SJ/T 11627-2016 PDF English
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Basic data
| Standard ID | SJ/T 11627-2016 (SJ/T11627-2016) |
| Description (Translated English) | (Solar wafers rate online Test methods Resistance) |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | H21 |
| Word Count Estimation | 7,766 |
| Date of Issue | 2016-04-05 |
| Date of Implementation | 2016-09-01 |
| Regulation (derived from) | The Ministry of Industry and Notice No. 2016 in 2016; industry standard record announcement 2016 No. 7 (total 199) |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This standard specifies the method for on-line testing of silicon wafer resistivity for solar cells. The main contents include normative references, terms and definitions, method summary, interference factors, equipment, sample requirements, test environment, instrument calibration, test procedures, Precision and test reports, etc. |