SJ 2595-1985 PDF English
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| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ 2595-1985 | English | 239 | Add to Cart | 3 days [Need to translate] | Method for the analysis of trace phosphorous in pure SiC14--Method spectrophotometry |
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Basic data
| Standard ID | SJ 2595-1985 (SJ2595-1985) |
| Description (Translated English) | Method for the analysis of trace phosphorous in pure SiC14--Method spectrophotometry |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | H17 |
| Word Count Estimation | 6,664 |
| Date of Issue | 7/31/1985 |
| Date of Implementation | 1/1/1986 |
| Summary | This standard applies to the growth of semiconductor devices and circuits with silicon wafer, test methods parts of high-purity silicon tetrachloride polycrystalline silicon and phosphorus content to fiber optical communication devices. |