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GB/T 31358-2015 English PDF

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GB/T 31358-2015: General specification for semiconductor lasers
Status: Valid
Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
GB/T 31358-2015359 Add to Cart 3 days General specification for semiconductor lasers Valid

Similar standards

GB/T 7247.1   GB/T 39118   GB/T 18490.1   GB/T 18462   GB/T 31359   

Basic data

Standard ID: GB/T 31358-2015 (GB/T31358-2015)
Description (Translated English): General specification for semiconductor lasers
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L51
Classification of International Standard: 31.260
Word Count Estimation: 17,199
Date of Issue: 2015-02-04
Date of Implementation: 2015-08-01
Quoted Standard: GB/T 191; GB/T 2423.1; GB/T 2423.2; GB/T 2423.3; GB/T 2423.5; GB/T 2423.10; GB/T 2828.1; GB/T 2829; GB 2894; GB/T 6388; GB 7247.1; GB/T 7247.13; GB/T 10320; GB/T 12339; GB/T 15313; GB/T 31359
Regulation (derived from): National Standards Bulletin 2015 No. 3
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This Standard specifies the general requirements for semiconductor lasers, including the terms and definitions, classifications, technical requirements, testing requirements, inspection rules, marking, packaging, transportation and storage. This Standard applies to the development of semiconductor lasers, production and delivery. The semiconductor laser module can refer executed.

GB/T 31358-2015: General specification for semiconductor lasers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
General specification for semiconductor lasers ICS 31.260 L51 National Standards of People's Republic of China General specification for semiconductor lasers Issued on. 2015-02-04 2015-08-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Table of Contents

Introduction Ⅲ 1 Scope 1 2 Normative references 1 3 Terms and definitions 4 Category 3 4.1 by wavelength Category 3 4.2 Classification according to the semiconductor chip substrate material 3 4.3 by incentives Category 4 4.4 Category 4 in accordance with the output light mode 4.5 By Application 4 4.6 by laser chip light direction Category 4 4.7 Classification by package 4 4.8 according to work category 4 4.9 Classification by cooling 4 4.10 by the light emitting unit arrangement Category 4 4.11 by Power Class 4 4.12 by energy category 4 5 Technical requirements 4 5.1 Appearance quality requirements 4 5.2 performance, structure and conditions of use requirements 5 5.3 Environmental Adaptability Requirement 6 5.4 life requirements 7 7 5.5 Safety Requirements 6 8 test requirements 6.1 General requirements 8 6.2 Visual inspection 8 6.3 performance and structural parameters of the test 8 6.4 Environmental Adaptability Test 8 6.5 Life Test 9 9 6.6 Safety Testing 7 Inspection rules 9 7.1 General 9 7.2 Inspection classification 9 7.3 batch composition 9 7.4 sampling plan and eligibility determination 9 7.5 Inspection Packet 10 11 7.6 Type inspection 7.7 batch test 11 7.8 Periodic Inspection 11 8 signs, packaging, transportation and storage 12 8.1 Marking 12 8.2 Packaging 12 8.3 Transportation and storage 12

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. The standard proposed by China Machinery Industry Federation. This standard by the National Optical radiation safety and laser equipment Standardization Technical Committee (SAC/TC284) centralized. This standard was drafted. Xi'an Focuslight Ltd., Xi'an Institute of Optics and Fine Mechanics, Chinese Academy of semiconductor Body Institute, Beijing Branch of the Laser Technology Co., Ltd., Wuhan laborers Technology Co., Ltd. is the source of photons, China Electronics Technology Group Corporation 13th Research Institute. The main drafters of this standard. Liu Xingsheng, Zhao Wei, Xu Guodong, Zhang Yanchun, red Yang Jun, Ma Xiaoyu, Wang guards, Wang Chen-fu, Xieyan Hu, Wu Di, Xiaoning, Shi Jun-Hong, Tang Qi, Wang Chan, Zhang Guoxin, Li Zhong, Shi Zhaohui, En, Xu Haiming, Chen Hairong, Wang Xiaoyan. General specification for semiconductor lasers

1 Scope

This standard specifies the general requirements for semiconductor lasers, including the terms and definitions, classifications, technical requirements, testing requirements, inspection rules, marking Chi, packaging, transport and storage. This standard applies to the development of semiconductor lasers, production and delivery. The semiconductor laser component can refer executed.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 191 Packaging - Pictorial signs GB/T 2423.1 Environmental testing for electric and electronic products Part 2. Test methods Test A. Cold GB/T 2423.2 Environmental testing for electric and electronic products Part 2. Test methods Test B. Dry heat GB/T 2423.3 Environmental testing for electric and electronic products Part 2. Test methods - Test Cab. Damp heat test GB/T 2423.5 Environmental testing for electric and electronic products Part 2. Test methods Test Ea and guidance. Shock GB/T 2423.10 Environmental testing for electric and electronic products Part 2. Test methods Test Fc. Vibration (sinusoidal) GB/T 2828.1 Sampling procedures for inspection - Part 1. batch inspection sampling plan by acceptance quality (AQL) retrieval GB/T 2829 periodic inspection Sampling procedures and tables (suitable for process stability test) GB 2894 Safety Signs and use guidelines GB/T 6388 transport package shipping mark GB 7247.1 Safety of laser products - Part 1. Equipment classification, requirements Safety - Part 13 GB/T 7247.13 laser products. Measurements for classification of laser products Electrical safety GB/T 10320 laser equipment and facilities GB/T 12339 with protective packaging materials GB/T 15313 Laser term GB/T 31359 Test Method semiconductor laser

3 Terms and Definitions

GB/T 15313 and defined by the following terms and definitions apply to this document. 3.1 Semiconductor lasers semiconductorlaser Semiconductor laser materials laser medium. 3.2 Vertical cavity surface emitting semiconductor laser verticalcavitysurfaceemittinglaser Light perpendicular to the pn junction plane of the semiconductor laser. NOTE. rewrite GB/T 15313-2008, definitions 2.4.21.
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