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GB/T 4937.1-2006 English PDF

GB/T 4937.1: Historical versions

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
GB/T 4937.1-2006134 Add to Cart 3 days Semiconductor devices -- Mechanical and climatic test methods -- Part 1: General Valid
GB/T 4937-1995RFQ ASK 9 days Mechanical and climatic test methods for semiconductor devices Obsolete
GB 4937-1985879 Add to Cart 6 days Mechanical and climatic test methods for discrete semiconductor devices Obsolete

Similar standards

GB/T 18910.2   SJ/T 11141   SJ/T 11281   GB/T 4937.3   GB/T 4937.4   GB/T 4937.11   

Basic data

Standard ID: GB/T 4937.1-2006 (GB/T4937.1-2006)
Description (Translated English): Semiconductor devices -- Mechanical and climatic test methods -- Part 1: General
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L40
Classification of International Standard: 31.080.1
Word Count Estimation: 7,797
Date of Issue: 2006-08-23
Date of Implementation: 2007-02-01
Older Standard (superseded by this standard): GB/T 4937-1995 Partial
Quoted Standard: IEC 60050; IEC 60747; IEC 60748
Adopted Standard: IEC 60749-1-2002, IDT
Regulation (derived from): China Announcement of Newly Approved National Standards No. 9, 2006 (No. 96 overall)
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard applies to semiconductor devices (discrete devices and integrated circuits) and to GB/T 4937 series the rest of the establishment of common guidelines. When the part is too small walk back and forth with the corresponding specification when viewed with spears. In detail specification shall prevail.
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Price & Delivery

US$134.00 ยท In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 4937.1-2006: Semiconductor devices -- Mechanical and climatic test methods -- Part 1: General
Status: Valid

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