| Standard ID | SJ/T 11394-2009 (SJ/T11394-2009) |
| Description (Translated English) | Measure methods of semiconductor light emitting diodes |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L45 |
| Classification of International Standard | 31.260 |
| Word Count Estimation | 32,357 |
| Date of Issue | 2009-11-17 |
| Date of Implementation | 2010-01-01 |
| Older Standard (superseded by this standard) | SJ/T 2355.1-1983; SJ/T 2355.2-1983; SJ/T 2355.3-1983; SJ/T 2355.4-1983; SJ/T 2355.5-1983; SJ/T 2355.6-1983; SJ/T 2355.7-1983 |
| Quoted Standard | GB/T 3977-2001; GB/T 4365-2003; GB/T 5698-2001; GB/T 5702-2003; GB/T 7921-1997; GB/T 7922-2003; GB/T 11499-2001; GB/T 15651-1995; CIE 127-1997; ANSI/ESD STM 5.1-2001; ANSI/ESD STM 5.2-1999 |
| Drafting Organization | China Optics and Optoelectronics Manufactures Association of optoelectronic devices branch |
| Administrative Organization | MIIT Electronics Standardization Institute |
| Regulation (derived from) | MIIT (2009) No. 62; industry standard filing Notice 2010 No. 1 (No. 121 overall) |
| Summary | This standard specifies the electrical characteristics of the semiconductor light-emitting diode test method, the optical characteristics of test methods, optical characteristics test method, the color characteristics of test methods, test methods and thermal characteristics of electrostatic discharge sensitivity testing methods. |