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GB 4793.5-2008 English PDF

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GB 4793.5-2008: Safety requirements for electrical equipment for measurement, control, and laboratory use -- Part 5: Safety requirements for hand-held probe assemblies for electrical measurement and test
Status: Valid

GB 4793.5: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB 4793.5-2008English914 Add to Cart 6 days [Need to translate] Safety requirements for electrical equipment for measurement, control, and laboratory use -- Part 5: Safety requirements for hand-held probe assemblies for electrical measurement and test Valid GB 4793.5-2008
GB 4793.5-2001English679 Add to Cart 3 days [Need to translate] Safety requirements for electrical equipment for measurement, control and laboratory use Particular requirements for hand-held probe assemblies for electrical measurement and test Obsolete GB 4793.5-2001

PDF similar to GB 4793.5-2008


Standard similar to GB 4793.5-2008

GB/T 42125.14   GB 4793.9   GB 4793.6   GB 4793   GB 4793.4   GB 4793.3   

Basic data

Standard ID GB 4793.5-2008 (GB4793.5-2008)
Description (Translated English) Safety requirements for electrical equipment for measurement, control, and laboratory use -- Part 5: Safety requirements for hand-held probe assemblies for electrical measurement and test
Sector / Industry National Standard
Classification of Chinese Standard N09
Classification of International Standard 19.080
Word Count Estimation 46,483
Date of Issue 2008-08-30
Date of Implementation 2009-09-01
Older Standard (superseded by this standard) GB 4793.5-2001
Quoted Standard GB 4208; GB/T 5468.2; GB/T 16927.1; GB/T 16927.2; GB/T 16935.3; IEC 60027; ISO 7000,
Adopted Standard IEC 61010-031-2002, IDT
Regulation (derived from) Announcement of Newly Approved National Standards No. 14 of 2008 (total 127)
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This Chinese standard applies to the following various types of handheld and handheld probe assemblies, as well as professional, industrial process use, and educational purposes related accessories. The probe assembly is used as a test or electrical phenomena and the interface between the measuring device. They can be fixedly installed on the device, the device can also be a detachable attachment. a) low and high pressure non- attenuation probe assembly (A type): Non- attenuation probe assembly connected directly to people is higher than the rated voltage of 33V AC RMS, 46. 7V peak or DC 70V, but not more than 63kV. They do not contain active components, nor with the partial pressure of function or signal conditioning functions, but may include the type of the source fuse non- attenuation element. b) high attenuation or partial pressure probe assembly (B type): attenuation or partial pressure probe set

GB 4793.5-2008: Safety requirements for electrical equipment for measurement, control, and laboratory use -- Part 5: Safety requirements for hand-held probe assemblies for electrical measurement and test



---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Safety requirements for electrical equipment for measurement, control, and laboratory use.Part 5. Safety requirements for hand-held probe assemblies for electrical measurement and test ICS 19.080 N09 National Standards of People's Republic of China GB 4793.5-2008/IEC 61010-031.2002 Replacing GB 4793.5-2001 Measurement, control and laboratory use electrical equipment Safety requirements - Part 5. Electrical measurements and tests Safety requirements for hand-held probe assemblies (IEC 61010-031.2002, IDT) Published 2008-08-30 2009-09-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China issued

Table of Contents

Introduction Ⅲ And a range of object 1 1.1 Scope 1 1.2 Objective 1 1.3 Identification 1.4 Environmental Conditions 2 2 Normative references 2 2 3 Definitions 3.1 Parts and Accessories 2 Electrical 3.2 magnitude 4 3.3 Test 5 3.4 Security terms 5 3.5 Insulation 6 4 Test 7 4.1 Overview 7 7 4.2 Test procedure 4.3 reference test conditions 7 4.4 Test under single fault conditions 8 5 Marking and documentation 9 5.1 mark 9 5.2 11 warning signs 5.3 mark durability 11 5.4 file 11 6 anti-shock 12 6.1 Overview 12 6.2 determination of accessible parts 12 6.3 parts accessible allowable limits 13 6.4 insulating protection against electric shock in claim 16 6.5 clearances and creepage distances 19 23 6.6 Dielectric strength test 6.7 Structure of protection against electric shock in claim 25 7 against mechanical hazard 27 8 mechanical shock resistance and impact 27 8.1 stiffness test 27 8.2 drop test 27 8.3 28 swing impact test 9 and temperature limits to prevent spread of flame 28 9.1 Overview 28 GB 4793.5-2008/IEC 61010-031.2002 9.2 Temperature Test 29 10 Heat 29 10.1 clearances and creepage distances integrity 29 10.2 Heat 29 11 fluid-risk 29 11.1 Overview 29 11.2 Cleaning 29 11.3 probe assembly 30 special protection 12 30 Components 12.1 Overview 30 12.2 Fuse 30 12.3 high integrity components 30 Measurement circuitry Annex A (normative) contacting current 32 Annex B (normative) standard test finger 35 Annex C (normative) clearance and creepage distance measurement 37 Reference 41 FIG Example 1 A and C of the probe assembly 3 Example 2 B-type probe assembly of FIG. 4 The method of FIG. 3 accessible parts (see 6.2) and voltage determination tests (see 6.4.1). 12 Application Example 4 FIG. 14 contacts metal foil current measurement Charging under single fault conditions in FIG. 5 the capacitance value (see 6.3.2.3) 15 FIG protective contact probes 6 (see 6.4.4) 18 FIG 7 Deflection Test 26 FIG 8 probe assembly used in the cable bending test 27 FIG 9 oscillating impact test (see 8.3) 28 Table 1 Symbol 9 Table 2 clearances in elevation 5000m multiplier 19 Table 3 Measurement category Ⅱ, Ⅲ category and category clearances 20 Ⅳ Table 4 clearances 21 value calculated by 6.5.2.2 Table 5 creepage distance 22 Table 6 Basic insulation test voltage 24 Table correction factor test voltage according to the test site altitude specified 725 Table pull cable 268 connected GB 4793.5-2008/IEC 61010-031.2002

Foreword

All technical contents of this section is mandatory. GB 4793 "measurement, control and laboratory safety requirements for electrical equipment" is currently divided into seven parts. --- Part 1. General requirements (IEC 61010-1); --- Part 2. Particular electrical measurement and test requirements held and hand operated current sensors (IEC 61010-2-032); --- Part 3. laboratory mixing and stirring equipment Particular requirements (IEC 61010-2-051); --- Part 4. Particular requirements for laboratory use (IEC 61010-2-041) Autoclave treatment of medical material; --- Part 5. Safety electrical measurement and test requirements of the handheld probe assembly (IEC 61010-031); --- Part 6. Laboratory Particular requirements (IEC 61010-2-010) heating of materials; --- part 7. Particular requirements for laboratory centrifuges (IEC 61010-2-020). Note. The name of the section will change with changes in IEC standard names. This is Part 5 GB 4793's. This section is equivalent to using IEC 61010-031.2002 "measurement, control and laboratory safety requirements for electrical equipment with Part 031. Electrical measurement and test Safety requirements for hand-held probe assemblies "(in English). Technical content, structure, and expression from the text IEC 61010-031.2002 exactly the same. For ease of use, the present editorial changes made the following section. --- with a decimal point "." Instead of a comma as the decimal point "." --- omitted IEC 61010-031.2002 Contents Introduction and "Appendix D (informative) defined Index". --- For the IEC 61010-031.2002 references other international standards have been adopted as identical or modified our standards, the Department Points with our national standards or industry standards instead of the corresponding international standards; the rest is not equal to or modify adopted as our standard International standards, are directly referenced in this section. This section is GB 4793.5-2001 "measurement, control and laboratory safety electrical measurement and test equipment using a hand held electric probe Particular requirements for head assembly "(IEC 61010-2-031.1993, IDT) revision. This part is a separate part, and therefore in addition to the content mentioned in note 1.1, does not require use of the reference section GB 4793.1. This portion larger compared to GB 4793.5-2001 modifications. re-configuration of the scheduling. Some more detailed test method to do Fine exposition. --- increase the tensile test; --- increased flexural/tensile test; --- increased rotational flexural test method. Appendix A of this section, Appendices B and C are normative. This section was proposed by China Machinery Industry Federation. This part of the jurisdiction of the National measurement, control and electrical equipment Safety Laboratory Standardization Technical Committee (SAC/TC338). The drafting of this section. of Instrumentation Comprehensive Economic Institute of Technology. The main drafters of this section. Wang Linkun, Zheng Xu, Liu Xiaojing, Mei Ke, Ouyang Jinsong, when FANG Xiao, Wang Jianhua, Zhang Guiling, Pan Changqing. This section replaces the following previously issued as follows. --- GB 4793.5-2001. GB 4793.5-2008/IEC 61010-031.2002 Measurement, control and laboratory use electrical equipment Safety requirements - Part 5. Electrical measurements and tests Safety requirements for hand-held probe assemblies

1 Scope and Purpose

1.1 Scope GB 4793 This section applies to each of the following types of hand-held and hand operated probe assembly, as well as professional use, with the industrial process, using a phase education Off attachment. The probe assembly is used as an interface between an electrical phenomenon and test or measurement equipment. They may be fixedly mounted On the device, it can be detachable accessory equipment. a) a low pressure and a high pressure non-attenuating probe assembly (A type). rated voltage direct access to non-attenuation of the probe assembly has a higher than 33V AC Rms, 46.7V peak or DC 70V, but not more than 63kV. They contain neither active element, nor provided with dividing function Or signal conditioning, but it may include such non-passive fuse damping element. b) attenuating the high-pressure or partial pressure of the probe assembly (B type). damping voltage dividing probe assembly or direct access to a secondary voltage higher than the nominal 1kV, but not exceeding 63kV. Dividing function may all be implemented in the probe assembly, or used in conjunction with the probe assembly of the present Partially implemented in the testing or measuring equipment. c) a low pressure or partial pressure of the attenuation probe assembly (C type). attenuation, partial pressure or other signal conditioning components directly access probe voltage ratings Higher than 33V AC rms, 46.7V peak or DC 70V, but no more than 1kV rms AC or DC 1.5kV value. Signal conditioning functions may all be implemented in the probe assembly, or testing or measuring probe assembly is provided for use with the present together in Preparation of partially implemented. Note. the range is not A, B or C as defined in the probe assembly, or the probe assembly is designed to supply a low-voltage mains, comprising, or not part of the present Laid Other special features of the probe assembly need to meet the requirements specified in GB 4793 in the other portions. 1.2 Purpose 1.2.1 content including various aspects within the scope of this GB 4793 a predetermined object of this section is to ensure that the design and construction methods can be used for the operating personnel and the surrounding environment in order to The following aspects provide adequate protection. a) an electrical shock or burn (see Section 6, Chapter 10 and Chapter 11); b) mechanical hazards (see Chapter 7, Chapters 8 and 11); c) over temperature (see Chapter 9); d) flame spread outwardly from the probe assembly (see Chapter 9). Note. pay attention to the country responsible for workers' health and safety department may have prescribed, the current additional requirements. 1.2.2 aspects of the content within the scope of this section does not include This portion does not include. Reliability features a) a probe assembly, performance or other characteristics; b) the effectiveness of transport packaging; c) Maintenance (repair); d) Protection service (repair) personnel. Note. You can expect to maintenance staff will be very careful to treat a variety of obvious danger, but still in the design to be used in an appropriate manner to prevent Accidents, and maintenance documentation should be pointed out that any residual risks. 1.3 Identification This section also provides a method to identify and type testing inspection probe assembly meets the requirements of this part. GB 4793.5-2008/IEC 61010-031.2002 1.4 Environmental conditions This part is designed to be suitable for use in at least the following conditions are safe probe assembly. a) no more than 2000m above sea level, or if specified by the manufacturer, the altitude of more than 2000m; b) at a temperature of 5 ℃ ~ 40 ℃, if specified by the manufacturer, the temperature can be higher or lower than 5 ℃ 40 ℃; c) maximum relative humidity at a temperature lower than 31 ℃ 80%, temperature is 40 ℃ linearly to 50% relative humidity; d) Applicable rated pollution degree.

2 Normative references

Terms of the following documents constitute provisions of this section by reference in this section 4793 of the GB . For dated references, All subsequent amendments (excluding corrections) or revisions do not apply to this section, however, encouraged to reach an agreement under this section Whether the parties to use the latest versions of these documents. For undated reference documents, the latest versions apply to this section. GB 4208 shell protection (IP code) (GB 4208-2008, IEC 60529.2001, IDT) GB/T 5465.2 electrical equipment graphical symbols (GB/T 5465.2-1996, idt IEC 60417.1994) GB /high-voltage test techniques Part T 16927.1. General test requirements (GB/T 16927.1-1997, IEC 60060- 1. 1989, MOD) GB/T 16927.2 high voltage test techniques. Measurement System (GB/T 16927.2-1997, IEC 60060-2. 1994, MOD) GB/T 16935.3 insulated apparatus the low pressure fitting system Part 3. the use of a coating, potting and pressure transducer protection against pollution (GB/T 16935.3-2005, IEC 60664-3.2003, IDT) IEC 60027 (all parts) Letter symbols electrician ISO 7000 and equipment outline graphic symbol index

3 Terms and Definitions

The following terms and definitions apply to this part 4793 of GB . Unless otherwise specified, "voltage" value and the "current" value means the average RMS AC, DC, or synthetic voltage or current. Where the use of "power Mains supply "refer to the low voltage power supply system (which is greater than a predetermined value in 6.3.2.1). 3.1 Parts and Accessories 3.1.1. A component is that the devices (apparatuses) connected to an external conductor provided. [IEV151-01-03, revised edition] Note. The terminal can contain one or several contact member, so that the term also includes a socket, pin, connector or the like. 3.1.2. Prevent certain equipment from external influences and to prevent direct contact with components from any direction provided. 3.1.3 Parts prevented from any direct contact with the normal direction of approaching provided. Note. the housing and the baffle plate may be provided protection flame spread (9.1). 3.1.4 For testing or measuring device and the test device or circuit under test between a contact point made temporary. It includes cables and for the realization of the Test or measurement tools attached. Note. See Figure 2 and described in Figure 1 and the exemplary functional components of the probe assembly. GB 4793.5-2008/IEC 61010-031.2002 legend. 1 --- Typical linker; 2 --- probe; 3 --- probe body; 4 --- connected to the device; 5 --- alligator clips; 6 --- Reference linker; 7 --- BNC connectors; Example 8 --- attachment. FIG Example 1 A and C of the probe assembly GB 4793.5-2008/IEC 61010-031.2002 legend. 1 --- probe; 2 --- connected to the device; Reference 3 --- linker; 4 --- baffle; District 5 --- hand-held probe body. Example 2 B-type probe assembly of FIG. 3.1.5 Probe assembly part connected to the pilot or test. 3.1.6 The test or reference point measuring apparatus (typically a function of the ground terminal) is connected to the circuit under test or device under test a reference point. 3.1.7 Including keys and coins, including an external device to help people to perform some kind of mechanical function and use. 3.2 Electrical values 3.2.1. Usually by the manufacturer for components, apparatus, or device operation state reaches a given magnitude. [IEV151-04-03] GB 4793.5-2008/IEC 61010-031.2002 3.2.2. A set of ratings and working conditions. [IEV151-04-04] 3.2.3 When the device is in normal use, the maximum continuous voltage appearing on the insulation. Note. open circuit conditions and normal operating conditions are to be considered. 3.3 Test 3.3.1. For a particular design, to demonstrate whether the design and structure of this part to meet one or more requirements and the one or more of the devices A sample stage (components or devices) tests performed. Note. This is an extension to IEV151-04-15 defined to include both design requirements and structural requirements. 3.4 Safety Terms 3.4.1. When the predetermined standard 6.2 can test finger touch or the test pin. 3.4.2 Under normal conditions make it single fault condition occurs or an electric shock or electrical burns (values apply to normal conditions see 6.3.1, for a single Under a fault condition is considered to be applicable to higher value, see 6.3.2). 3.4.3 Less prone to cause a risk of malfunction of danger; high integrity of the member is considered to be less prone to failure during the test under the conditions Failed. 3.4.4 Combination of components, component or components of the insulating and substantially limiting or pressure-limiting device, when it is connected to the conductive parts accessible at risk When the charging between the components, the impedance of the degree of protection, and structural reliability provided under normal conditions and single fault conditions to achieve this section Claim. 3.4.5 The operation according to the instructions for use or intended use of the clear, including standby. Note. In most cases, the normal use also refers to normal conditions, because manual warns users not to use the equipment under abnormal conditions. 3.4.6 All protective measures to prevent dangerous conditions are intact. 3.4.7 Protective measures to prevent the risk of a failure condition occurs or is likely to cause some dangerous conditions a failure occurs. Note. If a single fault conditions will inevitably lead to another single fault conditions, such a two failures are considered a single fault condition. GB 4793.5-2008/IEC 61010-031.2002 3.4.8 According to the intended use of the device to operate the equipment people. Note. The operator should receive proper training for this purpose. 3.4.9 Responsible for the maintenance and use of equipment or operator to ensure that individuals or organizations receive adequate training. 3.4.10 The presence of water or other conductive liquids may, due to moisture between the moisture and the contact between the human body and the device in contact with the environment or the human body Which may reduce the body impedance place. 3.4.11 A potential source of harm (see 1.2). 3.5 Insulation 3.5.1 Whose failure can cause a shock hazard insulation. Note. The basic function of the insulation can also be used for the purpose of insulation. 3.5.2 Separate insulation applied in addition to the basic insulation to ensure protection against electric shock while still basic insulation fails. 3.5.3 Constituted by an insulating base and supplementary insulation. 3.5.4 Which provides insulation against electric shock capability is not less than double insulation. NOTE. Reinforced insulation insulation can not be tested as, or substantially as an additional insulating layers constituted solely by insulating. 3.5.5 Dielectric strength or cause additional foreign substance to reduce the surface resistivity of a solid, liquid or gaseous (ionized gas). 3.5.6 One order to evaluate the degree of pollution 3 below a predetermined clearances and microenvironment. 3.5.6.1 Pollution Degree 1 No pollution or only dry non-conductive pollution, the pollution has no adverse effects. 3.5.6.2 Pollution degree 2 Normally only non-conductive pollution, but occasionally due to the condensation function and short conductive. 3.5.6.3 Pollution degree 3 Dried conductive or nonconductive contamination contamination by condensation function becomes conductive. GB 4793.5-2008/IEC 61010-031.2002 3.5.7 Two conductive parts, the shortest distance in air. 3.5.8 The shortest distance between two conductive parts in the insulating material surface. [IEV151-03-37]

4 Test

4.1 Overview All tests of this type of tests are carried out on a sample probe assembly or parts thereof. The sole purpose of these tests To verify the design and construction to ensure compliance with the requirements of this section. The probe assembly and the subassembly to meet the relevant standards, during type test apparatus not have to repeat the entire test. If the probe assembly comprising a plurality of probe types (see 1.1), the test should be conducted for each type according to their application requirements. Should be checked for compliance by all applicable requirements of this part of the test, but if the inspection probe assemblies can really prove certainly pass Had a trial, then this test may be omitted. Test was carried out under the following conditions. a) a reference test conditions (see 4.3); b) single fault conditions (see 4.4). NOTE 1. If the rated range of environmental conditions of the probe assembly exceeds a predetermined 1.4, to ensure that the manufacturer (e.g., testing by appropriate changes required, or Additional tests) still meet the security requirements of this section. Note 2. If, when the test for compliance, or an applied measured value (e.g. voltage) of the actual value of the error due to uncertainty, then. --- manufacturer to ensure that the value of the applied test is at least a predetermined value; --- test departments should ensure that the test applied is not greater than the value specified. Note 3. we have been subjected to type test probe assembly, may be due to the influence of residual stress caused by the test no longer suitable for its intended function. To this end, exploration After the head assembly is no longer the factory (e.g., a responsible party) subjected to type test. 4.2 Test order Subject to this section, the test sequence may be optionally. Should be carefully checked after each test is tempted head assembly. If the test The results of doubts, doubts if the test out of order, whether any of the test through the front, the front of these tests should be repeated get on. Test under fault conditions can damage equipment, these tests can be placed at the reference test after test conditions. 4.3 standard test conditions 4.3.1 Environmental conditions Except otherwise specified in this section, the test sites should have the following environmental conditions (1.4 but not conflict environmental conditions). a) Temperature. 15 ℃ ~ 35 ℃; b) Relative humidity. not more than 75%; c) atmospheric pressure. 75kPa ~ 106kPa; d) frost, condensation, seepage, rain and sunshine. 4.3.2 Status probe assemblies Except as otherwise provided, on each test probe assembly to be assembled for normal use, and at most a predetermined 4.3.3 - 4.3.9 Carried out under unfavorable combination of conditions. Without some special tests on the entire probe assembly due to size or quality reasons, to allow the subassembly tested, only To prove validated probe assembly can be assembled to meet the requirements of this section. 4.3.3 the position of the probe assembly A probe assembly in any position of normal use, and any ventilation is not blocked. GB 4793.5-2008/IEC 61010-031.2002 4.3.4 Accessories Recommended by the manufacturer, operator and accessory for use with a test probe assembly or replacement of parts may be provided or may not be connection. 4.3.5 lid and removable parts Lid removed without tools and parts can be removed or not removed. 4.3.6 Input and Output Voltage Input and output voltage, comprising a floating voltage, any voltage should be adjusted within the range of the rated voltage. 4.3.7 controls The operator can manually adjust the control member should be provided at any position on the manufacturer label probe assembly combination setting prohibition The exclusions. 4.3.8 connection Probe assembly intended use thereof should be connected or not. 4.3.9 duty cycle Short-term or intermittent operation of the probe assembly, shall be in accordance with the manufacturer's instructions, with the longest period and the shortest period of work Time to recover. 4.4 Test under single fault conditions 4.4.1 Overview Shall be the following requirements. a) Check the probe assembly and can determine whether there is a circuit diagram generally may be dangerous in the meaning of this and therefore whether it should be applied Fault conditions; b) unless it can prove that a particular fault condition does not cause danger, otherwise the test should be the fault; c) in the probe assembly to be most unfavorable combination of reference test conditions (see 4.3) work for different faults conditions these compositions Can vary during each run conditions should be a combination of these records. 4.4.2 Fault conditions applied Fault condition includes a fault condition should be specified 4.4.2.1 ~ 4.4.2.4. These conditions can only be applied to a fault, and should be the most Convenient order sequentially applied. Can not be applied to multiple simultaneous failures, the results caused by these failures is to apply unless a fault. Each time after the fault condition is applied, the probe assembly can be applied or part of the test 4.4.4. 4.4.2.1 short-time or intermittent operation of the probe component or components If the probe may lead to a component or components under a single fault conditions of continuous work, it should work continuously. 4.4.2.2 Output Should each output short circuit B and C of the probe assembly, a short-circuit time. 4.4.2.3 insulation between circuits and components Insulation between the circuits and components for short-circuit should be lower than the basic insulation for insulating a predetermined magnitude, in order to check whether the fire can be prevented The spread of flame. Note. Check alternative method to prevent the spread of flame see 9.1. 4.4.2.4 Components Component B and C of the probe assembly (except high integrity components) should be short or open circuit test, choose a more disadvantaged. 4.4.3 Test duration The probe assembly failures should have been working to produce the applied until there is no longer the result of further changes. Each test is generally limited Set within 1h, because the secondary failure of a single fault condition caused usually show up within that period of ti...

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