GB/T 22319.6-2023 English PDFUS$334.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 22319.6-2023: Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) Status: Valid
Basic dataStandard ID: GB/T 22319.6-2023 (GB/T22319.6-2023)Description (Translated English): Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: L21 Classification of International Standard: 31.140 Word Count Estimation: 18,190 Date of Issue: 2023-09-07 Date of Implementation: 2024-01-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 22319.6-2023: Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS 31.140 CCSL21 National Standards of People's Republic of China Measurement of Quartz Crystal Element Parameters Part 6.Measurement of stimulus level dependence (DLD) (IEC 60444-6.2021,IDT) Published on 2023-09-07 2024-01-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee Table of contentsPreface III Introduction IV 1 Scope 1 2 Normative reference documents 1 3 Terms and Definitions 1 4 DLD Effect 1 4.1 Reversible changes in frequency and resistance1 4.2 Irreversible changes in frequency and resistance1 4.3 Causes of DLD effect 2 5 Excitation level 2 for DLD measurements 6 Test method 3 6.1 Method A (Quick Standard Measurement Method) 3 6.2 Method B (multi-level reference measurement method) 4 Appendix A (normative) Relationship between excitation level and mechanical displacement of quartz crystal components 6 Appendix B (Normative) Method C. Measuring DLD using the oscillator method 8 Reference 12 Figure 1 Maximum allowable resistance ratio 3 of resistor R12 or R13 as a function of excitation level dependence Figure B.1 Access of crystal components in oscillator 8 Figure B.2 Relationship between crystal element loss resistance and dissipated power 8 Figure B.3 Characteristics of quartz crystal element Rr 9 Figure B.4 Circuit system block diagram 10 Figure B.5 -Rosc 10 established over sweep excitation level range Figure B.6 Excitation level characteristics of quartz crystal components when -Rosc=70Ω is used as the test limit in the test of this appendix10 Figure B.7 Method C measurement circuit schematic 11ForewordThis document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents" Drafting. This document is Part 6 of GB/T 22319 "Measurement of Parameters of Quartz Crystal Components". GB/T 22319 has published the following parts. ---Part 6.Measurement of excitation level dependence (DLD); ---Part 7.Measurement of activity jumps of quartz crystal components; ---Part 8.Measuring fixtures for surface mount quartz crystal components; ---Part 9.Measurement of parasitic resonance of quartz crystal components; ---Part 11.Criteria for determining load resonant frequency and effective load capacitance using automated network analysis techniques and error correction method. This document is equivalent to IEC 60444-6.2021 "Measurement of Quartz Crystal Component Parameters Part 6.Excitation Level Dependence (DLD) Measurement". Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Technical Committee on Standardization of Piezoelectric Devices for Frequency Control and Selection (SAC/TC182). This document was drafted by. Zhengzhou Original Electronic Technology Co., Ltd., Beijing Chenjing Electronics Co., Ltd., Wuhan Haichuang Electronics Co., Ltd. company. The main drafters of this document. Wang Guojun, Gong Guiying, and Mao Jing.IntroductionThe excitation level is characterized by the power or voltage across the crystal element, or the current flowing through the crystal element. It drives the harmonic through the piezoelectric effect. The oscillator produces mechanical oscillations. In this process, acceleration work is converted into kinetic energy and elastic energy, and power consumption is converted into heat. The latter conversion is due to Caused by internal and external friction of the quartz resonator. Friction loss is related to the speed of the vibrating particle. When the oscillation is no longer linear, or when the internal friction of the quartz resonator or its surface and connection points When speed, stretch or strain, displacement or acceleration reaches critical levels, friction losses will increase (see Appendix A). thus causing changes in resistance and frequency ation, and because these parameters are temperature-dependent, causing further changes in resistance and frequency. These changes can be observed on all crystal elements at high excitation levels (such as 1mW or above for AT-cut crystals). And they also cause irreversible changes in frequency and resistance. Continuing to increase the excitation level may damage the resonator. In addition to the above effects, some crystal components can also be observed at low excitation levels (such as AT-cut crystals below 1μW or 50μA). to changes in frequency and resistance. In this case, if the loop gain is insufficient, it will be difficult to start the oscillation. In crystal filters, transmission loss and jitter There will be changes. In addition, the coupling between the specified vibration mode and other modes (such as the resonator itself, the mounting and the filling gas) is also related to the excitation level. related. Because these modes have different temperature responses, coupling causes frequency and resistance changes in a given mode over a narrow temperature range. this change Increases with increasing excitation level. However, this effect is not considered further in this paper. GB/T 22319 "Measurement of Parameters of Quartz Crystal Components" aims to establish standard measurement methods for quartz crystal component parameters. It is planned to be composed of the following departments. Composition. ---Part 1.Basic method for measuring the resonant frequency and resonant resistance of quartz crystal components using the π-type network zero-phase method. The purpose is It specifies the basic methods and applicable measurement networks for measuring the resonant frequency and resonant resistance of quartz crystal components. ---Part 2.Phase offset method for measuring dynamic capacitance of quartz crystal components. The purpose is to specify the measurement of quartz crystal element dynamic capacitive method. ---Part 4.Measurement methods and methods of load resonant frequency and load resonant resistance RL of quartz crystal components with frequencies up to 30MHz He derived calculations of parameters. The purpose is to specify the use of physical load capacitance to measure parameters such as the load resonant frequency of quartz crystal components. counting method. ---Part 5.Method for determining equivalent electrical parameters using automatic network analysis technology and error correction. The purpose is to provide for the use of network A measurement method that uses network analysis technology and uses linear equivalent circuits to determine the parameters of quartz crystal components. ---Part 6.Measurement of excitation level dependence (DLD). The purpose is to specify the use of π-type network or oscillator method to measure quartz crystals Body component DLD method. ---Part 7.Measurement of activity jumps of quartz crystal components. The purpose is to specify the activity jump of quartz crystal elements within the temperature range. Changing measurement methods. ---Part 8.Measuring fixtures for surface mount quartz crystal components. Purpose is to specify accurate measurement of leadless surface mount quartz Measurement fixtures for resonant frequency, resistance and equivalent circuit parameters of crystal components. ---Part 9.Measurement of parasitic resonance of quartz crystal components. The purpose is to provide for the use of automatic network analysis techniques and resistance method measurement A method of measuring parasitic (unwanted) resonances in quartz crystal components. ---Part 11.Standard method for determining load resonant frequency and effective load capacitance using automated network analysis techniques and error correction Law. The purpose is to specify the effective load when measuring the load resonant frequency and nominal frequency of quartz crystal components without loading a physical load capacitance. method of loading capacitance. Measurement of Quartz Crystal Element Parameters Part 6.Measurement of stimulus level dependence (DLD)1 ScopeThis document is applicable to the measurement of excitation level dependence (DLD) of quartz crystal components. This document specifies two test methods (A and C) and A baseline measurement method (Method B). Method A is based on the π-type network of IEC 60444-5 and is applicable to the entire Frequency Range. Reference measurement method B is based on the π-type network or reflection method of IEC 60444-5 or IEC 60444-8 and is applicable to this article the entire frequency range covered by the software. Method C is the oscillator method, which is suitable for the measurement of large quantities of fundamental frequency quartz crystal components under fixed conditions. Note. The measurement methods specified in this document are not only applicable to AT cut types, but also to other crystal cut types and vibration modes, such as double-angle cut types and vibration modes. (IT, SC) and tuning fork crystal components (by using high impedance test fixtures).2 Normative reference documentsThe contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document. IEC 60444-5 Measurement of parameters of quartz crystal components Part 5.Determination of equivalence using automated network analysis techniques and error correction IEC 60444-8 Measurement of parameters of quartz crystal components Part 8.Measuring fixtures for surface mount quartz crystal components (Meas- crystal units) Note. GB/T 22319.8-2008 Measurement of parameters of quartz crystal components Part 8.Measuring fixtures for surface mount quartz crystal components (IEC 60444- 8.2003,IDT)3 Terms and definitionsThere are no terms or definitions to be defined in this document. A database of terminology used in standardization work maintained by ISO and IEC can be found at the following URL.4 DLD effect4.1 Reversible changes in frequency and resistance Reversible changes are continuous or accurate changes from the lowest level to the highest level and vice versa after repeated measurements at low and high levels. Changes in frequency and resistance that occur at the same excitation level after consecutive measurements, as long as these changes remain within the range of measurement accuracy. 4.2 Irreversible changes in frequency and resistance Irreversible changes are significant changes in frequency and/or resistance at low levels after measurement in the middle of high levels. For example, low level ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 22319.6-2023_English be delivered?Answer: Upon your order, we will start to translate GB/T 22319.6-2023_English as soon as possible, and keep you informed of the progress. 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