GB/T 5095.2504-2021 English PDF

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GB/T 5095.2504-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 5095.2504-2021	264	Add to Cart	3 days	Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay	Valid

Similar standards

GB/T 17737.100   GB/T 21711.1   GB/T 5095.2503   GB/T 5095.2505   GB/T 5095.2502   

Basic data

Standard ID: GB/T 5095.2504-2021 (GB/T5095.2504-2021)
Description (Translated English): Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L23
Word Count Estimation: 14,129
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 5095.2504-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4.Test 25d. Propagation delay ICS 31.220.10 L23 National Standards of People's Republic of China Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-4.Test 25d. Transmission Delay (IEC 60512-25-4.2001,Connectorsforelectronicequipment-Testsand Released on 2021-03-09 Implemented on 2021-10-01 State Administration of Market Supervision and Administration Issued by the National Standardization Management Committee

Table of contents

Foreword Ⅲ 1 General 1 1.1 Scope and purpose 1 1.2 Terms and definitions 1 2 Test facility 1 2.1 Equipment 1 2.2 Device 1 3 Test sample 2 3.1 Description 2 4 Test procedure 3 4.1 Probe Method 3 4.2 Insertion method 3 4.3 Standard Device Method 3 5 Rules to be stipulated by relevant standards 3 6 Test record file 4 Appendix A (Normative Appendix) Diagram of Plants and Equipment 6 Appendix B (Informative Appendix) Practical Guide 9

Foreword

GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods. Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows. ---Part 25-1.Test 25a. Crosstalk ratio; ---Part 25-2.Test 25b. Attenuation (insertion loss); ---Part 25-3.Test 25c. Rise time decay; ---Part 25-4.Test 25d. Transmission delay; ---Part 25-5.Test 25e. Return loss; ---Part 25-6.Test 25f. Eye diagram and jitter; ---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR); --- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk. This part is part 25-4 of GB/T 5095. This section was drafted in accordance with the rules given in GB/T 1.1-2009. The translation method used in this part is equivalent to the IEC 60512-25-4.2001 "Connector Test and Measurement for Electronic Equipment Part 25-4" Minutes. Test 25d. Transmission delay. This section has made the following editorial changes. ---The name of the standard is changed from "Test and Measurement of Connectors for Electronic Equipment Part 25-4.Test 25d. Transmission Delay" to "Electrical Basic test procedures and measurement methods for electromechanical components for sub-equipment. Part 25-4.Test 25d. Transmission delay. Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents. This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of the National Standardization Technical Committee of Electromechanical Components for Electronic Equipment (SAC/TC166). Drafting organizations of this section. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute. The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong. Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-4.Test 25d. Transmission Delay

1 General

1.1 Scope and purpose This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems. This section describes the method of measuring the time required for a digital signal to be transmitted from a specified location to a second specified location. 1.2 Terms and definitions The following terms and definitions apply to this document. 1.2.1 Measurement system rise time measurement system rise time Rise time measured by a device with no sample installed and with filtering (or normalization) function. Usually, the measurement is 10%~ 90% level rise time (see Figure 1). 1.2.2 Sampleenvironmentimpedance The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver or signal source And the parasitic effects of the device. 1.2.3 Transmission delay The time required for the signal to travel between two specified locations in the interconnected system (see Figure 2).

2 Test facility

2.1 Equipment 2.1.1 Pulse generator and oscilloscope, time domain reflectometer (TDR) or a measuring system whose rise time is less than or equal to the measured transmission delay Other suitable equipment. 2.1.2 Probe If a probe is used, the probe should have suitable rise time performance and circuit load characteristics (resistance and capacitance). 2.2 Device Unless otherwise specified in the reference document, the environmental impedance of the sample should match the impedance of the test equipment. Generally, for single-ended measurements, the resistance The impedance is 50Ω, and the differential measurement is 100Ω. The schematic diagram of the device and equipment is shown in Appendix A. 2.2.1 Method A, single-ended The device should be able to excite one signal line at a time. The excitation circuit should be terminated with the sample environmental impedance according to one of the methods in Figure A.2.except ......

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