GB/T 34893-2017 English PDFUS$219.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 34893-2017: Micro-electromechanical system technology -- Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer Status: Valid
Basic dataStandard ID: GB/T 34893-2017 (GB/T34893-2017)Description (Translated English): Micro-electromechanical system technology -- Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: L55 Classification of International Standard: 31.200 Word Count Estimation: 11,153 Date of Issue: 2017-11-01 Date of Implementation: 2018-05-01 Regulation (derived from): National Standard Announcement 2017 No. 29 Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China GB/T 34893-2017: Micro-electromechanical system technology -- Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Micro-electromechanical system technology-Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer ICS 31.200 L55 National Standards of People's Republic of China Microelectromechanical system (MEMS) technology MEMS microstructure based on optical interference In-plane length measurement method Posted.2017-11-01 2018-05-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China China National Standardization Administration released Directory Preface Ⅰ 1 Scope 1 2 Normative references 1 3 Terms and definitions 1 4 measurement method 1 5 main factors affecting the measurement uncertainty 4 Appendix A (informative) Optical interference microscope typical form and main technical features 5 ForewordThis standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard by the National Microelectromechanical Technology Standardization Technical Committee (SAC/TC336) and focal point. The main drafting units of this standard. Tianjin University, Machine Productivity Promotion Center, the National Instrument Components Quality Supervision and Inspection Center, South Beijing Institute of Technology China Electronics Technology Group Corporation thirteenth Institute. The main drafters of this standard. Hu Xiaodong, Guo Tong, Yu Zhenyi, Li Haibin, Cheng Hongbing, Qiu Anping, Cui Bo, Zhu Yue. Microelectromechanical system (MEMS) technology MEMS microstructure based on optical interference In-plane length measurement method1 ScopeThis standard specifies the method based on optical interference microscopy to obtain the surface morphology of MEMS micro-structures for in-plane length measurement. This standard applies to the surface reflectance of not less than 4%, the aspect ratio of not less than 1.10, and the use of optical interference microscope can obtain topography MEMS microstructure.2 Normative referencesThe following documents for the application of this document is essential. For dated references, only the dated version applies to this article Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 3505 Geometrical product specifications (GPS) Surface texture contouring Terms, definitions, and surface texture parameters GB/T 26111 Microelectromechanical System (MEMS) technology terminology General principles of microgeometry assessment of microelectromechanical systems (MEMS) GB/T 261133 Terms and definitionsGB/T 3505 and GB/T 26111 and define the following terms and definitions apply to this document. 3.1 Surface topography Macroscopic and microscopic geometric properties of surface structures. Note. Generally includes the surface geometry, surface waviness, surface roughness and surface defects. 3.2 In-plane length Two points on the surface that have edge structure features, the distance between a point and a line or two lines.4 measurement method4.1 General 4.1.1 The implementation of in-plane length measurement premise is that the MEMS structure has a stepped edge structure between the two edge structures (End 1 and End 2) The distance is the in-plane length of the microstructure measured, as shown in Figure 1. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 34893-2017_English be delivered?Answer: Upon your order, we will start to translate GB/T 34893-2017_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of GB/T 34893-2017_English with my colleagues?Answer: Yes. 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