GB/T 37143-2018 English PDF

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GB/T 37143-2018: Maturity testing for electric and electronic products
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 37143-2018	519	Add to Cart	5 days	Maturity testing for electric and electronic products	Valid

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Basic data

Standard ID: GB/T 37143-2018 (GB/T37143-2018)
Description (Translated English): Maturity testing for electric and electronic products
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: K04
Classification of International Standard: 19.040
Word Count Estimation: 26,296
Date of Issue: 2018-12-28
Date of Implementation: 2019-07-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 37143-2018: Maturity testing for electric and electronic products

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Maturity testing for electric and electronic products ICS 19.040 K04 National Standards of People's Republic of China Electrical and electronic products maturity test method Published on.2018-12-28 2019-07-01 implementation State market supervision and administration China National Standardization Administration issued

Content

Foreword III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 General description of the test 2 5 Determination of excitation stress 2 5.1 Analysis of weak links 2 5.2 Sensitive Stress Analysis 2 5.3 Type of excitation stress determination 2 6 Test device requirements 2 7 Test method 2 7.1 Stress and stress limit 2 7.2 Temperature stress excitation test 3 7.2.1 Product temperature distribution test 3 7.2.2 Low/high temperature step stress test 3 7.3 Vibration step stress excitation test 4 7.3.1 Vibration spectrum 4 7.3.2 Vibration step stress test 4 7.4 Integrated Environmental Stress Cycle Test 5 8 Troubleshooting in the test 7 9 Product Maturity Evaluation 8 9.1 Maturity Evaluation Method 8 9.2 Determination and calculation of the stress-resistant component value of maturity 8 9.3 Determination and calculation of the production capacity of maturity 10 Information to be given in the test report 11 Appendix A (informative) The theoretical basis for the maturity test of electrical and electronic products 12 Appendix B (Normative Appendix) Test Equipment Requirements 13 B.1 Test equipment General requirements 13 B.2 Vibration stress test system 13 B.3 Temperature stress test system 13 B.4 Measuring device 13 B.4.1 Vibration measuring device 13 B.4.2 Temperature measuring device 14 B.5 Fixture 14 Appendix C (informative) Example 15 C.1 Weak link determination and sensitive stress analysis 15 C.2 Product Maturity Evaluation Test 17 C.3 Product Maturity Evaluation 18 C.3.1 Overview 18 C.3.2 Calculation of the stress-resistant component value of maturity 18 C.3.3 Maturity production capacity calculation component value calculation 18 Reference 20

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed and managed by the National Technical Committee for Environmental Conditions and Environmental Testing Standardization of Electrical and Electronic Products (SAC/TC8). This standard is drafted by. Beijing University of Aeronautics and Astronautics, Suzhou Guangbo Mechanics Environmental Laboratory Co., Ltd., Ministry of Industry and Information Technology Sub-fifth Institute. Participated in the drafting of this standard. Shenyang Aircraft Design Institute of China Aviation Industry Corporation, 702 Institute of Aerospace Science and Technology Group, Chongqing Science and Technology Research Institute, Xi'an West Measurement Electronic Technology Service Co., Ltd., Guangzhou Radio and Television Measurement and Testing Co., Ltd. The main drafters of this standard. Wang Xiaohong, Huang Xiaoguang, Ji Chunyang, Wang Deyan, Shi Rongming, Li Yuxiang, Chen Yongxiang, Li Zexin, Du Fu, Ming Zhimao.

Introduction

The issuing organization of this document draws attention to the fact that, in compliance with this document, it may involve Chapter 9 “Evaluation of maturity with electrical and electronic products”. The use of patents related to the law, the issuing body of this document does not have any position on the authenticity, validity and scope of the patent. The patent holder has assured the issuing authority of this document that she is willing to work with any applicant under reasonable and non-discriminatory terms and conditions. Negotiate on patent licensing. The patent holder's statement has been filed with the issuing authority of this document. Related information can be passed the following Contact information obtained. Patent holder name. Wang Xiaohong Address. No. 37, Xueyuan Road, Haidian District, Beijing, China, Beijing University of Aeronautics and Astronautics, 316,100083 Please note that in addition to the above patents, certain aspects of this document may still involve patents. The issuing organization of this document does not undertake to identify these special Liability. Electrical and electronic products maturity test method

1 Scope

This standard specifies the general description of the maturity test of electrical and electronic products, the determination of the excitation stress, the requirements of the test device and the specific Application method, failure treatment method and maturity evaluation method. This standard applies to environmental stress tests conducted to improve and evaluate the maturity of electrical and electronic products.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 2424.5 Electrical and electronic products environmental test temperature test chamber performance confirmation GB/T 7826 System Reliability Analysis Technology Failure Mode and Impact Analysis (FMEA) Procedure GB/T 29309-2012 Accelerated stress test procedures for electric and electronic products - Guide to high accelerated life test

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 Product maturity productmaturity A measure of product maturity that is used to measure product design, quality, technical completeness, and applicability to meet product expectations. The extent of the goal. 3.2 Technical specification limit technicalspecificationlimit The stress limit value expected by the product specified by the product technical specification, the product is functioning normally within the stress limit value, and the performance parameter Meet the requirements. 3.3 Design limit designlimit The stress limit values that a given product is designed to meet. 3.4 Design margin designmargin In order to meet the requirements of technical specifications during the design process, the discreteness of the product is considered in consideration of various factors, so that the stress tolerance range of the product is suitable. When the amount is higher than the technical specifications. Expressed as the difference between the design limits and the limits of the specification. 3.5 Working limit operatinglimit When the working characteristics of the test sample no longer meet the requirements of the technical conditions, but the test stress strength is reduced, the test sample can still return to normal. The value of the test stress intensity tolerated when operating characteristics. 3.6 Job margin operatingmargin The difference between the working limit of the product and the design limit. ......

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