SJ/T 11505-2015 PDF English
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Basic data
| Standard ID | SJ/T 11505-2015 (SJ/T11505-2015) |
| Description (Translated English) | Sapphire single crystal polished wafers specification |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | H83 |
| Classification of International Standard | 29.045 |
| Word Count Estimation | 12,178 |
| Date of Issue | 2015-04-30 |
| Date of Implementation | 2015-10-01 |
| Quoted Standard | GB/T 1555; GB/T 2828; GB/T 6618; GB/T 6619; GB/T 6621; GB/T 6624; GB/T 14140; GB/T 14264; SJ/T 11396; SJ/T 20387 |
| Regulation (derived from) | Ministry of Industry and Information Technology Announcement (2015 No. 28) |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This Standard specifies the substrate and the infrared detector polished sapphire window with the technical requirements, test methods, inspection rules, marking, packaging, transportation and storage and so on. This Standard applies to Kyropoulos and Czochralski grown single crystal sapphire polished, the other polished sapphire single crystal growth method can also refer |