SJ 20789-2000 PDF English
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Basic data
| Standard ID | SJ 20789-2000 (SJ20789-2000) |
| Description (Translated English) | Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L44 |
| Word Count Estimation | 5,525 |
| Date of Issue | 2000-10-20 |
| Date of Implementation | 2000-10-20 |
| Summary | This standard specifies the MOS field-effect transistor thermal parameters to the rapid screening test methods. This standard applies to MOS field effect transistor (hereinafter referred to as resistors) thermal parameters of rapid screening. |