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SJ/T 2658.12-2015 PDF English

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SJ/T 2658.12-2015: Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
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SJ/T 2658.12: Historical versions

Std IDVersionUSDBuyDeliver [PDF] inTitle (Description)
SJ/T 2658.12-2015English139 Add to Cart 3 days [Need to translate] Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
SJ 2658.12-1986English199 Add to Cart 3 days [Need to translate] Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width

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Basic data

Standard ID SJ/T 2658.12-2015 (SJ/T2658.12-2015)
Description (Translated English) Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L53
Classification of International Standard 31.08
Word Count Estimation 6,691
Date of Issue 2015-10-10
Date of Implementation 2016-04-01
Older Standard (superseded by this standard) SJ/T 2658.12-1986
Quoted Standard SJ/T 2658.1
Regulation (derived from) PRC MIIT Announcement 2015 No.63
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the measurement principle, measurement procedures and specified conditions for the peak emission wavelength and spectral emission bandwidth of a semiconductor infrared emission diode. This standard applies to semiconductor infrared emitting diodes.

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