GB/T 5095.2503-2021 English PDF

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GB/T 5095.2503-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-3: Test 25c: Rise time degradation
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 5095.2503-2021	264	Add to Cart	3 days	Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-3: Test 25c: Rise time degradation	Valid

Similar standards

GB/T 17737.100   GB/T 21711.1   GB/T 5095.2504   GB/T 5095.2505   GB/T 5095.2502   

Basic data

Standard ID: GB/T 5095.2503-2021 (GB/T5095.2503-2021)
Description (Translated English): Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-3: Test 25c: Rise time degradation
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L23
Word Count Estimation: 14,146
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 5095.2503-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-3: Test 25c: Rise time degradation

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-3.Test 25c. Rise time degradation ICS 31.220.10 L23 National Standards of People's Republic of China Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-3.Test 25c. Rise time decay (IEC 60512-25-3.2001,Connectorsforelectronicequipment- Released on 2021-03-09 Implemented on 2021-10-01 State Administration of Market Supervision and Administration Issued by the National Standardization Management Committee

Table of contents

Foreword Ⅲ 1 General 1 1.1 Scope and purpose 1 1.2 Terms and definitions 1 2 Test facility 1 2.1 Equipment 1 2.2 Device 2 3 Test sample 2 3.1 Description 2 4 Test procedure 3 4.1 Insertion method 3 4.2 Standard Device Method 3 4.3 Rise time decay calculation 3 5 Rules to be stipulated by relevant standards 3 6 Test record file 3 Appendix A (Normative Appendix) Schematic Diagram of Installation and Equipment 5 Appendix B (informative appendix) Practical Guide 8

Foreword

GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods. Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows. ---Part 25-1.Test 25a. Crosstalk ratio; ---Part 25-2.Test 25b. Attenuation (insertion loss); ---Part 25-3.Test 25c. Rise time decay; ---Part 25-4.Test 25d. Transmission delay; ---Part 25-5.Test 25e. Return loss; ---Part 25-6.Test 25f. Eye diagram and jitter; ---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR); --- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk. This part is part 25-3 of GB/T 5095. This section was drafted in accordance with the rules given in GB/T 1.1-2009. The translation method used in this part is equivalent to the use of IEC 60512-25-3.2001 "Connector Test and Measurement for Electronic Equipment Part 25-3" Minutes. Test 25c. Rise time decay". This section has made the following editorial changes. ---The name of the standard is revised from "Test and Measurement of Connectors for Electronic Equipment Part 25-3.Test 25c. Rise Time Decay" to "Basic test procedures and measurement methods for electromechanical components for electronic equipment-Part 25-3.Test 25c. Rise time decay". Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents. This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of the National Standardization Technical Committee of Electromechanical Components for Electronic Equipment (SAC/TC166). Drafting organizations of this section. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute. The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong. Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-3.Test 25c. Rise time decay

1 General

1.1 Scope and purpose This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems. This section describes how to measure the influence of a sample on the rise time of a signal passing through it. 1.2 Terms and definitions The following terms and definitions apply to this document. 1.2.1 Rise time degradation When the sample is inserted into the transmission channel, it reaches the theoretically ideal (zero rise time) voltage step rise time increment (see Figure 1). use The calculation formula for the attenuation of the Gaussian signal from 10% to 90% of the rise time is shown in equation (1). Tr,d= (Tr)2-(Tr,m)2 (1) Where. Tr,d ---rise time decay; Tr --- the rise time of the measurement; Tr,m---measurement system rise time. 1.2.2 Measurement system rise time measurement system rise time Rise time measured by a device with no sample installed and with filtering (or normalization) function. Usually, the measurement is from 10% to 90% The rise time of the level (see Figure 1). 1.2.3 Sampleenvironmentimpedance The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver and signal source. And the parasitic effects of the device. 1.2.4 Rise time The time required for a voltage step to occur is usually measured from the initial value and the final value of the 10% to 90% level rise time.

2 Test facility

2.1 Equipment Pulse generator and oscilloscope, time domain reflectometer (TDR) or with a measurement system whose rise time is less than or equal to the measured rise time 70% of other suitable equipment. ......

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