JB/T 5580-1991 PDF English
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US$319.00 · In stock · Download in 9 secondsJB/T 5580-1991: Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments
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| JB/T 5580-1991 | English | 319 | Add to Cart | 3 days [Need to translate] | Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments |
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Basic data
| Standard ID | JB/T 5580-1991 (JB/T5580-1991) |
| Description (Translated English) | Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments |
| Sector / Industry | Mechanical & Machinery Industry Standard (Recommended) |
| Classification of Chinese Standard | L56 |
| Word Count Estimation | 8,820 |
| Date of Implementation | 7/1/1992 |
| Older Standard (superseded by this standard) | ZB N23001-1988 |
| Adopted Standard | IEC 748-2, NEQ |
| Regulation (derived from) | Industry-Science (2010) No. 77 |