SJ 20842-2002 English PDF

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SJ 20842-2002: Test method for Ga/As ratio of surface of gallium arsenide
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
SJ 20842-2002	179	Add to Cart	2 days	Test method for Ga/As ratio of surface of gallium arsenide	Valid

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Basic data

Standard ID: SJ 20842-2002 (SJ20842-2002)
Description (Translated English): Test method for Ga/As ratio of surface of gallium arsenide
Sector / Industry: Electronics Industry Standard
Classification of Chinese Standard: H83;L90
Word Count Estimation: 5,536
Date of Issue: 2002-10-30
Date of Implementation: 2003-03-01
Summary: This standard specifies the ratio of gallium arsenide GaAs surface X-ray photoelectron spectroscopy test methods. This standard applies to GaAs devices for monitoring various surface treatment during the manufacturing process of the gallium arsenide GaAs wafer surface than the impact, but also suitable for wafer processing in a variety of surface treatment.

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