SJ/T 11706-2018 PDF English
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Basic data
| Standard ID | SJ/T 11706-2018 (SJ/T11706-2018) |
| Description (Translated English) | Semiconductor integrated circuits test methodof field programmable gate array |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L55 |
| Word Count Estimation | 29,296 |
| Date of Issue | 2018-02-09 |
| Date of Implementation | 2018-04-01 |
| Regulation (derived from) | Ministry of Industry and Information Technology Announcement No. 10 of 2018 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This standard specifies the electrical parameter test method of the SRAM type Field Programmable Gate Array (FPGA). |