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SJ/T 10805-2018 English PDF

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SJ/T 10805-2018: Semiconductor integrated circuits Measuring methods for voltage comparators
Status: Valid

SJ/T 10805: Historical versions

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
SJ/T 10805-2018739 Add to Cart 7 days Semiconductor integrated circuits Measuring methods for voltage comparators Valid
SJ/T 10805-2000RFQ ASK 6 days Semiconductor interface integrated circuits General principles of measuring methods for voltage comparators Obsolete
SJ/T 10805-1996RFQ ASK 3 days Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators Obsolete

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Basic data

Standard ID: SJ/T 10805-2018 (SJ/T10805-2018)
Description (Translated English): Semiconductor integrated circuits Measuring methods for voltage comparators
Sector / Industry: Electronics Industry Standard (Recommended)
Classification of Chinese Standard: L55
Classification of International Standard: 31.200
Word Count Estimation: 32,375
Date of Issue: 2018-02-09
Date of Implementation: 2018-04-01
Older Standard (superseded by this standard): SJ/T 10805-2000
Quoted Standard: SJ/T 10734-1996
Regulation (derived from): Ministry of Industry and Information Technology Announcement No. 10 of 2018
Issuing agency(ies): Ministry of Industry and Information Technology
Summary: This standard specifies the electrical characteristics test method for semiconductor integrated circuit voltage comparators (hereinafter referred to as devices). This standard is applicable to the geometric measurement of through-silicon via size. The through-silicon via can penetrate through the silicon wafer or partially through the silicon wafer. The through-silicon via can contain metal conductors and other media, or it can contain metal conductors and others. medium.
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