GB/T 42970-2023 English PDF

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GB/T 42970-2023: Semiconductor integrated circuits - Measuring methods of video encoder and decoder circuits
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Basic data

Standard ID: GB/T 42970-2023 (GB/T42970-2023)
Description (Translated English): Semiconductor integrated circuits - Measuring methods of video encoder and decoder circuits
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L56
Classification of International Standard: 31.200
Word Count Estimation: 30,368
Date of Issue: 2023-09-07
Date of Implementation: 2024-01-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 42970-2023: Semiconductor integrated circuits - Measuring methods of video encoder and decoder circuits

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 31.200 CCSL56 National Standards of People's Republic of China Semiconductor integrated circuit Video codec circuit testing method Published on 2023-09-07 2024-01-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee

Table of contents

Preface III 1 Scope 1 2 Normative reference documents 1 3 Terms and Definitions 1 4 General Rule 3 4.1 Test environment requirements 3 4.2 Test items 3 4.3 Related documents 4 5 Static parameter test 4 5.1 Output high-level voltage VOH, output low-level voltage VOL 4 5.2 Input high-level current IIH, input low-level current IIL 4 5.3 Output high impedance current IOZ 4 6 Dynamic Parameter Test 4 6.1 Digital interface timing parameters 4 6.2 Video signal amplitude VO 4 6.3 Luminance nonlinear distortion LNL 6 6.4 Brightness short-term waveform distortion STDLUM 7 6.5 Brightness signal-to-noise ratio SNRLUM 8 6.6 Chroma signal-to-noise ratio SNRCHROM 9 6.7 Differential gain distortion DG 10 6.8 Differential Phase Distortion DP 11 6.9 Amplitude-frequency characteristics AF 12 6.10 Chroma-luminance gain difference δSC-LUM 14 6.11 Chroma-luminance delay difference tSC-LUM 15 6.12 Field Time Waveform Distortion DVS 15 6.13 Line time waveform distortion DHS 17 6.14 Horizontal sync signal amplitude VHS, color burst signal amplitude VSC 18 6.15 Color burst signal frequency fSC 19 6.16 Pixel clock frequency fLLC 20 6.17 Line frequency fHS 20 6.18 Field frequency fVS 21 6.19 Video resolution Resolution 22 6.20 Clamping current ICLAMP 23

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents" Drafting. Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This document was drafted by. China Electronics Technology Standardization Institute, Chengdu Zhenxin Technology Co., Ltd., Shenzhen Saiyuan Microelectronics Co., Ltd. Co., Ltd., Sanqi (Huizhou) Electronic Technology Co., Ltd., and Guangdong Zhongshaoxuan Standardization Technology Research Institute Co., Ltd. The main drafters of this document. Li Kun, Xiang Duochun, Qiu Fen, Xiao Shujian, Dai Guanghao, Zheng Pei, Chen Yan, Wu Miao, Zhai Guanjie, Li Hailong, Lan Donglan. Semiconductor integrated circuit Video codec circuit testing method

1 Scope

Test method for electrical characteristics of circuits (hereinafter referred to as "devices"). This document is suitable for testing analog video interface circuits in video encoding and decoding circuits.

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document. GB/T 17574-1998 Semiconductor devices integrated circuits Part 2.Digital integrated circuits

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 Video signal amplitude videoamplitudelevel VO Video signal voltage peak to peak. 3.2 LNL When the average image level is a certain value, a small-amplitude step signal is added that gradually increases the starting level from the blanking level to the white level. When reaching the input terminal of the circuit under test, the maximum difference between the ratio of each step amplitude at the output terminal and the corresponding step amplitude at the input terminal. 3.3 STDLUM When a narrow pulse or fast step function with nominal brightness amplitude and specified shape is added to the input end of the circuit, the output pulse will have the same shape as its original shape. deviation. 3.4 SNRLUM The ratio between the nominal value of the brightness signal amplitude and the peak clutter amplitude. ......

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