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JJG 629-2014 English PDF

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JJG 629-2014: Verification Regulation for Polycrystalline X-ray Diffractometers
Status: Valid

JJG 629: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
JJG 629-2014English459 Add to Cart 4 days [Need to translate] Verification Regulation for Polycrystalline X-ray Diffractometers Valid JJG 629-2014
JJG 629-1989English399 Add to Cart 3 days [Need to translate] Verification Regulation for Polycrystalline X-Ray Diffractometer Obsolete JJG 629-1989

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Basic data

Standard ID JJG 629-2014 (JJG629-2014)
Description (Translated English) Verification Regulation for Polycrystalline X-ray Diffractometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A61
Classification of International Standard 17.020
Word Count Estimation 20,270
Date of Issue 6/15/2014
Date of Implementation 12/15/2014
Older Standard (superseded by this standard) JJG 629-1989
Quoted Standard GBZ 115-2010; JB/T 9400-2010
Regulation (derived from) The State Administration of Quality Supervision, Inspection and Quarantine Notice No. 64 of 2014
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine
Summary This Standard specifies the multi-crystal X-ray diffraction (hereinafter referred to as the instrument) the initial verification, verification and subsequent use of checks.

JJG 629-2014: Verification Regulation for Polycrystalline X-ray Diffractometers

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Verification Regulation for Polycrystalline X-ray Diffractometers State verification procedures People's Republic of China Multi-crystal X-ray diffractometer Issued on. 2014-06-15 2014-12-15 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Multi-crystal X-ray diffractometer Verification Regulation Diffractometers Replacing JJG 629-1989 Focal point. the National Technical Committee on Environment stoichiometry Main drafting unit. Shanghai Institute of Measurement and Testing Participated in the drafting. Dandong City Institute of Measurement and Testing Technology This procedure commissioned the National Technical Committee of the stoichiometric environment responsible for interpreting The main drafters of this procedure. Gongfei Yan (Shanghai Institute of Measurement and Testing) Chai Guanghui (Institute of Measurement and Testing Technology Dandong City) Ding Min (Shanghai Institute of Measurement and Testing) Drafters participate. Yang Peili (Institute of Measurement and Testing Technology Dandong City) Chan Wing-hong (Shanghai Institute of Measurement and Testing)

table of Contents

Introduction (Ⅱ) 1 Scope (1) 2. References (1) 3 Overview (1) 4 metering performance requirements (2) 4.1 Instrument 2θ angle indication error (2) 4.2 Instrument 2θ angle Repeatability (2) 4.3 Instrument Resolution (2) 4.4 detector spectrum resolution (2) 4.5 Stability diffraction intensity (2) 5 General Requirements (2) 5.1 Appearance (2) 5.2 safety indicators (2) 6 Control of measuring instruments (3) 6.1 Verification condition (3) 6.2 Verification Project (3) 6.3 Verification Methods (4) 6.4 test results processing and verification cycle (7) Appendix A multi-crystal X-ray diffraction test original records (for reference) (8) Appendix B test certificates/test results in the notice page and format (11) Appendix C of the standard reference material verification diffraction angle (14)

Introduction

This procedure is JJG 629-1989 "multi-crystal X-ray diffractometer" revision. The preparation of the procedures reference GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards", JB/T 9400-2010 "X shoot Ray diffraction instrument technical conditions. " Compared with JJG 629-1989, in addition to editorial changes outside the main technical changes are as follows. --- Abolished the old statutes theodolite and altimeter using only standard materials instrument 2θ angle indication error Difference for examination. --- Remove the original protocol verification project "tube voltage and current stability." --- Canceled instrument rating. --- Reference JB/T 9400-2010 "X-ray diffraction technology", when the diffraction intensity stability test Room to 8h. --- Original statutes test project "X-ray scattering dose" was renamed "scattered radiation leakage air kerma rate" Technical indicators and methods reference GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards." The previous versions of the release JJG 629 case. JJG 629-1989. Multi-crystal X-ray diffraction test procedures

1 Scope

The order applies to multi-crystal X-ray diffraction (hereinafter referred to as equipment) initial verification, use and subsequent verification Check. 2. References This procedure references the following documents. GB Z115-2010 X-ray diffraction and fluorescence analyzer health protection standards JB/T 9400-2010 X-ray diffraction technique condition For dated references, only the dated edition applies to this procedure; undated reference documents Member, the latest edition (including any amendments) applies to this procedure.

3 Overview

Multi-crystal X-ray diffractometer with a particle detector to detect and record the X-ray generator diffraction on polycrystalline aggregates Sophisticated analytical instruments. Instrument by measuring the diffraction angle, combined with quantum chemical calculations, measurements of crystal powder substance Structure, lattice constants, phase composition and other structural parameters. The basic principles of instrumentation is based on Bragg equation, the equation is given by equation (1). 2d (hkl) sinθ = nλ (1) Where. d (hkl) --- spacing, nm; θ --- diffraction angle, (°); n --- diffraction orders; λ --- X-ray wavelength, nm. Where h, k, l is an integer of three prime, it represents the crystal plane index. λ depends on the female X-ray tube used Pole (target) of metallic materials. The basic structure of multi-crystal X-ray diffraction is shown in Fig.

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