SJ 20831-2002 English PDF

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SJ 20831-2002: Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Status: Valid

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Basic data

Standard ID: SJ 20831-2002 (SJ20831-2002)
Description (Translated English): Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Sector / Industry: Electronics Industry Standard
Classification of Chinese Standard: L52
Word Count Estimation: 12,151
Date of Issue: 2002-10-30
Date of Implementation: 2003-03-01
Summary: This standard specifies the 4N infrared focal plane detector dewar assembly (hereinafter referred to as 4N components) parameter definitions, test methods and general test conditions. 4N 4N component consists of infrared focal plane array detectors and Dewar composition. 4N infrared focal plane detector is with four time delay integration (TDI) circuit infrared focal plane detector. The total number of pixels 4N months, a total of N- channel electricity. This standard applies to 4N component testing.

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