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SJ/T 11628-2016 PDF English

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SJ/T 11628-2016: (Solar cell line characterization test method with die size and electrical)
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SJ/T 11628-2016English209 Add to Cart 3 days [Need to translate] (Solar cell line characterization test method with die size and electrical)

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Basic data

Standard ID SJ/T 11628-2016 (SJ/T11628-2016)
Description (Translated English) (Solar cell line characterization test method with die size and electrical)
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard H21
Word Count Estimation 9,953
Date of Issue 2016-04-05
Date of Implementation 2016-09-01
Regulation (derived from) The Ministry of Industry and Notice No. 2016 in 2016; industry standard record announcement 2016 No. 7 (total 199)
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the non-contact on-line test method for the size and electrical characterization of silicon wafers for solar cells (hereinafter referred to as silicon wafers), including dimensions of wafer side length, diagonal length, adjacent side perpendicularity, thickness and total thickness. Electrical characterization includes conductivity type, carrier recombination lifetime, and resistivity. The main contents include normative references, terms and definitions, method summary, interference factors, equipment, sample requirements, test environment, test procedures, precision and test reports.

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