GB/T 24198-2009 PDF English
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Ferronickel - Determination of nickel silicon phosphorus manganese cobalt chromium and copper contents - Wavelength dispersive X-ray fluorescence spectrometry (Routine method)
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GB/T 24198-2009: Ferronickel - Determination of nickel silicon phosphorus manganese cobalt chromium and copper contents - Wavelength dispersive X-ray fluorescence spectrometry (Routine method)
---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT24198-2009
GB
NATIONAL STANDARD OF
THE PEOPLE’S REPUBLIC OF CHINA
ICS 77.100
H 11
Ferronickel - Determination of nickel silicon phosphorus
manganese cobalt chromium and copper contents -
Wavelength dispersive X-ray fluorescence spectrometry
(Routine method)
Issued on. JULY 8, 2009
Implemented on. APRIL 1, 2010
Issued by. General Administration of Quality Supervision, Inspection
and Quarantine;
Standardization Administration Committee.
Table of Contents
Foreword... 3
1 Scope... 4
2 Normative references... 4
3 Principle... 5
4 Reagents and materials... 5
5 Instrument and equipment... 6
6 Sampling and sample preparation... 7
7 Instrument preparation... 7
8 Analysis steps... 7
9 Calculation of results... 11
10 Precision... 11
11 Test report... 12
Annex A (Normative) Instrument precision test... 14
Annex B (Normative) Sample analysis value acceptance flow chart... 15
Foreword
Annex A and Annex B of this Standard are normative.
This Standard was proposed by China Iron and Steel Industry Association.
This Standard shall be under the jurisdiction of National Technical Committee
on Pig Iron and Ferroalloy of Standardization Administration of China.
Main drafting organization of this Standard. Jiuquan Iron and Steel (Group)
Co., Ltd.
Main drafters of this Standard. Zhu Weihua, Sun Yuguang, Wang Hao, Fu
Baorong.
Ferronickel - Determination of nickel silicon phosphorus
manganese cobalt chromium and copper contents -
Wavelength dispersive X-ray fluorescence spectrometry
(Routine method)
WARNING -- Personnel using this Standard should have formal
laboratory work experience. This Standard does not indicate all
possible security issues. It is the responsibility of the user to take
appropriate safety and health measures and to ensure compliance with
the conditions set forth in the relevant national regulations.
1 Scope
This Standard specifies the determination of nickel silicon phosphorus
manganese cobalt chromium and copper contents by wavelength dispersive
X-ray fluorescence spectrometry.
It is applicable to the determination of electric furnace, induction furnace,
converter and other as-cast conditions or nickel rolling. The range of each
element is shown in Table 1.
2 Normative references
The provisions in following documents become the provisions of this
Standard through reference in this Standard. For dated references, the
subsequent amendments (excluding corrigendum) or revisions do not apply
to this Standard, however, parties who reach an agreement based on this
Standard are encouraged to study if the latest versions of these documents
are applicable. For undated references, the latest edition of the referenced
document applies.
GB/T 4010, Ferroallys sampling and preparation of samples for chemical
analysis
GB/T 6379.1, Accuracy (trueness and precision) of measurement methods
and results - Part 1.General principles and definitions (GB/T 6379.1-2004,
ISO 5725-1.1994, IDT)
GB/T 6379.2, Accuracy (trueness and precision) of measurement methods
and results - Part 2.Basic method for the determination of repeatability and
reproducibility of a standard measurement method (GB/T 6379.2-2004,
ISO 5725-2.1994, IDT)
3 Principle
When the primary X-ray emitted from the X-ray tube is irradiated onto the
surface of the flat, smooth sample, the resulting characteristic X-ray shall be
crystallized by the crystal, and the detector shall measure the X-ray
fluorescence intensity at the corresponding 2θ angle of the selected
characteristic wavelength. The mass fraction of nickel, silicon, phosphorus,
4 Reagents and materials
4.1 P10 gas (90% argon and 10% methane mixed gas) for flow proportional
counter.
4.2 Certified reference material or reference material
Certified reference material (CRM) or reference material (RM).
5 Instrument and equipment
5.1 Sample preparation equipment
Sample cutting equipment and sample surface polishing equipment.
5.2 X-ray fluorescence spectrometer
The analytical accuracy and stability of the simultaneous or sequential
wavelength dispersive spectrometer shall meet the requirements of Annex A.
5.2.4 Detector
Scintillation counter for heavy element analysis; flow proportional counter for
light element analysis.
It can also use a sealed proportional counter.
5.2.5 Vacuum system
During the measurement process, the vacuum system pressure is generally
below 30 Pa and remains constant; for light elements, it shall be less than 20
Pa.
6 Sampling and sample preparation
Refer to the provisions of GB/T 20066 and GB/T 4010.
The size of the sample shall depend on the geometry of the sample box. The
analytical surface shall be able to cover all the sample box mask, while
ensuring the sample thickness of at least 5 mm.
7 Instrument preparation
7.1 Instrument working environment
The instrument working environment shall comply with GB/T 16597.
8 Analysis steps
8.1 Measurement conditions
Select the appropriate measurement conditions, according to the type of
equipment used, the type of sample, elements for analysis, coexisting
elements and their content range.
8.2 Plotting and confirmation of calibration curve
8.2.1 Calibration curve plotting
Under the selected working conditions, use X-ray fluorescence spectrometer
to measure a series of certified reference material (CRM) or reference
material (RM) of similar sample smelting process and similar chemical
composition. Each sample shall be measured at least 2 times.
8.2.2 Confirmation of calibration curve accuracy
According to the selected analysis conditions, use X-ray fluorescence
spectrometer to measure certified reference material (CRM) or reference
material (RM) of similar sample smelting process and of similar chemical
composition. There shall be no statistically significant difference between the
analyzed value of the element for analysis and the certified value or standard
value Ac. Determine whether there are significant differences according to
equation (3).
8.3 Analysis of unknown sample
8.3.1 Standardization of instrument
Regularly confirm the analysis of standardized sample. When the instrument
drifts, the instrument shall be drilled and calibrated by measuring the X-ray
fluorescence intensity of the normalized sample.
9 Calculation of results
Calculate the contents of elements for analysis from the calibration curve,
according to the fluorescence intensity measurement of unknown sample, by
equation (8) or equation (9).
10 Precision
The precision of this Standard is the result of a common test conducted in 12
laboratories and determined according to GB/T 6379.1 and GB/T 6379.2.See
Table 3 for precision.
11 Test report
The test report shall contain the following information.
...... Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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