GB/T 31568-2015 English PDF

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GB/T 31568-2015: Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 31568-2015	279	Add to Cart	3 days	Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation	Valid

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Basic data

Standard ID: GB/T 31568-2015 (GB/T31568-2015)
Description (Translated English): Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: A29
Classification of International Standard: 25.220.20
Word Count Estimation: 13,197
Date of Issue: 2015-05-15
Date of Implementation: 2016-01-01
Regulation (derived from): National Standard Announcement 2015 No. 15
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This Standard specifies the determination of the application of X-ray diffraction Scherrer formula method of thermal spraying ZrO2 thermal barrier coating sample cube, squares, principle of the method of three-phase monoclinic ZrO2 grain size, test conditions and calculation steps and the like. This Standard applies to grain size 2 nm ~ 100 nm range, no internal nonuniform strain specimen.

GB/T 31568-2015: Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation ICS 25.220.20 A29 National Standards of People's Republic of China Thermal sprayed thermal barrier coatings ZrO2 Scherrer formula grain size measurement method Issued on. 2015-05-15 2016-01-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. The standard proposed by China Machinery Industry Federation. This standard layer Standardization Technical Committee (SAC/TC57) administered by the National Metal and non-metal cover. This standard was drafted. Shanghai Institute of Ceramics, Chinese Academy of Sciences. The main drafters of this standard. BASIC KNOWLEDGE Huangyue Hong, Nguyen sound Jie, Zeng Yi, SONG Li Xin. Thermal sprayed thermal barrier coatings ZrO2 Scherrer formula grain size measurement method

1 Scope

This standard specifies the determination by X-ray diffraction method Scherrer formula ZrO2 thermal sprayed thermal barrier coating sample cubic, tetragonal, monoclinic three kinds Principle of the method with ZrO2 grain size, test conditions and calculation steps, etc. This standard applies to the grain size in the range of 2nm ~ 100nm, no internal strain uneven sample.

2 Terms and definitions

The following terms and definitions apply to this document. 2.1 ZrO2 thermal barrier coating thermalbarrierZrO2coatings Thermal spraying ZrO2-based preparation process for preparing the coating material. 2.2 Grain crystalite Internal molecules, atoms, which are small single crystals of regular arrangement. 2.3 Grain size crystalitesize Lhkl Grains on (hkl) planes in the normal direction of average size. 2.4 FWHM fulwidthathalfmaximumofpeakprofile; FWHM Diffraction peak height maximum peak width at half.

3 PRINCIPLE OF THE METHOD

X-ray irradiation of the sample, measuring the resultant diffraction line, assuming that the sample is not complete without the crystal structure, the diffraction line broadening only Caused by grain refinement, you can use the formula (1) (Scherrer formula) to calculate the grain size. Lhkl = Kλ βhklcosθ (1) Where. Lhkl --- grains average size (hkl) planes normal direction, in nanometers (nm); K --- constant definition βhkl related. When βhkl defined as the full width at half time, K = 0.89; λ --- experiments with X-ray wavelength, 0.154056nm; βhkl --- sample a (hkl) crystal face diffraction peak caused by grain refinement FWHM (minus a backing), radians (rad); θ --- (hkl) crystal face diffraction peak of Bragg angle in degrees (°). ......

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