SJ 3247-1989 PDF English
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Basic data
| Standard ID | SJ 3247-1989 (SJ3247-1989) |
| Description (Translated English) | Methods of measurement for extended-layer thickness of same-type Gallium arsenide by infra-red interference |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | H83;L90 |
| Word Count Estimation | 5,518 |
| Date of Issue | 3/20/1989 |
| Date of Implementation | 3/25/1989 |
| Regulation (derived from) | Industry-Science (2010) No. 77 |