GB/T 22319.7-2015 English PDF

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GB/T 22319.7-2015: Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 22319.7-2015	134	Add to Cart	3 days	Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units	Valid

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Basic data

Standard ID: GB/T 22319.7-2015 (GB/T22319.7-2015)
Description (Translated English): Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L21
Classification of International Standard: 31.140
Word Count Estimation: 7,788
Date of Issue: 2015-06-02
Date of Implementation: 2016-02-01
Adopted Standard: IEC 60444-7-2004, IDT
Regulation (derived from): National Standard Announcement 2015 No.19
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This Standard specifies the measuring method in the temperature range of quartz crystal element active hopping.

GB/T 22319.7-2015: Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measurement of quartz crystal unit parameters Part 7. Measurement of activity dips of quartz crystal units ICS 31.140 L21 National Standards of People's Republic of China Measurement of quartz crystal unit parameters Part 7. quartz crystal element Activity was measured hopping Part 7. Measurementofactivitydipsofquartzcrystalunits (IEC 60444-7.2004, Measurementofquartzcrystalunitparameters- Part 7. Measurementofactivityandfrequencydipsofquartzcrystalunits, IDT) Issued on. 2015-06-02 2016-02-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

GB/T 22319 "Measurement of quartz crystal unit parameters" is divided into the following sections. --- Part 1. Basic method for quartz crystal element resonance frequency and resonance resistance was measured with type π - Network Zero Phase; --- Part 2. Measurement of quartz crystal element capacitance dynamic phase offset method; --- Part 4. Methods of measurement frequencies up to 30MHz quartz crystal element load resonance frequency and resonance resistance RL and the load He derived the calculated parameters; --- Part 5. automatic network analyzer techniques and error correction method to determine the equivalent electrical parameters; --- Part 6. excitation level measurement correlation (DLD) of; --- Part 7. quartz crystal element active hopping measurement; --- Part 8. SMD quartz crystal units measuring jig; --- Part 9. Measurement of quartz crystal components parasitic resonances. This is Part 7 GB/T 22319 of. This section drafted in accordance with GB/T 1.1-2009 given rules. This section uses the translation method is equivalent to using IEC 60444-7.2004 "Measurement of quartz crystal unit parameters - Part 7. quartz crystal yuan Active member hopping and frequency hopping measure. " This part made the following editorial changes. --- Table 1 footnote "*" to a footnote "a"; --- The evaluation formula 3.3 No. (A) ~ (D) were changed to a) ~ d); --- Delete evaluation formula a) in front of "frequency hopping" and the formula c) in front of "active transition." Please note that some of the content of this document may involve patents. Release mechanism of the present document does not assume responsibility for the identification of these patents. This part is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part of the frequency control and selection by the National Focal piezoelectric Standardization Technical Committee (SAC/TC182) devices. This section drafted by. China Electronic Components Industry Association Branch of the piezoelectric crystal, Nanjing Panda Crystal Technology Co., Ltd., Tangshan Jing Source Yufeng Electronics Co., Ltd., Zhengzhou original Electronic Technology Co., Ltd. The main drafters of this section. Zhang Yi, Liang Sheng Yuan, Hu Zhixiong, Zou fly. Measurement of quartz crystal unit parameters Part 7. quartz crystal element Activity was measured hopping

1 Scope

This section GB/T 22319 specifies the methods of measurement in the temperature range of quartz crystal element active hopping.

2 Terms and definitions

The following terms and definitions apply to this document. 2.1 Active transition activitydip Quartz crystal element at a predetermined load capacitance and the excitation level, the temperature within a narrow range by the coupling between different vibrational modes caused load Resonant frequency and (or) an undesired change in the resistance of the resonance (see Figure 1 and Figure 2). 2.2 Frequency hopping frequencydip (bandbreak) Undesirable disturbances or waves occurring quartz crystal element in a narrow temperature range, ie load resonant frequency deviates from the smoothing rules Frequency-temperature characteristic curve, with as many as a fifth-order polynomial description. Typically exhibit a change in resistance associated (see Fig. 2), and this effect is often Excitation level relationship.

1 frequency deviation magnitude diagram

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Image     

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