SJ 2354.14-1983 PDF English
Price & Delivery
US$199.00 · In stock · Download in 9 secondsSJ 2354.14-1983: Method of measurement for excess noise factor of PIN and avalanche photodiodes
Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See step-by-step procedure
Status: Obsolete
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ 2354.14-1983 | English | 199 | Add to Cart | 2 days [Need to translate] | Method of measurement for excess noise factor of PIN and avalanche photodiodes |
Click to Preview a similar PDF
Basic data
| Standard ID | SJ 2354.14-1983 (SJ2354.14-1983) |
| Description (Translated English) | Method of measurement for excess noise factor of PIN and avalanche photodiodes |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L53 |
| Classification of International Standard | 31.26 |
| Word Count Estimation | 1,116 |
| Date of Issue | 8/15/1983 |
| Date of Implementation | 7/1/1984 |
| Regulation (derived from) | Ministry of Industry and Information Technology Bulletin (No. 28 of 2015); Industry-Science (2010) No. 77 |
| Summary | This standard applies to the avalanche photodiode excess noise figure test. |