SN/T 3348-2012 English PDFUS$189.00 ยท In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. SN/T 3348-2012: Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry Status: Valid
Basic dataStandard ID: SN/T 3348-2012 (SN/T3348-2012)Description (Translated English): Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry Sector / Industry: Commodity Inspection Standard (Recommended) Classification of Chinese Standard: H40 Classification of International Standard: 77.140.20 Word Count Estimation: 7,747 Quoted Standard: GB/T 1031; GB/T 16597 Regulation (derived from): National Quality Inspection (2012) 777; industry standard filing Notice 2013 No. 4 (No. 160 overall) Issuing agency(ies): General Administration of Customs Summary: This standard specifies the chrome-nickel steel, tungsten, silicon, manganese, phosphorus, chromium, nickel, tungsten content of wavelength dispersive X-ray fluorescence spectrometric method. This standard applies to chrome-nickel steel, tungsten silicon, SN/T 3348-2012: Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel.Wave-length dispersive X-ray fluorescence spectrometry People's Republic of China Entry-Exit Inspection and Quarantine Standards Determination of chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content Wavelength dispersive X-ray fluorescence spectrometry Determinationofsilicon, manganese, phosphorus, chromium, nickelandtungsten Issued on. 2012-12-12 2013-07-01 implementation People's Republic of China The State Administration of Quality Supervision, Inspection and Quarantine released ForewordThis standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard is proposed and managed by the National Certification and Accreditation Administration Committee. This standard was drafted. People's Republic of China Shandong CIQ. The main drafters of this standard. WANG Zhao Kun, Cai hair, Qi Jialin, Liu Jingjie, Xu Ming, Li Yan Qiu, Wang Chonglin. Determination of chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content Wavelength dispersive X-ray fluorescence spectrometry1 ScopeThis standard specifies the chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content of wavelength dispersive X-ray fluorescence spectrometric method. This standard applies to the determination of chromium nickel-tungsten steel silicon, manganese, phosphorus, chromium, nickel, tungsten content in the measurement range shown in Table 1. Table 1 Measuring range% (mass fraction) Element measurement range measurement range of elements Silicon 0.069 to 0.41 Manganese 0.23 to 0.62 P 0.010 to 0.048 Chromium 0.30 to 1.93 Nickel 1.09 ~ 6.93 Tungsten, 0.60 to 1.602 Normative referencesThe following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 1031 surface roughness parameters and their values GB/T 16597 metallurgical product analysis X-ray Fluorescence Spectrometry General3 Method summaryAnalysis of the sample surface processed into a smooth plane, at selected measuring instrument conditions, measure the X-ray characteristics of the analyte in the sample spectrum Ray fluorescence intensity, according to the quantitative relationship between X-ray fluorescence intensity between the analyte content, calculate the amount of analyte.4 Reagents and materials4.1 detector gas (P10). 90% argon, 10% methane for gas-flow proportional counter. 4.2 Standard sample. Spectroscopy using standard test block. Each element should be at least six standard samples, the content should be a certain interval, and covers the test element Pigment measurement range.5 Instruments5.1 wavelength dispersive X-ray fluorescence spectrometer, in line with GB/T 16597 regulations. 5.2 lathe, milling machine, planer, or other non-polluting metallographic sandpaper surface processing equipment. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of SN/T 3348-2012_English be delivered?Answer: Upon your order, we will start to translate SN/T 3348-2012_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of SN/T 3348-2012_English with my colleagues?Answer: Yes. 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