GB/T 5095.2507-2021 English PDF

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GB/T 5095.2507-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 5095.2507-2021	564	Add to Cart	4 days	Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)	Valid

Similar standards

GB/T 17737.100   GB/T 21711.1   GB/T 5095.2503   GB/T 5095.2504   GB/T 5095.2502   

Basic data

Standard ID: GB/T 5095.2507-2021 (GB/T5095.2507-2021)
Description (Translated English): Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L23
Word Count Estimation: 30,395
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 5095.2507-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7.Test 25g. Impedance, reflection coefficient, and voltage standing wave ratio (VSWR) ICS 31.220.10 L23 National Standards of People's Republic of China Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-7.Test 25g. Impedance, reflection coefficient and voltage standing wave ratio (VSWR) Part 25-7.Test25g. [IEC 60512-25-7.2004,Connectorsforelectronicequipment- Testsandmeasurements-Part 25-7.Test25g.Impedance,reflection Released on 2021-03-09 Implemented on 2021-10-01 State Administration of Market Supervision and Administration Issued by the National Standardization Management Committee

Table of contents

Foreword Ⅰ 1 Scope and purpose 1 2 Terms and definitions 1 3 Test facility 2 3.1 Equipment 2 3.2 Device 3 4 Test sample 4 4.1 Description 4 5 Test procedure 4 5.1 Time domain 4 5.2 Frequency domain 5 6 Rules that should be stipulated by relevant standards 6 7 Test record file 6 Appendix A (Normative Appendix) Measuring System Rise Time 8 Appendix B (informative appendix) Determination of the proximal and distal ends of the sample 11 Appendix C (informative appendix) Calibration standard and test board standard circuit 12 Appendix D (informative appendix) TDR impedance curve description 15 Appendix E (informative appendix) Electrical terminal 17 Appendix F (Informative Appendix) Practical Guide---Variable Rise Time 19 Appendix G (informative appendix) Design basis for printed circuit boards for electronic measurement 20 Appendix H (informative appendix) Test signal transmitting component 24

Foreword

GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods. Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows. ---Part 25-1.Test 25a. Crosstalk ratio; ---Part 25-2.Test 25b. Attenuation (insertion loss); ---Part 25-3.Test 25c. Rise time decay; ---Part 25-4.Test 25d. Transmission delay; ---Part 25-5.Test 25e. Return loss; ---Part 25-6.Test 25f. Eye diagram and jitter; ---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR); --- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk. This part is part 25-7 of GB/T 5095. This section was drafted in accordance with the rules given in GB/T 1.1-2009. The translation method used in this part is equivalent to IEC 60512-25-7.2004 "Connector Test and Measurement for Electronic Equipment Part 25-7" Points. Test 25g. Impedance, reflection coefficient and voltage standing wave ratio (VSWR)". This section has made the following editorial changes. ---The name of the standard is from "Test and Measurement of Connectors for Electronic Equipment Part 25-7.Test 25g. Impedance, Reflection Coefficient and Voltage The Standing Wave Ratio (VSWR) was revised to the Basic Test Procedures and Measurement Methods of Electromechanical Components for Electronic Equipment Part 25-7.Test Test 25g. Impedance, reflection coefficient and voltage standing wave ratio (VSWR)". Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents. This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of the National Standardization Technical Committee of Electromechanical Components for Electronic Equipment (SAC/TC166). Drafting organizations of this section. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute. The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong. Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-7.Test 25g. Impedance, reflection coefficient and voltage standing wave ratio (VSWR)

1 Scope and purpose

This part of GB/T 5095 applies to interconnecting components, such as electrical connectors and cable assemblies within the scope of IEC TC48. This section describes the test methods for measuring impedance, reflection coefficient and voltage standing wave ratio (VSWR) in the time and frequency domains. Note. These test methods are written for professional testers who have professional knowledge in the electronics field and have been trained in the use of test equipment. Because the measured value is strongly affected by the device and equipment, this method fails to describe all possible compound effects. Application theory provided by major equipment manufacturers The book provides a more in-depth professional explanation on how to use the equipment most appropriately. It is essential that relevant standards should include Instructions and diagrams of how to arrange and perform the required measurements.

2 Terms and definitions

The following terms and definitions apply to this document. 2.1 Measurement system rise time measurement system rise time Rise time measured by a device with no sample installed and with filtering (or normalization) function. Usually, the measurement is 10%~ 90% level rise time. 2.2 Sampleenvironmentimpedance The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver and signal source. And the parasitic effects of the device. 2.3 Reflection coefficient The ratio of the reflected voltage to the incident voltage at any given point. The reflection coefficient is given by equation (1). Γ= Vreflected Vincident= ZL-Z0 ZL Z0= s11 (1) Where. Γ --- reflection coefficient; Vreflected---reflected voltage; Vincident---incident voltage; ZL --- device or sample impedance; Z0 --- sample environmental impedance. Note. The symbol of the reflection coefficient in the time domain is usually ρ, and the frequency domain is Γ. 2.4 Impedance At a certain frequency, the circuit presents all the obstacles to alternating current. It is a combination of measured resistance (R) and reactance (X) to ......

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