SJ/T 10415-1993 PDF English
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Basic data
| Standard ID | SJ/T 10415-1993 (SJ/T10415-1993) |
| Description (Translated English) | Rapid screening test methods for thermal sensitive parameter of transistor |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L40 |
| Word Count Estimation | 3,331 |
| Date of Issue | 12/17/1993 |
| Date of Implementation | 6/1/1994 |
| Regulation (derived from) | Industry-Science (2010) No. 77 |