SJ 20719-1998 PDF English
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| SJ 20719-1998 | English | 239 | Add to Cart | 3 days [Need to translate] | Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry |
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Basic data
| Standard ID | SJ 20719-1998 (SJ20719-1998) |
| Description (Translated English) | Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | H82 |
| Word Count Estimation | 6,667 |
| Date of Issue | 3/18/1998 |
| Date of Implementation | 5/1/1998 |
| Quoted Standard | GJB 1866-94 |
| Summary | This standard specifies the determination HgCdTe wafers using x- ray fluorescence component of X values. This standard applies to the value of HgCdTe wafers X X value of the quantitative determination of the components within the range of 0. 100 ~ 0. 35Omol. |