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Database: 189759 (12 Oct 2025)
SJ/T 2658.12-2015 English PDF
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SJ/T 2658.12-2015
: Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
Status: Valid
SJ/T 2658.12: Evolution and historical versions
Standard ID
Contents [version]
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Standard Title (Description)
Status
PDF
SJ/T 2658.12-2015
English
139
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Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
Valid
SJ/T 2658.12-2015
SJ 2658.12-1986
English
199
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3 days [Need to translate]
Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
Obsolete
SJ 2658.12-1986
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Basic data
Standard ID
SJ/T 2658.12-2015 (SJ/T2658.12-2015)
Description (Translated English)
Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
L53
Classification of International Standard
31.08
Word Count Estimation
6,616
Date of Issue
2015-10-10
Date of Implementation
2016-04-01
Older Standard (superseded by this standard)
SJ/T 2658.12-1986
Quoted Standard
SJ/T 2658.1
Regulation (derived from)
PRC MIIT Announcement 2015 No.63
Issuing agency(ies)
Ministry of Industry and Information Technology
Summary
This standard specifies the measurement principle, measurement procedures and specified conditions for the peak emission wavelength and spectral emission bandwidth of a semiconductor infrared emission diode. This standard applies to semiconductor infrared emitting diodes.