|
Std ID |
Description (Standard Title) |
Detail |
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SJ 2644.6.1-1985
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Cold press dies--Stop pins with coil spring
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SJ 2644.6.1-1985
|
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SJ 2644.6-1985
|
Cold press dies--Stop set with coil spring
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SJ 2644.6-1985
|
|
SJ 2644.7.1-1985
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Cold press dies--Stop pins
|
SJ 2644.7.1-1985
|
|
SJ 2644.7.2-1985
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Cold press dies--Torsion spring
|
SJ 2644.7.2-1985
|
|
SJ 2644.7-1985
|
Cold press dies--Stop set with torsional spring
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SJ 2644.7-1985
|
|
SJ 2644.8.1-1985
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Cold press dies--Tripper stop pins
|
SJ 2644.8.1-1985
|
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SJ 2644.8.2-1985
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Cold press dies--Sheet spring
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SJ 2644.8.2-1985
|
|
SJ 2644.8-1985
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Cold press dies--Tripper stop unit
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SJ 2644.8-1985
|
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SJ 2645.1.1-1985
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Cold press dies--Side-push plate
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SJ 2645.1.1-1985
|
|
SJ 2645.1-1985
|
Cold press dies--Spring side-push sets
|
SJ 2645.1-1985
|
|
SJ 2645.2-1985
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Cold press dies--Side-push sheet spring
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SJ 2645.2-1985
|
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SJ 2646.1-1985
|
Cold press dies--Ball knockout set
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SJ 2646.1-1985
|
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SJ 2646.2-1985
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Cold press dies--Knockout plate
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SJ 2646.2-1985
|
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SJ 2646.3-1985
|
Cold press dies--Kicker pin
|
SJ 2646.3-1985
|
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SJ 2646.4-1985
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Cold press dies--Shouldered knockout pin
|
SJ 2646.4-1985
|
|
SJ 2646.5-1985
|
Cold press dies--Threaded knockout pin
|
SJ 2646.5-1985
|
|
SJ 2646.6-1985
|
Cold press dies--Ejector pins
|
SJ 2646.6-1985
|
|
SJ 2647.1-1985
|
Cold press dies--Round scrap cutter
|
SJ 2647.1-1985
|
|
SJ 2647.2-1985
|
Cold press dies--Square scrap cutter
|
SJ 2647.2-1985
|
|
SJ 2648-1985
|
Cold press dies--Limited pillars
|
SJ 2648-1985
|
|
SJ 2649.1-1985
|
Cold press dies--Cylidrical coil compression spring
|
SJ 2649.1-1985
|
|
SJ 2649.2-1985
|
Cold press dies--Square steel wire spring
|
SJ 2649.2-1985
|
|
SJ 2649.3-1985
|
Cold press dies--Polyurethane spring-pad
|
SJ 2649.3-1985
|
|
SJ 2650.1-1985
|
Cold press dies--Cylindrical head stripper bolt
|
SJ 2650.1-1985
|
|
SJ 2650.2-1985
|
Cold press dies--Socket head stripper bolt
|
SJ 2650.2-1985
|
|
SJ 2651-1985
|
Cold press dies--Screw plug
|
SJ 2651-1985
|
|
SJ 2652-1985
|
Cold press dies--Performance specification for components of cold press dies
|
SJ 2652-1985
|
|
SJ 2653-1985
|
(Principles and methods of design documents to change the design file changes)
|
SJ 2653-1985
|
|
SJ 2654-1985
|
(Design changes to the design file to change the file format and preparation methods of notices)
|
SJ 2654-1985
|
|
SJ 2656-1986
|
Method for tugsten spectral analysis
|
SJ 2656-1986
|
|
SJ 2657-1986
|
Method for molybdenum spectral analysis
|
SJ 2657-1986
|
|
SJ 2658.10-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for modulated wideband
|
SJ 2658.10-1986
|
|
SJ 2658.11-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for pulse response characteristics
|
SJ 2658.11-1986
|
|
SJ 2658.1-1986
|
Methods of measurement for semiconductor infrared diodes General rules
|
SJ 2658.1-1986
|
|
SJ 2658.12-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
|
SJ 2658.12-1986
|
|
SJ 2658.13-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient
|
SJ 2658.13-1986
|
|
SJ 2658.2-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for forward voltage drop
|
SJ 2658.2-1986
|
|
SJ 2658.3-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
|
SJ 2658.3-1986
|
|
SJ 2658.4-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance
|
SJ 2658.4-1986
|
|
SJ 2658.5-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for forward series resistance
|
SJ 2658.5-1986
|
|
SJ 2658.6-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power
|
SJ 2658.6-1986
|
|
SJ 2658.7-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for radiant flux
|
SJ 2658.7-1986
|
|
SJ 2658.8-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance
|
SJ 2658.8-1986
|
|
SJ 2658.9-1986
|
Methods of measurement for semiconductor infrared diodes Methods of measurement for the intensity space distribution and half-intensity angle of radiation
|
SJ 2658.9-1986
|
|
SJ 2659-1986
|
Resin-core solder tin wire for electronic industry
|
SJ 2659-1986
|
|
SJ 2660-1986
|
Test methods for resin type flux for soft solder
|
SJ 2660-1986
|
|
SJ 2662-1986
|
Specification of marine navigational radar equipment for Type 756
|
SJ 2662-1986
|
|
SJ 2663-1986
|
Fundamental parameters for UHF operation of black/white television broadcast receivers
|
SJ 2663-1986
|
|
SJ 2664-1986
|
Test methods of accelerated life test for helium-neon laser devices
|
SJ 2664-1986
|
|
SJ 2665-1986
|
Generic specification for variable plastic film dielectric tuning capacitors
|
SJ 2665-1986
|
|
SJ 2666-1986
|
(Variable tuning capacitor dielectric film structure type size)
|
SJ 2666-1986
|
|
SJ 2667-1986
|
Methods of measurement of numerical aperture of optical fibres and cables
|
SJ 2667-1986
|
|
SJ 2668-1986
|
Methods of measurement for attenuation of optical fibres and cables
|
SJ 2668-1986
|
|
SJ 2669-1986
|
Generic specification for ribbon cables with unshielded round conouctor
|
SJ 2669-1986
|
|
SJ 2670-1986
|
Permanent magnet low speed synchronous motors
|
SJ 2670-1986
|
|
SJ 2671-1986
|
Installation and acceptance criteria of crossbar customer switchboard sets
|
SJ 2671-1986
|
|
SJ 2672.1-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA301
|
SJ 2672.1-1986
|
|
SJ 2672.2-1986
|
Detail specification for electronic components--Case-rated 175Mhz low voltage bipolar power transistors, Type 3DA302
|
SJ 2672.2-1986
|
|
SJ 2672.3-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA303
|
SJ 2672.3-1986
|
|
SJ 2672.4-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltag bipolar power transistors, Type 3DA304
|
SJ 2672.4-1986
|
|
SJ 2672.5-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA305
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SJ 2672.5-1986
|
|
SJ 2672.6-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA306
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SJ 2672.6-1986
|
|
SJ 2672.7-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA307
|
SJ 2672.7-1986
|
|
SJ 2672.8-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA308
|
SJ 2672.8-1986
|
|
SJ 2672.9-1986
|
Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA309
|
SJ 2672.9-1986
|
|
SJ 2673.1-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors, Type 3DA311
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SJ 2673.1-1986
|
|
SJ 2673.2-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors, Type 3DA312
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SJ 2673.2-1986
|
|
SJ 2673.3-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors, Type 3DA313
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SJ 2673.3-1986
|
|
SJ 2673.4-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors, Type 3DA314
|
SJ 2673.4-1986
|
|
SJ 2673.5-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors, Type 3DA315
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SJ 2673.5-1986
|
|
SJ 2673.6-1986
|
Detail specification for electronic components--Case-rated 470MHz low voltage bipolar transistors, Type 3DA316
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SJ 2673.6-1986
|
|
SJ 2674-1986
|
Detail specification for electronic components--Fixed low-power non-wirewound resistors--Fixed metal film resistors for Type RJ16 Assessment level E
|
SJ 2674-1986
|
|
SJ 2675-1986
|
Detail specification for electronic components--Fixed low-power non-wirewound resistors--Fixed metal film resistor, Type RJ17 Assessment level E
|
SJ 2675-1986
|
|
SJ 2676-1986
|
(Detailed specifications of electronic components fixed precision resistors RJ73 Precision Metal Film Fixed Resistors Assessment level E)
|
SJ 2676-1986
|
|
SJ 2677-1986
|
(Detailed specifications of electronic components fixed precision resistors RJ74 Precision Metal Film Fixed Resistors Assessment level E)
|
SJ 2677-1986
|
|
SJ 2678-1986
|
(Detailed specifications of electronic components fixed precision resistors RJ75 Precision Metal Film Fixed Resistors Assessment level E)
|
SJ 2678-1986
|
|
SJ 2679-1986
|
(Detailed specifications of electronic components fixed precision resistors RJ76 type precision metal film resistors Assessment level E)
|
SJ 2679-1986
|
|
SJ 2682-1986
|
Detail specification for electronic components--Low-power potentiometers for Type WH15-K2 Assessment level E
|
SJ 2682-1986
|
|
SJ 2683-1986
|
Detailed specifications for electronic components, Type WH112 Preset potentiometers Assessment level E
|
SJ 2683-1986
|
|
SJ 2684-1986
|
Physical Demensions For Light Emitting Device Of Semiconductor
|
SJ 2684-1986
|
|
SJ 2687-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 16mm, Type KX06
|
SJ 2687-1986
|
|
SJ 2688-1986
|
Rotary wafer switches (low current rating) with central mounting, without stop, maximum diameter 25mm, Type KX07
|
SJ 2688-1986
|
|
SJ 2689-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 55mm, Type KX10
|
SJ 2689-1986
|
|
SJ 2690-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 55mm, Type KX11
|
SJ 2690-1986
|
|
SJ 2691-1986
|
Rotary wafer switches (low current rating) with cental mounting and two-hole positioning, maximum number of position, maximum diameter 42mm, Type KX13
|
SJ 2691-1986
|
|
SJ 2692-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 25mm, Type KX15
|
SJ 2692-1986
|
|
SJ 2693-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 25mm, Type KX15
|
SJ 2693-1986
|
|
SJ 2694-1986
|
Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 30mm, Type KX17
|
SJ 2694-1986
|
|
SJ 2697-1986
|
General specification for high voltage charging inductor for radar (Applicable for certification)
|
SJ 2697-1986
|
|
SJ 2699-1986
|
Detail specification for silicon NPN high frequency low noise low power transistors, Type 3DG388
|
SJ 2699-1986
|
|
SJ 2700-1986
|
Detail specification for silicon NPN high frequency medium power transistors, Type 3DG2060
|
SJ 2700-1986
|
|
SJ 2701-1986
|
Detail specification for silicon PNP low power transistors, Type 3DX673
|
SJ 2701-1986
|
|
SJ 2702-1986
|
Detail specification for silicon NPN high frequency low power transistors, Type 3DG458
|
SJ 2702-1986
|
|
SJ 2703-1986
|
Variable four-section film dielectric capacitors for FM and AM applications for Type CBM-443DF
|
SJ 2703-1986
|
|
SJ 2704-1986
|
Variable FM/AM four-section film dielectric capacitors for Type CBM-403, 443BF
|
SJ 2704-1986
|
|
SJ 2705-1986
|
CBM-203B and 243B variable dual-section film dielectric capacitors
|
SJ 2705-1986
|
|
SJ 2706-1986
|
Variable dual-section film dielectric capacitors for Type CBM-223P
|
SJ 2706-1986
|
|
SJ 2708-1986
|
Cable distribution system for sound and television signals--Graphical symbols
|
SJ 2708-1986
|
|
SJ 2709-1986
|
Methods of measurement for temperature of printed board assemblies
|
SJ 2709-1986
|
|
SJ 2710-1986
|
Specification for 27~470MHz FM (or PM) small-size radio telephones for commercial use
|
SJ 2710-1986
|