SJ 21493-2018 PDF English
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Basic data
| Standard ID | SJ 21493-2018 (SJ21493-2018) |
| Description (Translated English) | Test method of surface defects for silicon carbide epitaxial wafers |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | H83 |
| Word Count Estimation | 11,196 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |