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GB/T 5201-2012 English PDF

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GB/T 5201-2012: Test procedures for semiconductor charged particle detectors
Status: Valid

GB/T 5201: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB/T 5201-2012English369 Add to Cart 3 days [Need to translate] Test procedures for semiconductor charged particle detectors Valid GB/T 5201-2012
GB/T 5201-1994English679 Add to Cart 5 days [Need to translate] Test procedures for semiconductor charged particle detectors Obsolete GB/T 5201-1994
GB 5201-1985English359 Add to Cart 3 days [Need to translate] Test procedures for semiconductor charged particle detectors Obsolete GB 5201-1985

PDF similar to GB/T 5201-2012


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Basic data

Standard ID GB/T 5201-2012 (GB/T5201-2012)
Description (Translated English) Test procedures for semiconductor charged particle detectors
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard F88
Classification of International Standard 27.120
Word Count Estimation 16,146
Older Standard (superseded by this standard) GB/T 5201-1994
Quoted Standard GB/T 4960.6-2008; GB/T 10263-2006; GB/T 13178-2008
Adopted Standard IEC 60333-1993, NEQ
Regulation (derived from) National Standards Bulletin No. 13 of 2012
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the charged particles and the electrical characteristics of semiconductor detectors of nuclear radiation measurement methods as well as some special environmental test methods. This standard applies to charged particles partially d

GB/T 5201-2012: Test procedures for semiconductor charged particle detectors

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test procedures for semiconductor charged particle detectors ICS 27.120 F88 National Standards of People's Republic of China Replacing GB/T 5201-1994 Charged particle semiconductor detector measurement method (IEC 60333.1993Nuclearinstrumentation-Semiconductorchargedparticle detectors-Testprocedures, NEQ) Issued on. 2012-06-29 2012-11-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard replaces GB/T 5201-1994 "Test Method for semiconductor charged particle detectors," This standard GB/T 5201-1994 (Hereinafter referred to as the original standard) compared to the main technical changes are as follows. --- Increasing the foreword; --- Increased Chapter 2, "Normative references", other chapters numbered sequentially pushed back; --- Original standard "terminology, symbols" to Chapter 3, "Terms and definitions" and fully referenced GB/T 4960.6-2008, without further write; --- Remove the original standard 2.2 "Symbols" section, use the symbols in the text where to be described; --- An increase of 4.1 "Test conditions or reference standard test conditions" instead of the original 3.1 standard; --- Original standard 3.3 and 3.4 combined 4.3; delete the original standard 3.7; --- 5.1 "voltage - current characteristic (VI characteristic)" to increase the reverse VI characteristics of the test; --- Original standard 4.3 "noise measurements" section front suspension was changed to 5.3.1 "Measuring methods and measuring systems," other sections numbered sequentially After pushing; --- 4.3.6 after the original standard "detector noise amplifier with a time constant of change" to add new content to 5.3.7; --- 5.4.2 "charge collection time," adds support for "fast", "slow" detectors distinguishing criteria; --- Chapter 7, "environmental testing" full references GB/T 10263-2006, without further write. The standard reference method using redrafted IEC 60333.1993 "Nuclear Instruments Semiconductor Charged Particle Detector Test Procedures" establishment, And IEC 60333.1993 is non-equivalent. This standard by the National Nuclear Instrument Standardization Technical Committee (SAC/TC30) and focal points. This standard was drafted. nuclear (Beijing) Nuclear Instrument Factory. Drafters of this standard. Li Zhiyong, Wang Jun. Charged particle semiconductor detector measurement method

1 Scope

This standard specifies the test method for measuring the electrical properties and radiation properties of semiconductor charged particle detectors as well as some special circumstances method. This standard applies to charged particle detector depleted portion of the semiconductor layer. Fully depleted semiconductor detector measurement can be performed with reference to this standard.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 4960.6-2008 nuclear science and technology - Part 6. Nuclear instrumentation GB/T 10263-2006 nuclear radiation detectors Environmental conditions and testing procedures GB/T 13178-2008 gold silicon surface barrier detector

3 Terms and Definitions

Terms and definitions GB/T 4960.6-2008 defined apply to this document.

4 General requirements

4.1 measurements should be carried out under reference conditions or standard test conditions (see Table 1). Table 1 Reference conditions or standard test conditions Project Reference conditions Standard test conditions Ambient temperature 20 ℃ 18 ℃ ~ 22 ℃ Relative humidity 65% \u200b\u200b50% 75% Atmospheric 101.3kPa 86kPa ~ 106kPa AC supply voltage UNa (1 ± 1.0%) UN AC power frequency 50Hzb (1 ± 1%) × 50Hz AC power supply waveform distortion sine wave Total < 5% DC supply voltage rating of ± 1% Environmental γ radiation (air dose rates) 0.1μGy/h < 0.25μGy/h External magnetic field value is less than the minimum interference is negligible cause interference External magnetic induction is negligible smaller than Earth's magnetic field caused by the interference of two times Radioactive contamination is negligible negligible a single-phase or three-phase power supply 220V 380V. When using battery power, the voltage change of the nominal ± 1%, without considering the ripple. b frequency AC power supply, a special case according to the provisions of the standard product.

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