SJ 2327-1983 PDF English
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Basic data
| Standard ID | SJ 2327-1983 (SJ2327-1983) |
| Description (Translated English) | Generic specification for low temperature test chambers |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L99 |
| Word Count Estimation | 12,166 |
| Date of Issue | 4/11/1983 |
| Date of Implementation | 10/1/1983 |
| Summary | This standard specifies the electrical and electronic products for low-temperature test equipment used by the technical conditions, to meet the GB 2423. 1-81 "electrical and electronic products environmental testing procedures Test A: Cold test method" test equipment (hereinafter referred to as the device) requirements. |