall be specified in the detailed specifications. 5.10 Durability test for failure rate 5.10.1 General The failure rate used in this section is defined as LTPD expressed as a percentage per 1000h. The durability test shall be carried out in accordance with the prescribed procedures. Durability tests performed within the maximum ratings or ratings of the device shall be considered non-destructive. 5.10.2 Sample extraction Samples for durability testing shall be randomly selected from the inspection lot (see Appendix B). For the 1000h test, the sample size shall be determined by the manufacturer. Select the failure rate column (see Table B.1) or the actual batch column (see Table B.2). The number of qualifying decisions should correspond to the specific sample size selected. 5.10.3 Failure A device that meets one or more of the endpoint limits specified for the endurance test at any specified readout time shall Is a failure. Moreover, any readout time afterwards is also considered to be invalid. If a group of samples is no longer compatible with the durability test Manufacturers are allowed to stop the test on their own. 5.10.4 Durability test time and sample volume Regardless of whether the failure rate is specified, the initial durability test time should be 1000h. Once a batch passed the 1000h durability test In the detailed specification, the durability test time can be reduced to a certain period. 5.10.5 Procedures used when the number of failures found exceeds the number of qualifying decisions If the number of failures found in the durability test exceeds the number of qualifying decisions, the manufacturer should choose one of the following options. a) withdraw the entire batch; b) adding samples in accordance with 5.10.5.1; c) if the initially selected test time is less than 1000h, the test time is extended to 1000h according to 5.10.5.2; d) Screen the batch in accordance with 5.7.3.2 and resubmit. After using one of the above options, if the test fails, the procedure of 5.7.3.4 is performed. 5.10.5.1 Additional samples For each submission, the program can only be used once. When selecting this option, the new total number of samples (initially plus additional) should be The manufacturer selects from the failure rate specified in Table B.1 or the actual batch column in Table B.2. Should be extracted from the original batch enough to increase the sample to the new selection The additional amount of the total sample size selected. The new qualifying decision number should be comparable to the new total sample size selected. Additional samples should be subjected to initial The samples were tested for the same durability test conditions and time. If the total number of unqualified products (originally plus increased) is fo...

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