SJ 20843-2002 PDF English
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Basic data
| Standard ID | SJ 20843-2002 (SJ20843-2002) |
| Description (Translated English) | Quantitative determination of AB microscopic defect density in gallium arsenide single crystal |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | H83;L90 |
| Word Count Estimation | 7,739 |
| Date of Issue | 2002-10-30 |
| Date of Implementation | 2003-03-01 |
| Summary | This standard specifies the GaAs single crystal micro-defect density AB quantitative test methods. This standard applies to crystal orientation <100> GaAs single crystal AB micro defect density measurements. |