GB/T 5095.2505-2021 English PDF

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GB/T 5095.2505-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 5095.2505-2021	259	Add to Cart	3 days	Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss	Valid

Similar standards

GB/T 17737.100   GB/T 21711.1   GB/T 5095.2503   GB/T 5095.2504   GB/T 5095.2502   

Basic data

Standard ID: GB/T 5095.2505-2021 (GB/T5095.2505-2021)
Description (Translated English): Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L23
Word Count Estimation: 14,144
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 5095.2505-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5.Test 25e. Return loss ICS 31.220.10 L23 National Standards of People's Republic of China Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-5.Test 25e. Return Loss (IEC 60512-25-5.2004, Connectorsforelectronicequipment- Released on 2021-03-09 Implemented on 2021-10-01 State Administration of Market Supervision and Administration Issued by the National Standardization Management Committee

Table of contents

Foreword Ⅲ 1 Scope 1 2 Terms and definitions 1 3 Test facility 1 3.1 Equipment 1 3.2 Device 1 4 Test sample 2 4.1 Description 2 5 Test procedure 2 5.1 General 2 5.2 Device return loss 3 5.3 Sample return loss measurement 3 5.4 Time domain method 3 6 Rules to be stipulated by relevant standards 3 7 Test record file 4 Appendix A (Normative Appendix) Schematic Diagram of Installation and Equipment 5 Appendix B (Informative Appendix) Practical Guide 9

Foreword

GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods. Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows. ---Part 25-1.Test 25a. Crosstalk ratio; ---Part 25-2.Test 25b. Attenuation (insertion loss); ---Part 25-3.Test 25c. Rise time decay; ---Part 25-4.Test 25d. Transmission delay; ---Part 25-5.Test 25e. Return loss; ---Part 25-6.Test 25f. Eye diagram and jitter; ---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR); --- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk. This part is part 25-5 of GB/T 5095. This section was drafted in accordance with the rules given in GB/T 1.1-2009. The translation method used in this part is equivalent to IEC 60512-25-5.2004 "Connector Test and Measurement for Electronic Equipment Part 25-5" Minutes. Test 25e. Return Loss." This section has made the following editorial changes. ---The name of the standard is changed from "Test and Measurement of Connectors for Electronic Equipment Part 25-5.Test 25e. Return Loss" to "Electrical Basic test procedures and measurement methods for electromechanical components for sub-equipment-Part 25-5.Test 25e. Return loss; ---The original text "standard device (with sample), sample device (without sample)" in Figure A.1b) is an obvious clerical error, modified to "standard device (without sample)" Sample), sample device (with sample)". Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents. This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of the National Standardization Technical Committee of Electromechanical Components for Electronic Equipment (SAC/TC166). Drafting organizations of this section. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute. The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong. Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-5.Test 25e. Return Loss

1 Scope

This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems. This section describes the frequency domain method and the time domain method used to measure return loss as a function of frequency.

2 Terms and definitions

The following terms and definitions apply to this document. 2.1 Return loss The ratio of the reflected signal measured by the sample to the input signal. Note. It can be expressed in decibels (dB). 2.2 Sampleenvironmentimpedance The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver or signal source, And the parasitic effects of the device.

3 Test facility

3.1 Equipment 3.1.1 Frequency domain Use a network analyzer with a dynamic range suitable for the device under test (DUT). For differential measurement, a multi-port test position can be used Set or balance-unbalanced converter network analyzer. 3.1.2 Time domain Preferential use of time domain reflectometer (TDR), trigger pulse generator and appropriate fast Fourier transform (FFT) software. 3.2 Device 3.2.1 Overview The environmental impedance of the sample should match the impedance of the test equipment. Unless otherwise specified in the detailed specification, in general, for single-ended measurements, the impedance It is 50Ω, and the differential measurement is 100Ω. The schematic diagram of the device and equipment is shown in Appendix A. 3.2.2 Sample lead configuration During each measurement, the excitation circuit should be installed in accordance with the provisions of the detailed specification. Within the specified environmental impedance of the sample, the ......

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