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Std ID |
Description (Standard Title) |
Detail |
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JJG(SJ)02010-1995
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(QF2280A UHF digital millivolt meter testing procedures)
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JJG(SJ)02010-1995
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JJG(SJ)02011-1995
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(HP8405A type vector voltmeter test procedures)
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JJG(SJ)02011-1995
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JJG(SJ)03001-1987
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(521A type PAL, vectorscope pilot test procedures)
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JJG(SJ)03001-1987
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JJG(SJ)03002-1988
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(TEK1240/1241 logic analyzer pilot test procedures)
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JJG(SJ)03002-1988
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JJG(SJ)03003-1988
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(Trial actuators feature analyzer test procedures)
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JJG(SJ)03003-1988
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JJG(SJ)03004-1988
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(AV3621-type characteristics analyzer pilot test procedures)
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JJG(SJ)03004-1988
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JJG(SJ)03005-1988
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(SQ-27-type sampling oscilloscope pilot test procedures)
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JJG(SJ)03005-1988
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JJG(SJ)03006-1989
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Specification for verification of XJ4245 model stereo oscilloscopes
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JJG(SJ)03006-1989
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JJG(SJ)03007-1989
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Specification for verification of SL4 model logic oscilloscopes
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JJG(SJ)03007-1989
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JJG(SJ)03008-1989
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Specification for verification of TEK7904 model 500MHz wide-band oscilloscopes
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JJG(SJ)03008-1989
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JJG(SJ)03009-1991
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(SQ-20-type sampling oscilloscope test procedures)
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JJG(SJ)03009-1991
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JJG(SJ)03010-1991
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(SG-1 type of second-tier high-sensitivity oscilloscope test procedures)
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JJG(SJ)03010-1991
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JJG(SJ)03011-1995
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(S09-type stone wave pulser calibration verification procedures)
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JJG(SJ)03011-1995
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JJG(SJ)03012-1995
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(SBE-6 type two high voltage oscilloscope trace test procedures)
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JJG(SJ)03012-1995
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JJG(SJ)04001-1987
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Trial specification for verification of JS-2C model transistor reverse cut-off current testers
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JJG(SJ)04001-1987
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JJG(SJ)04002-1987
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(BJ3030-frequency low-power transistor C . R product testers trial test procedures)
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JJG(SJ)04002-1987
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JJG(SJ)04003-1987
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(BJ2952A (JS-3A) transistor reverse breakdown voltage tester pilot test procedures)
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JJG(SJ)04003-1987
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JJG(SJ)04004-1987
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(BJ2911 integrated parameters (HQ-1B)-type transistor tester pilot test procedures)
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JJG(SJ)04004-1987
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JJG(SJ)04005-1987
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(JSS-4A transistor low-frequency H-parameter test pilot test procedures)
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JJG(SJ)04005-1987
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JJG(SJ)04006-1987
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(BJ2913 FET parameter tester pilot test procedures)
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JJG(SJ)04006-1987
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JJG(SJ)04007-1987
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(BJ2950A (JS-4A) transistor operating voltage tester pilot test procedures)
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JJG(SJ)04007-1987
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JJG(SJ)04008-1987
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(QE1A double base semiconductor tester pilot test procedures)
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JJG(SJ)04008-1987
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JJG(SJ)04009-1987
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(BJ2983-type transistor being biased second breakdown tester pilot test procedures)
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JJG(SJ)04009-1987
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JJG(SJ)04010-1987
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(BJ2961 transistor integrated circuit dynamic parameter tester trial test procedures)
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JJG(SJ)04010-1987
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JJG(SJ)04011-1987
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Trial specification for verification of QG21-QG25 high frequency low-power transistor F testers
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JJG(SJ)04011-1987
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JJG(SJ)04012-1987
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(BJ3022 (QJ30) low-frequency power transistor F Test pilot test procedures)
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JJG(SJ)04012-1987
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JJG(SJ)04013-1988
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(BJ2912 (QE7) regulator diode tester pilot test procedures)
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JJG(SJ)04013-1988
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JJG(SJ)04014-1988
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(Transistor curve tracers pilot test procedures)
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JJG(SJ)04014-1988
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JJG(SJ)04015-1988
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(QZ3, QZ4 NF-frequency power transistor tester small pilot test procedures)
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JJG(SJ)04015-1988
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JJG(SJ)04016-1988
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(BJ2984 (QR-3)-type transistor transient thermal resistance tester pilot test procedures)
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JJG(SJ)04016-1988
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JJG(SJ)04017-1988
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(BJ2900-type bipolar transistor cut-off current measurement standard instrument pilot test procedures)
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JJG(SJ)04017-1988
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JJG(SJ)04018-1988
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(BJ2901-type bipolar transistor reverse breakdown voltage of a standard instrument pilot test procedures)
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JJG(SJ)04018-1988
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JJG(SJ)04019-1988
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(BJ2902-type bipolar transistor H , V (subscript BE (sat)), V (subscript CE (sat)) standard instrument pilot test procedures)
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JJG(SJ)04019-1988
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JJG(SJ)04020-1989
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Specification for verification of sample transistor specially intended to measure the noise factor of high frequency medium and low power triode transistor
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JJG(SJ)04020-1989
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JJG(SJ)04021-1989
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Specification for verification of BJ3110 model MOS integrated circuit testers
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JJG(SJ)04021-1989
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JJG(SJ)04022-1989
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Specification for verification of Q01 model high frequency low power triode transistor Ft standard measurement meters
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JJG(SJ)04022-1989
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JJG(SJ)04023-1989
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Specification for verification of BJ2970 model high power semiconductor triode tf tester
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JJG(SJ)04023-1989
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JJG(SJ)04024-1989
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Specification for verification of BJ4801 model graphic instrument calibrators
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JJG(SJ)04024-1989
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JJG(SJ)04025-1989
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(Q04-type medium power transistor switching device parameter measurement standard verification procedures)
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JJG(SJ)04025-1989
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JJG(SJ)04026-1989
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(BJ2985-type transistor to maintain voltage tester test procedures)
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JJG(SJ)04026-1989
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JJG(SJ)04027-1989
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(1600 IC DC parametric test system test procedures)
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JJG(SJ)04027-1989
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JJG(SJ)04028-1989
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(BJ3190-based integrated operational amplifier tester test procedures)
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JJG(SJ)04028-1989
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JJG(SJ)04029-1989
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(J273B Linear IC test system test procedures)
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JJG(SJ)04029-1989
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JJG(SJ)04030-1989
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(SERIES-10 type LSI test system test procedures)
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JJG(SJ)04030-1989
|
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JJG(SJ)04031-1989
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(9200 LSI test system test procedures)
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JJG(SJ)04031-1989
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JJG(SJ)04032-1989
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(BJ3122 (QL11) logic IC tester verification procedures)
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JJG(SJ)04032-1989
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JJG(SJ)04033-1989
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(BJ3123-type bipolar logic IC tester verification procedures)
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JJG(SJ)04033-1989
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JJG(SJ)04034-1989
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(GR1731M analog IC test system test procedures)
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JJG(SJ)04034-1989
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JJG(SJ)04035-1989
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(GR1732M digital IC test system test procedures)
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JJG(SJ)04035-1989
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JJG(SJ)04039-1991
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(GH3112 dynamic logic integrated circuit detector test procedures)
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JJG(SJ)04039-1991
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JJG(SJ)04040-1991
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(GH3181 op amp tester test procedures)
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JJG(SJ)04040-1991
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JJG(SJ)04041-1991
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(BJ3192-based integrated operational amplifier automatic tester test procedures)
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JJG(SJ)04041-1991
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JJG(SJ)04042-1991
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(GH3111/3111G integrated circuit tester test procedures)
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JJG(SJ)04042-1991
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JJG(SJ)04043-1991
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(CTG-1 high-frequency C-V characteristics tester test procedures)
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JJG(SJ)04043-1991
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JJG(SJ)04044-1991
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(YWS2980A rectifier diodes I and I t tester test procedures)
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JJG(SJ)04044-1991
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JJG(SJ)04045-1995
|
(JS-7B transistor tester test procedures)
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JJG(SJ)04045-1995
|
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JJG(SJ)04046-1995
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(QC-13-type field effect transistor transconductance parameter tester test procedures)
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JJG(SJ)04046-1995
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JJG(SJ)04047-1995
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(QG-6, QG-16-type high-frequency low-power transistors ft parameter tester test procedures)
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JJG(SJ)04047-1995
|
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JJG(SJ)04048-1995
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(QG-29-type high-frequency transistors Gf (Kf), F (Nf), AGC tester test procedures)
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JJG(SJ)04048-1995
|
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JJG(SJ)04049-1995
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(National Yang CX dual gate field effect transistor tester test procedures)
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JJG(SJ)04049-1995
|
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JJG(SJ)04050-1995
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(PCT-2-diode test procedures for rapid screening instrument)
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JJG(SJ)04050-1995
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JJG(SJ)04051-1995
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(PDW-1 regulator diode test procedures for rapid screening instrument)
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JJG(SJ)04051-1995
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JJG(SJ)04052-1995
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(PTQ-2-type transistor rapid screening instrument test procedures)
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JJG(SJ)04052-1995
|
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JJG(SJ)04053-1995
|
(QO3 type device noise figure verification procedures)
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JJG(SJ)04053-1995
|
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JJG(SJ)04054-1995
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(A360 test system test procedures)
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JJG(SJ)04054-1995
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JJG(SJ)04055-1995
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(QO5-A, B-type transistor DC, pulse device safe operating area test procedures)
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JJG(SJ)04055-1995
|
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JJG(SJ)04056-1995
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(QO5-C-type transistor switching device safe operating area test procedures)
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JJG(SJ)04056-1995
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JJG(SJ)05001-1987
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(RCJ-3-type insulation resistance tester pilot test procedures)
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JJG(SJ)05001-1987
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JJG(SJ)05003-1987
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(CO-2 Precision Inductance Bridge pilot test procedures)
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JJG(SJ)05003-1987
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JJG(SJ)05004-1987
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(LCD-1-type large inductance meter pilot test procedures)
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JJG(SJ)05004-1987
|
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JJG(SJ)05005-1987
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(B-102 type tantalum electrolytic capacitor leakage current tester pilot test procedures)
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JJG(SJ)05005-1987
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JJG(SJ)05006-1987
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(1620-type capacitance measuring device pilot test procedures)
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JJG(SJ)05006-1987
|
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JJG(SJ)05007-1987
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(HP4192A Low Frequency Impedance Analyzer pilot test procedures)
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JJG(SJ)05007-1987
|
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JJG(SJ)05008-1988
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(I-0202 type tester discrete time trial test procedures)
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JJG(SJ)05008-1988
|
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JJG(SJ)05009-1988
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(TS-109 type semi-automatic sorter electrolytic capacitor pilot test procedures)
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JJG(SJ)05009-1988
|
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JJG(SJ)05010-1988
|
(RT150/RT160 relay test instrument pilot test procedures)
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JJG(SJ)05010-1988
|
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JJG(SJ)05011-1988
|
(WZC-1A type potentiometer tester pilot test procedures)
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JJG(SJ)05011-1988
|
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JJG(SJ)05012-1988
|
(4165-1344 contact resistance test procedures digital ohmmeter Trial)
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JJG(SJ)05012-1988
|
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JJG(SJ)05013-1988
|
(AV2551-type potentiometer dynamic contact resistance variation measuring instrument pilot test procedures)
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JJG(SJ)05013-1988
|
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JJG(SJ)05014-1988
|
(HP4274A, HP4275A multi-frequency LCR meter pilot test procedures)
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JJG(SJ)05014-1988
|
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JJG(SJ)05015-1988
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(HP4342A type Q, pilot testing procedures)
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JJG(SJ)05015-1988
|
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JJG(SJ)05016-1988
|
(HL2801 type digital auto pilot test procedures Q table)
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JJG(SJ)05016-1988
|
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JJG(SJ)05017-1988
|
(HP4276A, HP4277A type LCZ meter pilot test procedures)
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JJG(SJ)05017-1988
|
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JJG(SJ)05018-1988
|
(HM2672-type insulation resistance meter pilot test procedures)
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JJG(SJ)05018-1988
|
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JJG(SJ)05019-1988
|
(HM16501 high resistance box type rotary pilot test procedures)
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JJG(SJ)05019-1988
|
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JJG(SJ)05020-1988
|
Trial specification for verification of GR1658 model RLC digital electric bridges
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JJG(SJ)05020-1988
|
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JJG(SJ)05021-1988
|
(WQJ-1A Precision multimeter bridge pilot test procedures)
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JJG(SJ)05021-1988
|
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JJG(SJ)05028-1989
|
Trial specification for verification of CO19 model standard inductance group
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JJG(SJ)05028-1989
|
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JJG(SJ)05037-1991
|
(HY2501 Precision resistor bridge test procedures)
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JJG(SJ)05037-1991
|
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JJG(SJ)05038-1991
|
(715 linear potentiometer oscilloscope test procedures)
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JJG(SJ)05038-1991
|
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JJG(SJ)05039-1991
|
(YY2781 type RLC table with three test procedures)
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JJG(SJ)05039-1991
|
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JJG(SJ)05040-1991
|
(YY2511 digital DC low resistance meter testing procedures)
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JJG(SJ)05040-1991
|
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JJG(SJ)05041-1991
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(CJ2780 type with three errors sorter test procedures)
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JJG(SJ)05041-1991
|
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JJG(SJ)05042-1991
|
(CD-22-type bias Bridge test procedures)
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JJG(SJ)05042-1991
|
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JJG(SJ)05043-1991
|
Specification for verification of CD-50 model universal bridges
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JJG(SJ)05043-1991
|
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JJG(SJ)05044-1991
|
(HP4272A Preset capacity meter testing procedures)
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JJG(SJ)05044-1991
|
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JJG(SJ)05045-1991
|
(HP4273A Preset capacity meter testing procedures)
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JJG(SJ)05045-1991
|
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JJG(SJ)05046-1991
|
(GR1687-type LCR digital bridge test procedures)
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JJG(SJ)05046-1991
|
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JJG(SJ)05047-1991
|
(CD9A Precision multimeter test procedures Bridge)
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JJG(SJ)05047-1991
|
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JJG(SJ)05048-1991
|
(J01/J02 loss of high-frequency capacitance-type standard test procedures)
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JJG(SJ)05048-1991
|