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SJ/T 10805-2018 PDF English

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SJ/T 10805-2018: Semiconductor integrated circuits Measuring methods for voltage comparators
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SJ/T 10805: Historical versions

Std IDVersionUSDBuyDeliver [PDF] inTitle (Description)
SJ/T 10805-2018English739 Add to Cart 7 days [Need to translate] Semiconductor integrated circuits Measuring methods for voltage comparators
SJ/T 10805-2000EnglishRFQ ASK 6 days [Need to translate] Semiconductor interface integrated circuits General principles of measuring methods for voltage comparators
SJ/T 10805-1996EnglishRFQ ASK 3 days [Need to translate] Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators

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Basic data

Standard ID SJ/T 10805-2018 (SJ/T10805-2018)
Description (Translated English) Semiconductor integrated circuits Measuring methods for voltage comparators
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L55
Classification of International Standard 31.200
Word Count Estimation 32,340
Date of Issue 2018-02-09
Date of Implementation 2018-04-01
Older Standard (superseded by this standard) SJ/T 10805-2000
Quoted Standard SJ/T 10734-1996
Regulation (derived from) Ministry of Industry and Information Technology Announcement No. 10 of 2018
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the electrical characteristics test method for semiconductor integrated circuit voltage comparators (hereinafter referred to as devices). This standard is applicable to the geometric measurement of through-silicon via size. The through-silicon via can penetrate through the silicon wafer or partially through the silicon wafer. The through-silicon via can contain metal conductors and other media, or it can contain metal conductors and others. medium.

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